JPS4847394A - - Google Patents
Info
- Publication number
- JPS4847394A JPS4847394A JP46080889A JP8088971A JPS4847394A JP S4847394 A JPS4847394 A JP S4847394A JP 46080889 A JP46080889 A JP 46080889A JP 8088971 A JP8088971 A JP 8088971A JP S4847394 A JPS4847394 A JP S4847394A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP46080889A JPS4847394A (en) | 1971-10-15 | 1971-10-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP46080889A JPS4847394A (en) | 1971-10-15 | 1971-10-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4847394A true JPS4847394A (en) | 1973-07-05 |
Family
ID=13730903
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP46080889A Pending JPS4847394A (en) | 1971-10-15 | 1971-10-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4847394A (en) |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55104748A (en) * | 1979-02-06 | 1980-08-11 | Permelec Electrode Ltd | Non dispersion type fluorescence x-ray analyzing device |
| JP2003526871A (en) * | 1998-05-22 | 2003-09-09 | ユーロ−セルティーク，エス．エイ． | Environmental scanning electron microscope melting stage |
| JP2007292702A (en) * | 2006-04-27 | 2007-11-08 | Jeol Ltd | Apparatus, method and system for inspecting samples |
| JP2007294365A (en) * | 2006-04-27 | 2007-11-08 | Jeol Ltd | Test piece inspection method, test piece support body, and test piece inspection device as well as test piece inspection system |
| JP2008153086A (en) * | 2006-12-19 | 2008-07-03 | Jeol Ltd | Sample inspection device, sample inspection method, and sample inspection system |
| JP2008180521A (en) * | 2007-01-23 | 2008-08-07 | Jeol Ltd | Sample inspection device and method |
| JP2008210765A (en) * | 2007-01-31 | 2008-09-11 | Jeol Ltd | Specimen holder, specimen inspection device, specimen inspection method, and method for manufacturing specimen holder |
| JP2008210715A (en) * | 2007-02-27 | 2008-09-11 | Ebara Corp | Charged particle beam device, and sample surface observation method using the same |
| JP2009158222A (en) * | 2007-12-26 | 2009-07-16 | Jeol Ltd | Sample holder, method of observation and inspection, and apparatus for observation and inspection |
| JP2009250904A (en) * | 2008-04-10 | 2009-10-29 | Jeol Ltd | Apparatus and method for inspection |
| JP2010521656A (en) * | 2007-03-02 | 2010-06-24 | プロトチップス，インコーポレイテッド | Membrane support with reinforcing features |
| WO2015044665A1 (en) * | 2013-09-25 | 2015-04-02 | Oxford Instruments Nanotechnology Tools Limited | X-ray analysis in air |
-
1971
- 1971-10-15 JP JP46080889A patent/JPS4847394A/ja active Pending
Cited By (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55104748A (en) * | 1979-02-06 | 1980-08-11 | Permelec Electrode Ltd | Non dispersion type fluorescence x-ray analyzing device |
| JP2003526871A (en) * | 1998-05-22 | 2003-09-09 | ユーロ−セルティーク，エス．エイ． | Environmental scanning electron microscope melting stage |
| JP2007292702A (en) * | 2006-04-27 | 2007-11-08 | Jeol Ltd | Apparatus, method and system for inspecting samples |
| JP2007294365A (en) * | 2006-04-27 | 2007-11-08 | Jeol Ltd | Test piece inspection method, test piece support body, and test piece inspection device as well as test piece inspection system |
| JP2008153086A (en) * | 2006-12-19 | 2008-07-03 | Jeol Ltd | Sample inspection device, sample inspection method, and sample inspection system |
| JP2008180521A (en) * | 2007-01-23 | 2008-08-07 | Jeol Ltd | Sample inspection device and method |
| JP2008210765A (en) * | 2007-01-31 | 2008-09-11 | Jeol Ltd | Specimen holder, specimen inspection device, specimen inspection method, and method for manufacturing specimen holder |
| JP2008210715A (en) * | 2007-02-27 | 2008-09-11 | Ebara Corp | Charged particle beam device, and sample surface observation method using the same |
| US9040939B2 (en) | 2007-03-02 | 2015-05-26 | Protochips, Inc. | Membrane supports with reinforcement features |
| JP2010521656A (en) * | 2007-03-02 | 2010-06-24 | プロトチップス，インコーポレイテッド | Membrane support with reinforcing features |
| JP2009158222A (en) * | 2007-12-26 | 2009-07-16 | Jeol Ltd | Sample holder, method of observation and inspection, and apparatus for observation and inspection |
| JP2009250904A (en) * | 2008-04-10 | 2009-10-29 | Jeol Ltd | Apparatus and method for inspection |
| WO2015044665A1 (en) * | 2013-09-25 | 2015-04-02 | Oxford Instruments Nanotechnology Tools Limited | X-ray analysis in air |
| JP2016533612A (en) * | 2013-09-25 | 2016-10-27 | オックスフォード インストルメンツ ナノテクノロジー ツールス リミテッド | X-ray analysis in air |
| US9704688B2 (en) | 2013-09-25 | 2017-07-11 | Oxford Instruments Nanotechnology Tools Limited | X-ray analysis in air |
| US10354834B2 (en) | 2013-09-25 | 2019-07-16 | Oxford Instruments Nanotechnology Tools Limited | X-ray analysis in air |