JPS4846265A - - Google Patents

Info

Publication number
JPS4846265A
JPS4846265A JP47098864A JP9886472A JPS4846265A JP S4846265 A JPS4846265 A JP S4846265A JP 47098864 A JP47098864 A JP 47098864A JP 9886472 A JP9886472 A JP 9886472A JP S4846265 A JPS4846265 A JP S4846265A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP47098864A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4846265A publication Critical patent/JPS4846265A/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/22Optical or photographic arrangements associated with the tube
    • H01J37/226Optical arrangements for illuminating the object; optical arrangements for collecting light from the object
    • H01J37/228Optical arrangements for illuminating the object; optical arrangements for collecting light from the object whereby illumination and light collection take place in the same area of the discharge
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/244Detectors; Associated components or circuits therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244Detection characterized by the detecting means
    • H01J2237/2445Photon detectors for X-rays, light, e.g. photomultipliers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245Detection characterised by the variable being measured
    • H01J2237/24507Intensity, dose or other characteristics of particle beams or electromagnetic radiation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP47098864A 1971-10-05 1972-10-02 Pending JPS4846265A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AT860371A AT306804B (en) 1971-10-05 1971-10-05 Cathodoluminescence device for scanning electron microscopes

Publications (1)

Publication Number Publication Date
JPS4846265A true JPS4846265A (en) 1973-07-02

Family

ID=3606958

Family Applications (2)

Application Number Title Priority Date Filing Date
JP47098864A Pending JPS4846265A (en) 1971-10-05 1972-10-02
JP1977090817U Pending JPS5310255U (en) 1971-10-05 1977-07-08

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP1977090817U Pending JPS5310255U (en) 1971-10-05 1977-07-08

Country Status (5)

Country Link
US (1) US3790781A (en)
JP (2) JPS4846265A (en)
AT (1) AT306804B (en)
DE (1) DE2246865B2 (en)
GB (1) GB1369314A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58117058U (en) * 1982-02-04 1983-08-10 日本電子株式会社 Cathodoluminescence device for scanning electron microscope
JPH0729537A (en) * 1992-11-17 1995-01-31 Natl Univ Of Singapore Highly efficient cathod luminescence detector excellent in back scattering electron identification
JP2019067749A (en) * 2017-09-29 2019-04-25 株式会社堀場製作所 Luminescent light collector

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7902963A (en) * 1979-04-13 1980-10-15 Philips Nv DETECTOR FOR ELECTRON MICROSCOPE.
AU534811B2 (en) * 1979-07-03 1984-02-16 Unisearch Limited Atmospheric scanning electron microscope
JPS57103747A (en) * 1980-12-20 1982-06-28 Hitachi Kiden Kogyo Ltd Automatic press device
US4546254A (en) * 1983-03-24 1985-10-08 Shimadzu Corporation Charged particle energy analyzer
US4578584A (en) * 1984-01-23 1986-03-25 International Business Machines Corporation Thermal wave microscopy using areal infrared detection
JPS6195722A (en) * 1984-10-18 1986-05-14 Nippon Kokan Kk <Nkk> Device for following up stock of press brake
US4831267A (en) * 1987-02-16 1989-05-16 Siemens Aktiengesellschaft Detector for charged particles
DE3729846A1 (en) * 1987-09-05 1989-03-23 Zeiss Carl Fa CATHODOLUMINESCENCE DETECTOR
JPH07108414B2 (en) * 1988-01-05 1995-11-22 鋼鈑工業株式会社 Material supply device for press brakes
US4979199A (en) * 1989-10-31 1990-12-18 General Electric Company Microfocus X-ray tube with optical spot size sensing means
US5468967A (en) * 1994-08-26 1995-11-21 National University Of Singapore Double reflection cathodoluminescence detector with extremely high discrimination against backscattered electrons
US5724131A (en) * 1995-06-14 1998-03-03 The National University Of Singapore Integrated emission microscope for panchromatic imaging, continuous wavelength spectroscopy and selective area spectroscopic mapping
US5569920A (en) * 1995-06-14 1996-10-29 National University Of Singapore Retractable cathodoluminescence detector with high ellipticity and high backscattered electron rejection performance for large area specimens
JP4824527B2 (en) * 2006-11-01 2011-11-30 株式会社トプコン Sample analyzer
GB2478900A (en) 2009-09-10 2011-09-28 Univ Sheffield Collection of electromagnetic radiation emitted from particle irradiated samples
DE102009046211B4 (en) 2009-10-30 2017-08-24 Carl Zeiss Microscopy Gmbh Detection device and particle beam device with detection device
US9322776B2 (en) * 2014-08-19 2016-04-26 The Boeing Company Method and system for imaging a target
EP3462475A3 (en) * 2017-09-29 2019-11-20 Horiba, Ltd. Luminescence collecting device
US11114274B2 (en) * 2019-12-23 2021-09-07 Carl Zeiss Smt Gmbh Method and system for testing an integrated circuit
CN113675060A (en) * 2020-05-13 2021-11-19 聚束科技(北京)有限公司 Scanning electron microscope

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3319071A (en) * 1964-11-27 1967-05-09 Gen Motors Corp Infrared gas analysis absorption chamber having a highly reflective specular internal surface
JPS517072A (en) * 1974-07-08 1976-01-21 Satsuki Kitani

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58117058U (en) * 1982-02-04 1983-08-10 日本電子株式会社 Cathodoluminescence device for scanning electron microscope
JPS6326926Y2 (en) * 1982-02-04 1988-07-21
JPH0729537A (en) * 1992-11-17 1995-01-31 Natl Univ Of Singapore Highly efficient cathod luminescence detector excellent in back scattering electron identification
JP2019067749A (en) * 2017-09-29 2019-04-25 株式会社堀場製作所 Luminescent light collector

Also Published As

Publication number Publication date
AT306804B (en) 1973-04-25
GB1369314A (en) 1974-10-02
DE2246865C3 (en) 1974-05-16
JPS5310255U (en) 1978-01-27
DE2246865A1 (en) 1973-04-19
US3790781A (en) 1974-02-05
DE2246865B2 (en) 1973-10-18

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