JPS4889783A - - Google Patents
Info
- Publication number
- JPS4889783A JPS4889783A JP1949272A JP1949272A JPS4889783A JP S4889783 A JPS4889783 A JP S4889783A JP 1949272 A JP1949272 A JP 1949272A JP 1949272 A JP1949272 A JP 1949272A JP S4889783 A JPS4889783 A JP S4889783A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Examining Or Testing Airtightness (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1949272A JPS5320863B2 (OSRAM) | 1972-02-25 | 1972-02-25 | |
| US00312409A US3819943A (en) | 1971-12-17 | 1972-12-05 | Method and apparatus for detecting defects in a sealed portion of a package |
| DE19722260767 DE2260767C3 (de) | 1971-12-17 | 1972-12-12 | Vorrichtung zum Feststellen von Fehlstellen im abgedichteten Teil einer Verpackung |
| NL7217090.A NL161260C (nl) | 1971-12-17 | 1972-12-15 | Inrichting voor het opsporen van defecten in een afgesloten verpakking. |
| GB5826572A GB1396980A (en) | 1971-12-17 | 1972-12-18 | Method and apparatus for detecting defects in seals of packages |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1949272A JPS5320863B2 (OSRAM) | 1972-02-25 | 1972-02-25 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4889783A true JPS4889783A (OSRAM) | 1973-11-22 |
| JPS5320863B2 JPS5320863B2 (OSRAM) | 1978-06-29 |
Family
ID=12000847
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1949272A Expired JPS5320863B2 (OSRAM) | 1971-12-17 | 1972-02-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5320863B2 (OSRAM) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6454239A (en) * | 1987-08-25 | 1989-03-01 | Nippon Kokan Kk | Detection of foreign matter in inner surface of object to be inspected |
| JPS6454241A (en) * | 1987-08-25 | 1989-03-01 | Nippon Kokan Kk | Detection of existing state of contact piece in internal surface of object to be inspected |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3517079B2 (ja) * | 1997-05-14 | 2004-04-05 | クノール食品株式会社 | 高周波アルミシールの非接触検査法 |
| JP3933944B2 (ja) * | 2002-01-28 | 2007-06-20 | クノール食品株式会社 | 高周波アルミシールの非接触検査法 |
-
1972
- 1972-02-25 JP JP1949272A patent/JPS5320863B2/ja not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6454239A (en) * | 1987-08-25 | 1989-03-01 | Nippon Kokan Kk | Detection of foreign matter in inner surface of object to be inspected |
| JPS6454241A (en) * | 1987-08-25 | 1989-03-01 | Nippon Kokan Kk | Detection of existing state of contact piece in internal surface of object to be inspected |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5320863B2 (OSRAM) | 1978-06-29 |