JPS4974485A - - Google Patents
Info
- Publication number
- JPS4974485A JPS4974485A JP11541372A JP11541372A JPS4974485A JP S4974485 A JPS4974485 A JP S4974485A JP 11541372 A JP11541372 A JP 11541372A JP 11541372 A JP11541372 A JP 11541372A JP S4974485 A JPS4974485 A JP S4974485A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11541372A JPS5120256B2 (OSRAM) | 1972-11-17 | 1972-11-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11541372A JPS5120256B2 (OSRAM) | 1972-11-17 | 1972-11-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4974485A true JPS4974485A (OSRAM) | 1974-07-18 |
| JPS5120256B2 JPS5120256B2 (OSRAM) | 1976-06-23 |
Family
ID=14661942
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11541372A Expired JPS5120256B2 (OSRAM) | 1972-11-17 | 1972-11-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5120256B2 (OSRAM) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5129083A (en) * | 1974-09-05 | 1976-03-11 | Sony Corp | Hakumaku no tokuseikensaho |
| JPS57178340A (en) * | 1981-04-28 | 1982-11-02 | Toshiba Corp | Defect detecting method for semiconductor memory cell |
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1972
- 1972-11-17 JP JP11541372A patent/JPS5120256B2/ja not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5129083A (en) * | 1974-09-05 | 1976-03-11 | Sony Corp | Hakumaku no tokuseikensaho |
| JPS57178340A (en) * | 1981-04-28 | 1982-11-02 | Toshiba Corp | Defect detecting method for semiconductor memory cell |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5120256B2 (OSRAM) | 1976-06-23 |