JPS4917180A - - Google Patents
Info
- Publication number
- JPS4917180A JPS4917180A JP5524672A JP5524672A JPS4917180A JP S4917180 A JPS4917180 A JP S4917180A JP 5524672 A JP5524672 A JP 5524672A JP 5524672 A JP5524672 A JP 5524672A JP S4917180 A JPS4917180 A JP S4917180A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5524672A JPS5624227B2 (nl) | 1972-06-02 | 1972-06-02 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5524672A JPS5624227B2 (nl) | 1972-06-02 | 1972-06-02 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS4917180A true JPS4917180A (nl) | 1974-02-15 |
JPS5624227B2 JPS5624227B2 (nl) | 1981-06-04 |
Family
ID=12993225
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5524672A Expired JPS5624227B2 (nl) | 1972-06-02 | 1972-06-02 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5624227B2 (nl) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55124242A (en) * | 1979-03-19 | 1980-09-25 | Toshiba Corp | Testing method of semiconductor device |
JPH0252131U (nl) * | 1988-10-07 | 1990-04-13 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH042028Y2 (nl) * | 1985-10-16 | 1992-01-23 |
-
1972
- 1972-06-02 JP JP5524672A patent/JPS5624227B2/ja not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55124242A (en) * | 1979-03-19 | 1980-09-25 | Toshiba Corp | Testing method of semiconductor device |
JPH0252131U (nl) * | 1988-10-07 | 1990-04-13 |
Also Published As
Publication number | Publication date |
---|---|
JPS5624227B2 (nl) | 1981-06-04 |