JPS4896965U - - Google Patents
Info
- Publication number
- JPS4896965U JPS4896965U JP1986972U JP1986972U JPS4896965U JP S4896965 U JPS4896965 U JP S4896965U JP 1986972 U JP1986972 U JP 1986972U JP 1986972 U JP1986972 U JP 1986972U JP S4896965 U JPS4896965 U JP S4896965U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986972U JPS4896965U (enExample) | 1972-02-17 | 1972-02-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986972U JPS4896965U (enExample) | 1972-02-17 | 1972-02-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4896965U true JPS4896965U (enExample) | 1973-11-17 |
Family
ID=27872944
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986972U Pending JPS4896965U (enExample) | 1972-02-17 | 1972-02-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4896965U (enExample) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3543033A (en) * | 1967-10-31 | 1970-11-24 | Claude Brichard | Photoelectric defect detector which determine coordinate of defect by magnitude of scanning voltage and current at position of defect |
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1972
- 1972-02-17 JP JP1986972U patent/JPS4896965U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3543033A (en) * | 1967-10-31 | 1970-11-24 | Claude Brichard | Photoelectric defect detector which determine coordinate of defect by magnitude of scanning voltage and current at position of defect |