JPS4888873A - - Google Patents

Info

Publication number
JPS4888873A
JPS4888873A JP1872472A JP1872472A JPS4888873A JP S4888873 A JPS4888873 A JP S4888873A JP 1872472 A JP1872472 A JP 1872472A JP 1872472 A JP1872472 A JP 1872472A JP S4888873 A JPS4888873 A JP S4888873A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1872472A
Other languages
Japanese (ja)
Other versions
JPS5231146B2 (ja�@�@
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1872472A priority Critical patent/JPS5231146B2/ja
Publication of JPS4888873A publication Critical patent/JPS4888873A/ja
Publication of JPS5231146B2 publication Critical patent/JPS5231146B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1872472A 1972-02-23 1972-02-23 Expired JPS5231146B2 (ja�@�@)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1872472A JPS5231146B2 (ja�@�@) 1972-02-23 1972-02-23

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1872472A JPS5231146B2 (ja�@�@) 1972-02-23 1972-02-23

Publications (2)

Publication Number Publication Date
JPS4888873A true JPS4888873A (ja�@�@) 1973-11-21
JPS5231146B2 JPS5231146B2 (ja�@�@) 1977-08-12

Family

ID=11979598

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1872472A Expired JPS5231146B2 (ja�@�@) 1972-02-23 1972-02-23

Country Status (1)

Country Link
JP (1) JPS5231146B2 (ja�@�@)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011082353A (ja) * 2009-10-07 2011-04-21 Chube Univ ワイドギャップ半導体のバンドギャップ電子物性の計測方法

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5269740U (ja�@�@) * 1975-11-19 1977-05-24
JPS55119525A (en) * 1979-02-28 1980-09-13 Muneo Aramaki Automobile upper face covering device
JPH0478024U (ja�@�@) * 1990-11-20 1992-07-08

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011082353A (ja) * 2009-10-07 2011-04-21 Chube Univ ワイドギャップ半導体のバンドギャップ電子物性の計測方法

Also Published As

Publication number Publication date
JPS5231146B2 (ja�@�@) 1977-08-12

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