JPS4990150U - - Google Patents

Info

Publication number
JPS4990150U
JPS4990150U JP13390172U JP13390172U JPS4990150U JP S4990150 U JPS4990150 U JP S4990150U JP 13390172 U JP13390172 U JP 13390172U JP 13390172 U JP13390172 U JP 13390172U JP S4990150 U JPS4990150 U JP S4990150U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13390172U
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13390172U priority Critical patent/JPS4990150U/ja
Publication of JPS4990150U publication Critical patent/JPS4990150U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Optical Transform (AREA)
  • Control Of Position Or Direction (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP13390172U 1972-11-22 1972-11-22 Pending JPS4990150U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13390172U JPS4990150U (ja) 1972-11-22 1972-11-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13390172U JPS4990150U (ja) 1972-11-22 1972-11-22

Publications (1)

Publication Number Publication Date
JPS4990150U true JPS4990150U (ja) 1974-08-05

Family

ID=28399764

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13390172U Pending JPS4990150U (ja) 1972-11-22 1972-11-22

Country Status (1)

Country Link
JP (1) JPS4990150U (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009011079A1 (ja) * 2007-07-17 2009-01-22 Sharp Kabushiki Kaisha 透明基板の端部検出方法及び端部検出装置並びに処理装置
JP2011220949A (ja) * 2010-04-14 2011-11-04 Nec Corp 撮影検査システムおよび撮影検査方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009011079A1 (ja) * 2007-07-17 2009-01-22 Sharp Kabushiki Kaisha 透明基板の端部検出方法及び端部検出装置並びに処理装置
US8184291B2 (en) 2007-07-17 2012-05-22 Sharp Kabushiki Kaisha Method for detecting edge on transparent substrate, apparatus for detecting edge on transparent substrate, and processing apparatus
JP2011220949A (ja) * 2010-04-14 2011-11-04 Nec Corp 撮影検査システムおよび撮影検査方法

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