JPS4896175A - - Google Patents

Info

Publication number
JPS4896175A
JPS4896175A JP2899472A JP2899472A JPS4896175A JP S4896175 A JPS4896175 A JP S4896175A JP 2899472 A JP2899472 A JP 2899472A JP 2899472 A JP2899472 A JP 2899472A JP S4896175 A JPS4896175 A JP S4896175A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2899472A
Other languages
Japanese (ja)
Other versions
JPS5425826B2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2899472A priority Critical patent/JPS5425826B2/ja
Publication of JPS4896175A publication Critical patent/JPS4896175A/ja
Publication of JPS5425826B2 publication Critical patent/JPS5425826B2/ja
Expired legal-status Critical Current

Links

JP2899472A 1972-03-24 1972-03-24 Expired JPS5425826B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2899472A JPS5425826B2 (en) 1972-03-24 1972-03-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2899472A JPS5425826B2 (en) 1972-03-24 1972-03-24

Publications (2)

Publication Number Publication Date
JPS4896175A true JPS4896175A (en) 1973-12-08
JPS5425826B2 JPS5425826B2 (en) 1979-08-30

Family

ID=12263952

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2899472A Expired JPS5425826B2 (en) 1972-03-24 1972-03-24

Country Status (1)

Country Link
JP (1) JPS5425826B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5791445A (en) * 1980-10-08 1982-06-07 Zeiss Stiftung Luster microscopic spectrochemical analysis method of and apparatus for spatial distribution of sample parameter
JPH053989U (en) * 1991-06-28 1993-01-22 日置電機株式会社 Reflectance measuring device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5791445A (en) * 1980-10-08 1982-06-07 Zeiss Stiftung Luster microscopic spectrochemical analysis method of and apparatus for spatial distribution of sample parameter
JPH0226177B2 (en) * 1980-10-08 1990-06-07 Zeiss Stiftung
JPH053989U (en) * 1991-06-28 1993-01-22 日置電機株式会社 Reflectance measuring device

Also Published As

Publication number Publication date
JPS5425826B2 (en) 1979-08-30

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