JPS4888873A - - Google Patents
Info
- Publication number
- JPS4888873A JPS4888873A JP1872472A JP1872472A JPS4888873A JP S4888873 A JPS4888873 A JP S4888873A JP 1872472 A JP1872472 A JP 1872472A JP 1872472 A JP1872472 A JP 1872472A JP S4888873 A JPS4888873 A JP S4888873A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1872472A JPS5231146B2 (en:Method) | 1972-02-23 | 1972-02-23 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1872472A JPS5231146B2 (en:Method) | 1972-02-23 | 1972-02-23 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4888873A true JPS4888873A (en:Method) | 1973-11-21 |
| JPS5231146B2 JPS5231146B2 (en:Method) | 1977-08-12 |
Family
ID=11979598
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1872472A Expired JPS5231146B2 (en:Method) | 1972-02-23 | 1972-02-23 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5231146B2 (en:Method) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011082353A (ja) * | 2009-10-07 | 2011-04-21 | Chube Univ | ワイドギャップ半導体のバンドギャップ電子物性の計測方法 |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5269740U (en:Method) * | 1975-11-19 | 1977-05-24 | ||
| JPS55119525A (en) * | 1979-02-28 | 1980-09-13 | Muneo Aramaki | Automobile upper face covering device |
| JPH0478024U (en:Method) * | 1990-11-20 | 1992-07-08 |
-
1972
- 1972-02-23 JP JP1872472A patent/JPS5231146B2/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011082353A (ja) * | 2009-10-07 | 2011-04-21 | Chube Univ | ワイドギャップ半導体のバンドギャップ電子物性の計測方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5231146B2 (en:Method) | 1977-08-12 |