JPS4874864A - - Google Patents
Info
- Publication number
- JPS4874864A JPS4874864A JP328472A JP328472A JPS4874864A JP S4874864 A JPS4874864 A JP S4874864A JP 328472 A JP328472 A JP 328472A JP 328472 A JP328472 A JP 328472A JP S4874864 A JPS4874864 A JP S4874864A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP47003284A JPS5146631B2 (enExample) | 1971-12-29 | 1971-12-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP47003284A JPS5146631B2 (enExample) | 1971-12-29 | 1971-12-29 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4874864A true JPS4874864A (enExample) | 1973-10-09 |
| JPS5146631B2 JPS5146631B2 (enExample) | 1976-12-10 |
Family
ID=11553095
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP47003284A Expired JPS5146631B2 (enExample) | 1971-12-29 | 1971-12-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5146631B2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52140355A (en) * | 1976-05-18 | 1977-11-22 | Western Electric Co | Method of measuring thickness of thin film |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53129534U (enExample) * | 1977-03-19 | 1978-10-14 |
-
1971
- 1971-12-29 JP JP47003284A patent/JPS5146631B2/ja not_active Expired
Non-Patent Citations (2)
| Title |
|---|
| ENERGY DISPERSION X-RAY ANALYSIS=1971 * |
| RADIOISOTOPES=1968 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52140355A (en) * | 1976-05-18 | 1977-11-22 | Western Electric Co | Method of measuring thickness of thin film |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5146631B2 (enExample) | 1976-12-10 |