JPS4997076A - - Google Patents
Info
- Publication number
- JPS4997076A JPS4997076A JP12884872A JP12884872A JPS4997076A JP S4997076 A JPS4997076 A JP S4997076A JP 12884872 A JP12884872 A JP 12884872A JP 12884872 A JP12884872 A JP 12884872A JP S4997076 A JPS4997076 A JP S4997076A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Compositions Of Macromolecular Compounds (AREA)
- Polyurethanes Or Polyureas (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12884872A JPS5523860B2 (de) | 1972-12-23 | 1972-12-23 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12884872A JPS5523860B2 (de) | 1972-12-23 | 1972-12-23 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS4997076A true JPS4997076A (de) | 1974-09-13 |
JPS5523860B2 JPS5523860B2 (de) | 1980-06-25 |
Family
ID=14994864
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12884872A Expired JPS5523860B2 (de) | 1972-12-23 | 1972-12-23 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5523860B2 (de) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10054551B2 (en) | 2016-04-20 | 2018-08-21 | Applied Materials Israel Ltd. | Inspection system and method for inspecting a sample by using a plurality of spaced apart beams |
US10541104B2 (en) | 2015-07-09 | 2020-01-21 | Applied Materials Israel Ltd. | System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflection |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103538323B (zh) * | 2013-09-22 | 2015-09-09 | 苏州市湘园特种精细化工有限公司 | 一种橡胶膜片的制造方法 |
-
1972
- 1972-12-23 JP JP12884872A patent/JPS5523860B2/ja not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10541104B2 (en) | 2015-07-09 | 2020-01-21 | Applied Materials Israel Ltd. | System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflection |
US10054551B2 (en) | 2016-04-20 | 2018-08-21 | Applied Materials Israel Ltd. | Inspection system and method for inspecting a sample by using a plurality of spaced apart beams |
Also Published As
Publication number | Publication date |
---|---|
JPS5523860B2 (de) | 1980-06-25 |