JPS4896258A - - Google Patents
Info
- Publication number
- JPS4896258A JPS4896258A JP47029584A JP2958472A JPS4896258A JP S4896258 A JPS4896258 A JP S4896258A JP 47029584 A JP47029584 A JP 47029584A JP 2958472 A JP2958472 A JP 2958472A JP S4896258 A JPS4896258 A JP S4896258A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2958472A JPS5439980B2 (en:Method) | 1972-03-24 | 1972-03-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2958472A JPS5439980B2 (en:Method) | 1972-03-24 | 1972-03-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4896258A true JPS4896258A (en:Method) | 1973-12-08 |
| JPS5439980B2 JPS5439980B2 (en:Method) | 1979-11-30 |
Family
ID=12280116
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2958472A Expired JPS5439980B2 (en:Method) | 1972-03-24 | 1972-03-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5439980B2 (en:Method) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5723149A (en) * | 1980-04-15 | 1982-02-06 | Honeywell Inf Systems | Address forming device for controlling and storing data processing system |
| JPS58108475A (ja) * | 1981-10-19 | 1983-06-28 | フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン | テストベクトルのシーケンスを発生する装置 |
| US5265102A (en) * | 1989-06-16 | 1993-11-23 | Advantest Corporation | Test pattern generator |
-
1972
- 1972-03-24 JP JP2958472A patent/JPS5439980B2/ja not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5723149A (en) * | 1980-04-15 | 1982-02-06 | Honeywell Inf Systems | Address forming device for controlling and storing data processing system |
| JPS58108475A (ja) * | 1981-10-19 | 1983-06-28 | フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン | テストベクトルのシーケンスを発生する装置 |
| US5265102A (en) * | 1989-06-16 | 1993-11-23 | Advantest Corporation | Test pattern generator |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5439980B2 (en:Method) | 1979-11-30 |