JPS4937686A - - Google Patents
Info
- Publication number
- JPS4937686A JPS4937686A JP7933972A JP7933972A JPS4937686A JP S4937686 A JPS4937686 A JP S4937686A JP 7933972 A JP7933972 A JP 7933972A JP 7933972 A JP7933972 A JP 7933972A JP S4937686 A JPS4937686 A JP S4937686A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7933972A JPS4937686A (en) | 1972-08-08 | 1972-08-08 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7933972A JPS4937686A (en) | 1972-08-08 | 1972-08-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4937686A true JPS4937686A (en) | 1974-04-08 |
Family
ID=13687128
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7933972A Pending JPS4937686A (en) | 1972-08-08 | 1972-08-08 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4937686A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5374481A (en) * | 1976-12-15 | 1978-07-01 | Tadao Teraya | Automatic leak inspection machine by detection of bubles |
| US4247528A (en) * | 1979-04-11 | 1981-01-27 | Dow Corning Corporation | Method for producing solar-cell-grade silicon |
| JPS62260711A (en) * | 1986-04-29 | 1987-11-13 | ダウ・コ−ニング・コ−ポレ−シヨン | Manufacture of silicon by carbon heat reduction of silicate dioxide |
| US4981668A (en) * | 1986-04-29 | 1991-01-01 | Dow Corning Corporation | Silicon carbide as a raw material for silicon production |
| US4997474A (en) * | 1988-08-31 | 1991-03-05 | Dow Corning Corporation | Silicon smelting process |
| WO2024190622A1 (en) * | 2023-03-15 | 2024-09-19 | ヤマシンフィルタ株式会社 | Adjustment method, adjustment device, method for manufacturing measurement device, and measurement device |
-
1972
- 1972-08-08 JP JP7933972A patent/JPS4937686A/ja active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5374481A (en) * | 1976-12-15 | 1978-07-01 | Tadao Teraya | Automatic leak inspection machine by detection of bubles |
| US4247528A (en) * | 1979-04-11 | 1981-01-27 | Dow Corning Corporation | Method for producing solar-cell-grade silicon |
| JPS62260711A (en) * | 1986-04-29 | 1987-11-13 | ダウ・コ−ニング・コ−ポレ−シヨン | Manufacture of silicon by carbon heat reduction of silicate dioxide |
| US4981668A (en) * | 1986-04-29 | 1991-01-01 | Dow Corning Corporation | Silicon carbide as a raw material for silicon production |
| US4997474A (en) * | 1988-08-31 | 1991-03-05 | Dow Corning Corporation | Silicon smelting process |
| WO2024190622A1 (en) * | 2023-03-15 | 2024-09-19 | ヤマシンフィルタ株式会社 | Adjustment method, adjustment device, method for manufacturing measurement device, and measurement device |