JPS4917180A - - Google Patents

Info

Publication number
JPS4917180A
JPS4917180A JP5524672A JP5524672A JPS4917180A JP S4917180 A JPS4917180 A JP S4917180A JP 5524672 A JP5524672 A JP 5524672A JP 5524672 A JP5524672 A JP 5524672A JP S4917180 A JPS4917180 A JP S4917180A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5524672A
Other languages
Japanese (ja)
Other versions
JPS5624227B2 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5524672A priority Critical patent/JPS5624227B2/ja
Publication of JPS4917180A publication Critical patent/JPS4917180A/ja
Publication of JPS5624227B2 publication Critical patent/JPS5624227B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP5524672A 1972-06-02 1972-06-02 Expired JPS5624227B2 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5524672A JPS5624227B2 (ko) 1972-06-02 1972-06-02

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5524672A JPS5624227B2 (ko) 1972-06-02 1972-06-02

Publications (2)

Publication Number Publication Date
JPS4917180A true JPS4917180A (ko) 1974-02-15
JPS5624227B2 JPS5624227B2 (ko) 1981-06-04

Family

ID=12993225

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5524672A Expired JPS5624227B2 (ko) 1972-06-02 1972-06-02

Country Status (1)

Country Link
JP (1) JPS5624227B2 (ko)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55124242A (en) * 1979-03-19 1980-09-25 Toshiba Corp Testing method of semiconductor device
JPH0252131U (ko) * 1988-10-07 1990-04-13

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH042028Y2 (ko) * 1985-10-16 1992-01-23

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55124242A (en) * 1979-03-19 1980-09-25 Toshiba Corp Testing method of semiconductor device
JPH0252131U (ko) * 1988-10-07 1990-04-13

Also Published As

Publication number Publication date
JPS5624227B2 (ko) 1981-06-04

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