JPS4970590A - - Google Patents

Info

Publication number
JPS4970590A
JPS4970590A JP47112636A JP11263672A JPS4970590A JP S4970590 A JPS4970590 A JP S4970590A JP 47112636 A JP47112636 A JP 47112636A JP 11263672 A JP11263672 A JP 11263672A JP S4970590 A JPS4970590 A JP S4970590A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP47112636A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP47112636A priority Critical patent/JPS4970590A/ja
Publication of JPS4970590A publication Critical patent/JPS4970590A/ja
Pending legal-status Critical Current

Links

Landscapes

  • Containers, Films, And Cooling For Superconductive Devices (AREA)
JP47112636A 1972-11-10 1972-11-10 Pending JPS4970590A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP47112636A JPS4970590A (en) 1972-11-10 1972-11-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP47112636A JPS4970590A (en) 1972-11-10 1972-11-10

Publications (1)

Publication Number Publication Date
JPS4970590A true JPS4970590A (en) 1974-07-08

Family

ID=14591671

Family Applications (1)

Application Number Title Priority Date Filing Date
JP47112636A Pending JPS4970590A (en) 1972-11-10 1972-11-10

Country Status (1)

Country Link
JP (1) JPS4970590A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58146917A (en) * 1982-02-26 1983-09-01 Fujitsu Ltd Cryostat
JPS58164235A (en) * 1982-03-25 1983-09-29 Fujitsu Ltd Method for measurement of semiconductor sample

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58146917A (en) * 1982-02-26 1983-09-01 Fujitsu Ltd Cryostat
JPH0257349B2 (en) * 1982-02-26 1990-12-04 Fujitsu Ltd
JPS58164235A (en) * 1982-03-25 1983-09-29 Fujitsu Ltd Method for measurement of semiconductor sample

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