JPS496979A - - Google Patents

Info

Publication number
JPS496979A
JPS496979A JP48010213A JP1021373A JPS496979A JP S496979 A JPS496979 A JP S496979A JP 48010213 A JP48010213 A JP 48010213A JP 1021373 A JP1021373 A JP 1021373A JP S496979 A JPS496979 A JP S496979A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP48010213A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS496979A publication Critical patent/JPS496979A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0803Arrangements for time-dependent attenuation of radiation signals
    • G01J5/0805Means for chopping radiation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)
JP48010213A 1972-02-10 1973-01-24 Pending JPS496979A (en:Method)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US22504472A 1972-02-10 1972-02-10

Publications (1)

Publication Number Publication Date
JPS496979A true JPS496979A (en:Method) 1974-01-22

Family

ID=22843288

Family Applications (1)

Application Number Title Priority Date Filing Date
JP48010213A Pending JPS496979A (en:Method) 1972-02-10 1973-01-24

Country Status (6)

Country Link
US (1) US3794838A (en:Method)
JP (1) JPS496979A (en:Method)
CA (1) CA976637A (en:Method)
DE (1) DE2306449A1 (en:Method)
FR (1) FR2171099B1 (en:Method)
GB (1) GB1391226A (en:Method)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014532164A (ja) * 2011-09-15 2014-12-04 エリコン・トレーディング・アクチェンゲゼルシャフト,トリュープバッハOerlikon Trading AG,Truebbach 真空室内における基板の温度測定方法

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3971940A (en) * 1975-03-19 1976-07-27 Nasa Detector absorptivity measuring method and apparatus
US4087690A (en) * 1976-06-22 1978-05-02 E. I. Du Pont De Nemours And Company Spurious radiation compensation in infrared analyzers
FR2391466A1 (fr) * 1977-05-20 1978-12-15 Centre Nat Etd Spatiales Procede et appareil de mesure du facteur d'absorptivite ou d'emissivite infrarouge de materiaux
US4227530A (en) * 1977-08-29 1980-10-14 Scott Paper Company Method of employing reclosable fastener tape system
US4499378A (en) * 1982-03-09 1985-02-12 Horiba, Ltd. Infrared radiation gas analyzer
JPS58136756U (ja) * 1982-03-09 1983-09-14 株式会社堀場製作所 赤外線輻射式ガス分析計
JPS58136757U (ja) * 1982-03-09 1983-09-14 株式会社堀場製作所 赤外線輻射式ガス分析計
DE3423494C2 (de) * 1984-06-26 1986-09-04 Deutsche Forschungs- und Versuchsanstalt für Luft- und Raumfahrt e.V., 5000 Köln Einrichtung zur Messung der aus dem Halbraum kommenden elektromagnetischen Strahlung
US4783593A (en) * 1985-12-26 1988-11-08 General Electric Company Optical system for wide angle IR imager
EP0250841B1 (de) * 1986-06-20 1994-07-27 Lehmann, Martin Verfahren zum berührungslosen Messen einer Temperatur von einem Körper sowie Anordnung hierfür
US5003815A (en) * 1989-10-20 1991-04-02 International Business Machines Corporation Atomic photo-absorption force microscope
DE4110699C2 (de) * 1991-04-03 1995-12-14 Deutsche Forsch Luft Raumfahrt Einrichtung zum Messen thermischer Strahlung aus kleinen Raumwinkeln
US5294198A (en) * 1991-10-01 1994-03-15 Cincinnati Electronics Corporation Infrared inspection system and method employing emissivity indications
US6585410B1 (en) * 2001-05-03 2003-07-01 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Radiant temperature nulling radiometer
FR2936878B1 (fr) * 2008-10-07 2010-12-17 Onera (Off Nat Aerospatiale) Systeme d'imagerie grand infrarouge a chambre obscure integrant une lentille
DE102009029943B4 (de) * 2009-06-23 2011-04-07 Testo Ag Infrarot-Temperaturmessgerät und Verfahren zum Betrieb eines solchen

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3175092A (en) * 1961-03-16 1965-03-23 Barnes Eng Co Infrared radiometers with external chopping and elimination of chopped radiation from instrument walls and components
US3392282A (en) * 1964-12-10 1968-07-09 Barnes Eng Co Automatic method of compensating radiometers for emissivity of the optics

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014532164A (ja) * 2011-09-15 2014-12-04 エリコン・トレーディング・アクチェンゲゼルシャフト,トリュープバッハOerlikon Trading AG,Truebbach 真空室内における基板の温度測定方法

Also Published As

Publication number Publication date
DE2306449A1 (de) 1973-08-16
FR2171099B1 (en:Method) 1976-05-14
US3794838A (en) 1974-02-26
CA976637A (en) 1975-10-21
FR2171099A1 (en:Method) 1973-09-21
GB1391226A (en) 1975-04-16

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