JPS4968789A - - Google Patents

Info

Publication number
JPS4968789A
JPS4968789A JP48097443A JP9744373A JPS4968789A JP S4968789 A JPS4968789 A JP S4968789A JP 48097443 A JP48097443 A JP 48097443A JP 9744373 A JP9744373 A JP 9744373A JP S4968789 A JPS4968789 A JP S4968789A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP48097443A
Other languages
Japanese (ja)
Other versions
JPS5415235B2 (US08124317-20120228-C00060.png
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4968789A publication Critical patent/JPS4968789A/ja
Publication of JPS5415235B2 publication Critical patent/JPS5415235B2/ja
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18Investigating the presence of flaws defects or foreign matter
    • G01N23/185Investigating the presence of flaws defects or foreign matter in tyres
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/627Specific applications or type of materials tyres

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
JP9744373A 1972-09-01 1973-08-31 Expired JPS5415235B2 (US08124317-20120228-C00060.png)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US28574372A 1972-09-01 1972-09-01

Publications (2)

Publication Number Publication Date
JPS4968789A true JPS4968789A (US08124317-20120228-C00060.png) 1974-07-03
JPS5415235B2 JPS5415235B2 (US08124317-20120228-C00060.png) 1979-06-13

Family

ID=23095519

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9744373A Expired JPS5415235B2 (US08124317-20120228-C00060.png) 1972-09-01 1973-08-31

Country Status (8)

Country Link
US (1) US3789226A (US08124317-20120228-C00060.png)
JP (1) JPS5415235B2 (US08124317-20120228-C00060.png)
CA (1) CA1020293A (US08124317-20120228-C00060.png)
DE (1) DE2343280A1 (US08124317-20120228-C00060.png)
FR (1) FR2198635A5 (US08124317-20120228-C00060.png)
GB (1) GB1420527A (US08124317-20120228-C00060.png)
IT (1) IT994708B (US08124317-20120228-C00060.png)
NL (1) NL7311238A (US08124317-20120228-C00060.png)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5141586A (US08124317-20120228-C00060.png) * 1974-08-07 1976-04-07 Picker Corp
JPS5278488A (en) * 1975-12-25 1977-07-01 Toshiba Corp Xxray flaw detector
JPS5279988A (en) * 1975-12-25 1977-07-05 Fuji Electric Co Ltd Radiation type tire inspecting apparatus
JPS60102661U (ja) * 1983-12-19 1985-07-12 株式会社島津製作所 球状体のx線検査装置

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49112830U (US08124317-20120228-C00060.png) * 1972-12-27 1974-09-26
US3917947A (en) * 1973-01-26 1975-11-04 Borden Inc Foreign particle detector
US4032785A (en) * 1974-03-28 1977-06-28 United States Steel Corporation Tire inspection machine presenting an x-ray image of the entire width of the tire
US3934144A (en) * 1974-04-11 1976-01-20 United States Steel Corporation X-ray machine for rapid and precise inspection of mixed sizes of pneumatic tires
US3944831A (en) * 1974-08-07 1976-03-16 Picker Corporation Tire inspection system with shielded X-ray source
US4350942A (en) * 1974-08-07 1982-09-21 Monsanto Company Tire inspection system
US4207470A (en) * 1974-08-07 1980-06-10 Monsanto Company Tire inspection system
US3952195A (en) * 1974-08-07 1976-04-20 Picker Corporation System of inspecting tires with relatively movable inspection apparatus components
US3969627A (en) * 1974-08-07 1976-07-13 Picker Corporation System of positioning and inspecting tires
US3952194A (en) * 1974-11-11 1976-04-20 The Goodyear Tire & Rubber Company Device for identifying the location of defects in a tire being X-rayed
US4260889A (en) * 1979-11-28 1981-04-07 The Firestone Tire & Rubber Company Defect marker method and apparatus for use with tire inspection machines
US4677848A (en) * 1985-12-02 1987-07-07 Monsanto Company Multi-size tire chuck
US6016695A (en) * 1997-01-24 2000-01-25 Illinois Tool Works Inc. Tire uniformity testing system
DE10260883B3 (de) * 2002-12-23 2004-07-08 Yxlon International X-Ray Gmbh Vorrichtung und Verfahren zur Prüfung von Prüfteilen, insbesondere von Kraftfahrzeugreifen, mittels Röntgenstrahlung
US10043060B2 (en) * 2008-07-21 2018-08-07 Facefirst, Inc. Biometric notification system
JP5156546B2 (ja) * 2008-08-28 2013-03-06 株式会社イシダ X線検査装置
CN102165307A (zh) * 2008-09-24 2011-08-24 Ge传感与检测技术有限公司 用于借助x射线辐射对检测对象进行材料检测的装置
CN101975787B (zh) * 2010-10-21 2012-07-25 丹东奥龙射线仪器有限公司 螺旋焊管x光检测机探臂装置
US8994817B2 (en) * 2011-11-14 2015-03-31 Michelin Recherche Et Technique S.A. Infrared inspection of metallic web structures
CN106179828B (zh) * 2016-08-29 2018-06-26 桂林梵玛科机械有限公司 轮胎胎胚喷涂机自动控制方法和系统
DE102018121435A1 (de) * 2018-09-03 2020-03-05 Bernhard Brain Vorrichtung zur Zustandserfassung von Altreifen
IT201800020686A1 (it) * 2018-12-21 2020-06-21 Pirelli Procedimento ed apparato per il controllo visivo di pneumatici
ZA202100747B (en) * 2020-09-18 2022-12-21 Eclectic Services Company Pty Ltd A low-cost system for inspecting the integrity of a wheel rim

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3550443A (en) * 1968-11-19 1970-12-29 Morris A Sherkin Method and apparatus for inspecting tires

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2272893A (en) * 1939-07-25 1942-02-10 Firestone Tire & Rubber Co Tire inspection apparatus
US3417476A (en) * 1966-05-02 1968-12-24 Bausch & Lomb Digital measuring apparatus
US3604248A (en) * 1969-08-25 1971-09-14 Eastman Kodak Co Apparatus and methods for determining imbalance
US3621246A (en) * 1970-09-14 1971-11-16 Westinghouse Electric Corp X-ray tire inspection apparatus
US3621247A (en) * 1970-09-14 1971-11-16 Westinghouse Electric Corp X-ray tire inspection apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3550443A (en) * 1968-11-19 1970-12-29 Morris A Sherkin Method and apparatus for inspecting tires

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5141586A (US08124317-20120228-C00060.png) * 1974-08-07 1976-04-07 Picker Corp
JPS555049B2 (US08124317-20120228-C00060.png) * 1974-08-07 1980-02-04
JPS5278488A (en) * 1975-12-25 1977-07-01 Toshiba Corp Xxray flaw detector
JPS5279988A (en) * 1975-12-25 1977-07-05 Fuji Electric Co Ltd Radiation type tire inspecting apparatus
JPS5424314B2 (US08124317-20120228-C00060.png) * 1975-12-25 1979-08-20
JPS55703B2 (US08124317-20120228-C00060.png) * 1975-12-25 1980-01-09
JPS60102661U (ja) * 1983-12-19 1985-07-12 株式会社島津製作所 球状体のx線検査装置

Also Published As

Publication number Publication date
GB1420527A (en) 1976-01-07
CA1020293A (en) 1977-11-01
US3789226A (en) 1974-01-29
NL7311238A (US08124317-20120228-C00060.png) 1974-03-05
FR2198635A5 (US08124317-20120228-C00060.png) 1974-03-29
DE2343280A1 (de) 1974-04-11
JPS5415235B2 (US08124317-20120228-C00060.png) 1979-06-13
IT994708B (it) 1975-10-20

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