JPS4921829B1 - - Google Patents
Info
- Publication number
- JPS4921829B1 JPS4921829B1 JP3738669A JP3738669A JPS4921829B1 JP S4921829 B1 JPS4921829 B1 JP S4921829B1 JP 3738669 A JP3738669 A JP 3738669A JP 3738669 A JP3738669 A JP 3738669A JP S4921829 B1 JPS4921829 B1 JP S4921829B1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Electron Sources, Ion Sources (AREA)
- Control Of Motors That Do Not Use Commutators (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3738669A JPS4921829B1 (en) | 1969-05-16 | 1969-05-16 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3738669A JPS4921829B1 (en) | 1969-05-16 | 1969-05-16 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4921829B1 true JPS4921829B1 (en) | 1974-06-04 |
Family
ID=12496074
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3738669A Pending JPS4921829B1 (en) | 1969-05-16 | 1969-05-16 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4921829B1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017152366A (en) * | 2016-02-24 | 2017-08-31 | エフ イー アイ カンパニＦｅｉ Ｃｏｍｐａｎｙ | Inspection of dynamic sample behavior in charged-particle microscope |
-
1969
- 1969-05-16 JP JP3738669A patent/JPS4921829B1/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017152366A (en) * | 2016-02-24 | 2017-08-31 | エフ イー アイ カンパニＦｅｉ Ｃｏｍｐａｎｙ | Inspection of dynamic sample behavior in charged-particle microscope |