JPS4985059U - - Google Patents
Info
- Publication number
- JPS4985059U JPS4985059U JP12926172U JP12926172U JPS4985059U JP S4985059 U JPS4985059 U JP S4985059U JP 12926172 U JP12926172 U JP 12926172U JP 12926172 U JP12926172 U JP 12926172U JP S4985059 U JPS4985059 U JP S4985059U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12926172U JPS5215735Y2 (fr) | 1972-11-09 | 1972-11-09 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12926172U JPS5215735Y2 (fr) | 1972-11-09 | 1972-11-09 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4985059U true JPS4985059U (fr) | 1974-07-23 |
| JPS5215735Y2 JPS5215735Y2 (fr) | 1977-04-08 |
Family
ID=28386635
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12926172U Expired JPS5215735Y2 (fr) | 1972-11-09 | 1972-11-09 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5215735Y2 (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2023084090A (ja) * | 2021-12-06 | 2023-06-16 | 広東利揚芯片測試股▲ふん▼有限公司 | 高速低消費電力マイクロコントローラの高精度テストシステム |
-
1972
- 1972-11-09 JP JP12926172U patent/JPS5215735Y2/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2023084090A (ja) * | 2021-12-06 | 2023-06-16 | 広東利揚芯片測試股▲ふん▼有限公司 | 高速低消費電力マイクロコントローラの高精度テストシステム |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5215735Y2 (fr) | 1977-04-08 |