JPS4937759Y1 - - Google Patents
Info
- Publication number
- JPS4937759Y1 JPS4937759Y1 JP12838170U JP12838170U JPS4937759Y1 JP S4937759 Y1 JPS4937759 Y1 JP S4937759Y1 JP 12838170 U JP12838170 U JP 12838170U JP 12838170 U JP12838170 U JP 12838170U JP S4937759 Y1 JPS4937759 Y1 JP S4937759Y1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Particle Accelerators (AREA)
- Electron Sources, Ion Sources (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12838170U JPS4937759Y1 (en) | 1970-12-18 | 1970-12-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12838170U JPS4937759Y1 (en) | 1970-12-18 | 1970-12-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4937759Y1 true JPS4937759Y1 (en) | 1974-10-16 |
Family
ID=33280510
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12838170U Expired JPS4937759Y1 (en) | 1970-12-18 | 1970-12-18 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4937759Y1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017152366A (en) * | 2016-02-24 | 2017-08-31 | エフ イー アイ カンパニＦｅｉ Ｃｏｍｐａｎｙ | Inspection of dynamic sample behavior in charged-particle microscope |
-
1970
- 1970-12-18 JP JP12838170U patent/JPS4937759Y1/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017152366A (en) * | 2016-02-24 | 2017-08-31 | エフ イー アイ カンパニＦｅｉ Ｃｏｍｐａｎｙ | Inspection of dynamic sample behavior in charged-particle microscope |