JPS4928276A - - Google Patents

Info

Publication number
JPS4928276A
JPS4928276A JP47069319A JP6931972A JPS4928276A JP S4928276 A JPS4928276 A JP S4928276A JP 47069319 A JP47069319 A JP 47069319A JP 6931972 A JP6931972 A JP 6931972A JP S4928276 A JPS4928276 A JP S4928276A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP47069319A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP47069319A priority Critical patent/JPS4928276A/ja
Publication of JPS4928276A publication Critical patent/JPS4928276A/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP47069319A 1972-07-10 1972-07-10 Pending JPS4928276A (cs)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP47069319A JPS4928276A (cs) 1972-07-10 1972-07-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP47069319A JPS4928276A (cs) 1972-07-10 1972-07-10

Publications (1)

Publication Number Publication Date
JPS4928276A true JPS4928276A (cs) 1974-03-13

Family

ID=13399102

Family Applications (1)

Application Number Title Priority Date Filing Date
JP47069319A Pending JPS4928276A (cs) 1972-07-10 1972-07-10

Country Status (1)

Country Link
JP (1) JPS4928276A (cs)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54115078A (en) * 1978-02-28 1979-09-07 Cho Lsi Gijutsu Kenkyu Kumiai Method of testing semiconductor integrated circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54115078A (en) * 1978-02-28 1979-09-07 Cho Lsi Gijutsu Kenkyu Kumiai Method of testing semiconductor integrated circuit

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