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Publication of JPS4859872ApublicationCriticalpatent/JPS4859872A/ja
Publication of JPS5724510B2publicationCriticalpatent/JPS5724510B2/ja
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
G—PHYSICS
G01—MEASURING; TESTING
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R13/00—Arrangements for displaying electric variables or waveforms
G01R13/20—Cathode-ray oscilloscopes
G01R13/22—Circuits therefor
G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
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Physics & Mathematics
(AREA)
General Physics & Mathematics
(AREA)
Testing Of Devices, Machine Parts, Or Other Structures Thereof
(AREA)