JPS4957887A - - Google Patents
Info
- Publication number
- JPS4957887A JPS4957887A JP9837672A JP9837672A JPS4957887A JP S4957887 A JPS4957887 A JP S4957887A JP 9837672 A JP9837672 A JP 9837672A JP 9837672 A JP9837672 A JP 9837672A JP S4957887 A JPS4957887 A JP S4957887A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9837672A JPS4957887A (enExample) | 1972-09-30 | 1972-09-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9837672A JPS4957887A (enExample) | 1972-09-30 | 1972-09-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4957887A true JPS4957887A (enExample) | 1974-06-05 |
Family
ID=14218146
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9837672A Pending JPS4957887A (enExample) | 1972-09-30 | 1972-09-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4957887A (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5184686A (ja) * | 1975-01-24 | 1976-07-24 | Nippon Kokan Kk | Sekinetsukinzokuzairyonohyomenkizukenshutsuhohooyobisonosochi |
| JPS5254484A (en) * | 1975-10-28 | 1977-05-02 | Omron Tateisi Electronics Co | Defect inspecting apparatus |
| JPS5694248A (en) * | 1979-12-28 | 1981-07-30 | Fujitsu Ltd | Detector for foreign matter on surface |
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1972
- 1972-09-30 JP JP9837672A patent/JPS4957887A/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5184686A (ja) * | 1975-01-24 | 1976-07-24 | Nippon Kokan Kk | Sekinetsukinzokuzairyonohyomenkizukenshutsuhohooyobisonosochi |
| JPS5254484A (en) * | 1975-10-28 | 1977-05-02 | Omron Tateisi Electronics Co | Defect inspecting apparatus |
| JPS5694248A (en) * | 1979-12-28 | 1981-07-30 | Fujitsu Ltd | Detector for foreign matter on surface |