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Publication of JPS4943581ApublicationCriticalpatent/JPS4943581A/ja
Publication of JPS5222509B2publicationCriticalpatent/JPS5222509B2/ja
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/26—Testing of individual semiconductor devices
G01R31/2607—Circuits therefor
G01R31/2632—Circuits therefor for testing diodes
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Physics & Mathematics
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General Physics & Mathematics
(AREA)
Testing Of Individual Semiconductor Devices
(AREA)
Investigating Or Analyzing Materials Using Thermal Means
(AREA)
Tests Of Electronic Circuits
(AREA)
Testing Or Measuring Of Semiconductors Or The Like
(AREA)