JPS4926743B1 - - Google Patents

Info

Publication number
JPS4926743B1
JPS4926743B1 JP45101564A JP10156470A JPS4926743B1 JP S4926743 B1 JPS4926743 B1 JP S4926743B1 JP 45101564 A JP45101564 A JP 45101564A JP 10156470 A JP10156470 A JP 10156470A JP S4926743 B1 JPS4926743 B1 JP S4926743B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP45101564A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4926743B1 publication Critical patent/JPS4926743B1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2637Circuits therefor for testing other individual devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N2021/8461Investigating impurities in semiconductor, e.g. Silicon

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP45101564A 1969-12-15 1970-11-19 Pending JPS4926743B1 (US20050192411A1-20050901-C00001.png)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US88500269A 1969-12-15 1969-12-15

Publications (1)

Publication Number Publication Date
JPS4926743B1 true JPS4926743B1 (US20050192411A1-20050901-C00001.png) 1974-07-11

Family

ID=25385915

Family Applications (1)

Application Number Title Priority Date Filing Date
JP45101564A Pending JPS4926743B1 (US20050192411A1-20050901-C00001.png) 1969-12-15 1970-11-19

Country Status (6)

Country Link
US (1) US3623818A (US20050192411A1-20050901-C00001.png)
JP (1) JPS4926743B1 (US20050192411A1-20050901-C00001.png)
CA (1) CA924927A (US20050192411A1-20050901-C00001.png)
DE (1) DE2061420A1 (US20050192411A1-20050901-C00001.png)
FR (1) FR2071789A5 (US20050192411A1-20050901-C00001.png)
GB (1) GB1306850A (US20050192411A1-20050901-C00001.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63126255U (US20050192411A1-20050901-C00001.png) * 1987-02-09 1988-08-17

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5236817B2 (US20050192411A1-20050901-C00001.png) * 1973-07-27 1977-09-19
US4015127A (en) * 1975-10-30 1977-03-29 Aluminum Company Of America Monitoring film parameters using polarimetry of optical radiation
US4218143A (en) * 1979-01-22 1980-08-19 The United States Of America As Represented By The Secretary Of The Navy Lattice matching measurement device
JPS57132039A (en) * 1981-02-09 1982-08-16 Hitachi Ltd Method for measuring carrier distribution
ATE20620T1 (de) * 1982-04-10 1986-07-15 Hell Rudolf Dr Ing Gmbh Verfahren und vorrichtung zur dichtemessung von farbschichten noch feuchter druckfarbe.
US4646009A (en) * 1982-05-18 1987-02-24 Ade Corporation Contacts for conductivity-type sensors
JP2582363B2 (ja) * 1987-03-19 1997-02-19 株式会社リコー 多色現像装置の画像濃度検出機構
US5007741A (en) * 1989-09-25 1991-04-16 At&T Bell Laboratories Methods and apparatus for detecting impurities in semiconductors
US5287167A (en) * 1990-07-31 1994-02-15 Toshiba Ceramics Co., Ltd. Method for measuring interstitial oxygen concentration
DE4211741B4 (de) * 1991-04-05 2006-09-21 Hahn-Meitner-Institut Berlin Gmbh Spektroskopische Untersuchungsmethode für einen Stoff im Energiebereich geringer Absorption
DE19537807C1 (de) * 1995-10-11 1997-02-06 Roland Man Druckmasch Verfahren zum Feststellen von Schichten
US5966019A (en) * 1996-04-24 1999-10-12 Boxer Cross, Inc. System and method for measuring properties of a semiconductor substrate in a fabrication line
US9093335B2 (en) * 2012-11-29 2015-07-28 Taiwan Semiconductor Manufacturing Company, Ltd. Calculating carrier concentrations in semiconductor Fins using probed resistance

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63126255U (US20050192411A1-20050901-C00001.png) * 1987-02-09 1988-08-17

Also Published As

Publication number Publication date
FR2071789A5 (US20050192411A1-20050901-C00001.png) 1971-09-17
DE2061420A1 (de) 1971-06-24
CA924927A (en) 1973-04-24
GB1306850A (en) 1973-02-14
US3623818A (en) 1971-11-30

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