JPS4933904A - - Google Patents
Info
- Publication number
- JPS4933904A JPS4933904A JP7568672A JP7568672A JPS4933904A JP S4933904 A JPS4933904 A JP S4933904A JP 7568672 A JP7568672 A JP 7568672A JP 7568672 A JP7568672 A JP 7568672A JP S4933904 A JPS4933904 A JP S4933904A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7568672A JPS4933904A (en, 2012) | 1972-07-27 | 1972-07-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7568672A JPS4933904A (en, 2012) | 1972-07-27 | 1972-07-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4933904A true JPS4933904A (en, 2012) | 1974-03-28 |
Family
ID=13583310
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7568672A Pending JPS4933904A (en, 2012) | 1972-07-27 | 1972-07-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4933904A (en, 2012) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51105762A (en) * | 1975-03-14 | 1976-09-18 | Nippon Electron Optics Lab | Denshikenbikyotoniokeru shiryosochi |
| US7071475B2 (en) | 1997-07-22 | 2006-07-04 | Hitachi, Ltd. | Method and apparatus for specimen fabrication |
-
1972
- 1972-07-27 JP JP7568672A patent/JPS4933904A/ja active Pending
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51105762A (en) * | 1975-03-14 | 1976-09-18 | Nippon Electron Optics Lab | Denshikenbikyotoniokeru shiryosochi |
| US7071475B2 (en) | 1997-07-22 | 2006-07-04 | Hitachi, Ltd. | Method and apparatus for specimen fabrication |
| US7138628B2 (en) | 1997-07-22 | 2006-11-21 | Hitachi, Ltd. | Method and apparatus for specimen fabrication |
| US7176458B2 (en) | 1997-07-22 | 2007-02-13 | Hitachi, Ltd. | Method and apparatus for specimen fabrication |
| US7397051B2 (en) | 1997-07-22 | 2008-07-08 | Hitachi, Ltd. | Method and apparatus for specimen fabrication |
| US7397050B2 (en) | 1997-07-22 | 2008-07-08 | Hitachi, Ltd. | Method and apparatus for specimen fabrication |
| US7397052B2 (en) | 1997-07-22 | 2008-07-08 | Hitachi, Ltd. | Method and apparatus for specimen fabrication |
| US7525108B2 (en) | 1997-07-22 | 2009-04-28 | Hitachi, Ltd. | Focused ion beam apparatus for specimen fabrication |
| US7791050B2 (en) | 1997-07-22 | 2010-09-07 | Hitachi, Ltd. | Method and apparatus for specimen fabrication |
| US7999240B2 (en) | 1997-07-22 | 2011-08-16 | Hitachi, Ltd. | Method and apparatus for specimen fabrication |
| US8405053B2 (en) | 1997-07-22 | 2013-03-26 | Hitachi, Ltd. | Method and apparatus for specimen fabrication |
| US8569719B2 (en) | 1997-07-22 | 2013-10-29 | Hitachi, Ltd. | Method and apparatus for specimen fabrication |