JPS4890771A - - Google Patents
Info
- Publication number
- JPS4890771A JPS4890771A JP48011213A JP1121373A JPS4890771A JP S4890771 A JPS4890771 A JP S4890771A JP 48011213 A JP48011213 A JP 48011213A JP 1121373 A JP1121373 A JP 1121373A JP S4890771 A JPS4890771 A JP S4890771A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/305—Contactless testing using electron beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2207546A DE2207546A1 (de) | 1972-02-18 | 1972-02-18 | Verfahren zum pruefen des elektrischen durchganges |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4890771A true JPS4890771A (US20030204162A1-20031030-M00001.png) | 1973-11-27 |
| JPS56747B2 JPS56747B2 (US20030204162A1-20031030-M00001.png) | 1981-01-09 |
Family
ID=5836268
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1121373A Expired JPS56747B2 (US20030204162A1-20031030-M00001.png) | 1972-02-18 | 1973-01-29 |
Country Status (4)
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5696260A (en) * | 1979-12-28 | 1981-08-04 | Mitsubishi Electric Corp | Observation of leak location of electronic material and parts |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4417203A (en) * | 1981-05-26 | 1983-11-22 | International Business Machines Corporation | System for contactless electrical property testing of multi-layer ceramics |
| US4415851A (en) * | 1981-05-26 | 1983-11-15 | International Business Machines Corporation | System for contactless testing of multi-layer ceramics |
| DE3677034D1 (de) * | 1985-03-11 | 1991-02-28 | Nippon Telegraph & Telephone | Methode und geraet zum testen eines integrierten elektronischen bauteils. |
| DE3683053D1 (de) * | 1986-10-23 | 1992-01-30 | Ibm | Verfahren zur kontaktfreien pruefung von platinen fuer integrierte schaltungen unter atmosphaerischen bedingungen. |
| US4970461A (en) * | 1989-06-26 | 1990-11-13 | Lepage Andrew J | Method and apparatus for non-contact opens/shorts testing of electrical circuits |
| US6359451B1 (en) | 2000-02-11 | 2002-03-19 | Image Graphics Incorporated | System for contactless testing of printed circuit boards |
| AU3354401A (en) | 2000-02-14 | 2001-08-20 | Eco 3 Max Inc. | Process for removing volatile organic compounds from an air stream and apparatustherefor |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3196246A (en) * | 1962-11-29 | 1965-07-20 | Rca Corp | Means for observing a workpiece in electron beam machining apparatus |
| US3531716A (en) * | 1967-06-16 | 1970-09-29 | Agency Ind Science Techn | Method of testing an electronic device by use of an electron beam |
| US3448377A (en) * | 1967-10-12 | 1969-06-03 | Atomic Energy Commission | Method utilizing an electron beam for nondestructively measuring the dielectric properties of a sample |
| GB1187901A (en) * | 1968-04-03 | 1970-04-15 | Graham Stuart Plows | Electron Beam Apparatus. |
| US3549999A (en) * | 1968-06-05 | 1970-12-22 | Gen Electric | Method and apparatus for testing circuits by measuring secondary emission electrons generated by electron beam bombardment of the pulsed circuit |
| US3703637A (en) * | 1970-11-23 | 1972-11-21 | Western Electric Co | Electron beam inspection |
-
1972
- 1972-02-18 DE DE2207546A patent/DE2207546A1/de active Pending
- 1972-07-27 US US00275608A patent/US3763425A/en not_active Expired - Lifetime
-
1973
- 1973-01-29 JP JP1121373A patent/JPS56747B2/ja not_active Expired
- 1973-02-16 FR FR7305431A patent/FR2172320A2/fr active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5696260A (en) * | 1979-12-28 | 1981-08-04 | Mitsubishi Electric Corp | Observation of leak location of electronic material and parts |
| JPS6321869B2 (US20030204162A1-20031030-M00001.png) * | 1979-12-28 | 1988-05-09 | Mitsubishi Electric Corp |
Also Published As
| Publication number | Publication date |
|---|---|
| FR2172320A2 (US20030204162A1-20031030-M00001.png) | 1973-09-28 |
| JPS56747B2 (US20030204162A1-20031030-M00001.png) | 1981-01-09 |
| DE2207546A1 (de) | 1973-08-23 |
| US3763425A (en) | 1973-10-02 |
