JPS4991492A - - Google Patents

Info

Publication number
JPS4991492A
JPS4991492A JP48141409A JP14140973A JPS4991492A JP S4991492 A JPS4991492 A JP S4991492A JP 48141409 A JP48141409 A JP 48141409A JP 14140973 A JP14140973 A JP 14140973A JP S4991492 A JPS4991492 A JP S4991492A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP48141409A
Other languages
Japanese (ja)
Other versions
JPS532748B2 (cg-RX-API-DMAC7.html
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4991492A publication Critical patent/JPS4991492A/ja
Publication of JPS532748B2 publication Critical patent/JPS532748B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP14140973A 1972-12-19 1973-12-19 Expired JPS532748B2 (cg-RX-API-DMAC7.html)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7245248A FR2210771B1 (cg-RX-API-DMAC7.html) 1972-12-19 1972-12-19

Publications (2)

Publication Number Publication Date
JPS4991492A true JPS4991492A (cg-RX-API-DMAC7.html) 1974-08-31
JPS532748B2 JPS532748B2 (cg-RX-API-DMAC7.html) 1978-01-31

Family

ID=9108953

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14140973A Expired JPS532748B2 (cg-RX-API-DMAC7.html) 1972-12-19 1973-12-19

Country Status (5)

Country Link
US (1) US3906225A (cg-RX-API-DMAC7.html)
JP (1) JPS532748B2 (cg-RX-API-DMAC7.html)
DE (1) DE2363221C3 (cg-RX-API-DMAC7.html)
FR (1) FR2210771B1 (cg-RX-API-DMAC7.html)
GB (1) GB1413060A (cg-RX-API-DMAC7.html)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1115737B (it) * 1977-10-19 1986-02-03 Cise Spa Spettografo-monocromatore ad incidenza radente
FR2600417B1 (fr) * 1986-06-19 1990-01-12 Centre Nat Rech Scient Spectrometrie de rayons x a focalisation par cristal courbe et a chambre d'emission de rayons x polyvalente
EP0547695B1 (en) * 1991-12-18 1997-09-03 Koninklijke Philips Electronics N.V. X-ray analysis apparatus
AU2003298591A1 (en) * 2002-09-23 2004-05-04 Johns Hopkins University Double crystal analyzer linkage
CN101093200B (zh) * 2007-05-14 2011-06-29 北京逸东机电技术开发有限公司 一种x射线的连续衍射分光与探测的控制方法及其装置
US10962490B2 (en) * 2015-12-28 2021-03-30 University Of Washington Methods for aligning a spectrometer
CN116507944B (zh) * 2020-12-25 2025-08-29 东丽株式会社 闪烁体面板、放射线检测器、放射线检查装置及闪烁体面板的制造方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1188026A (en) * 1966-04-06 1970-04-15 Jeol Ltd X-Ray Diffraction Apparatus.

Also Published As

Publication number Publication date
JPS532748B2 (cg-RX-API-DMAC7.html) 1978-01-31
DE2363221A1 (de) 1974-07-04
US3906225A (en) 1975-09-16
DE2363221C3 (de) 1979-06-21
FR2210771A1 (cg-RX-API-DMAC7.html) 1974-07-12
FR2210771B1 (cg-RX-API-DMAC7.html) 1975-03-28
GB1413060A (en) 1975-11-05
DE2363221B2 (de) 1978-10-19

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