JPS4990150U - - Google Patents
Info
- Publication number
- JPS4990150U JPS4990150U JP13390172U JP13390172U JPS4990150U JP S4990150 U JPS4990150 U JP S4990150U JP 13390172 U JP13390172 U JP 13390172U JP 13390172 U JP13390172 U JP 13390172U JP S4990150 U JPS4990150 U JP S4990150U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Optical Transform (AREA)
- Control Of Position Or Direction (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13390172U JPS4990150U (ja) | 1972-11-22 | 1972-11-22 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13390172U JPS4990150U (ja) | 1972-11-22 | 1972-11-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS4990150U true JPS4990150U (ja) | 1974-08-05 |
Family
ID=28399764
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13390172U Pending JPS4990150U (ja) | 1972-11-22 | 1972-11-22 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS4990150U (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009011079A1 (ja) * | 2007-07-17 | 2009-01-22 | Sharp Kabushiki Kaisha | 透明基板の端部検出方法及び端部検出装置並びに処理装置 |
JP2011220949A (ja) * | 2010-04-14 | 2011-11-04 | Nec Corp | 撮影検査システムおよび撮影検査方法 |
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1972
- 1972-11-22 JP JP13390172U patent/JPS4990150U/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009011079A1 (ja) * | 2007-07-17 | 2009-01-22 | Sharp Kabushiki Kaisha | 透明基板の端部検出方法及び端部検出装置並びに処理装置 |
US8184291B2 (en) | 2007-07-17 | 2012-05-22 | Sharp Kabushiki Kaisha | Method for detecting edge on transparent substrate, apparatus for detecting edge on transparent substrate, and processing apparatus |
JP2011220949A (ja) * | 2010-04-14 | 2011-11-04 | Nec Corp | 撮影検査システムおよび撮影検査方法 |