JPS4818234Y1 - - Google Patents
Info
- Publication number
- JPS4818234Y1 JPS4818234Y1 JP1355871U JP1355871U JPS4818234Y1 JP S4818234 Y1 JPS4818234 Y1 JP S4818234Y1 JP 1355871 U JP1355871 U JP 1355871U JP 1355871 U JP1355871 U JP 1355871U JP S4818234 Y1 JPS4818234 Y1 JP S4818234Y1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1355871U JPS4818234Y1 (en) | 1971-03-03 | 1971-03-03 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1355871U JPS4818234Y1 (en) | 1971-03-03 | 1971-03-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4818234Y1 true JPS4818234Y1 (en) | 1973-05-24 |
Family
ID=33195734
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1355871U Expired JPS4818234Y1 (en) | 1971-03-03 | 1971-03-03 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4818234Y1 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016509230A (en) * | 2013-03-04 | 2016-03-24 | ネッチ ゲレーテバウ ゲーエムベーハー | Method and apparatus for material analysis |
| JP2019211469A (en) * | 2018-06-06 | 2019-12-12 | ネッチ ゲレーテバウ ゲーエムベーハー | Measuring arrangement and method for thermal analysis of sample |
| JP2019215326A (en) * | 2018-06-06 | 2019-12-19 | ネッチ ゲレーテバウ ゲーエムベーハー | Measuring device and method for performing thermal analysis of sample |
| JP2020008569A (en) * | 2018-06-06 | 2020-01-16 | ネッチ ゲレーテバウ ゲーエムベーハー | Device and method for measurement for thermal analysis of sample |
-
1971
- 1971-03-03 JP JP1355871U patent/JPS4818234Y1/ja not_active Expired
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016509230A (en) * | 2013-03-04 | 2016-03-24 | ネッチ ゲレーテバウ ゲーエムベーハー | Method and apparatus for material analysis |
| JP2019211469A (en) * | 2018-06-06 | 2019-12-12 | ネッチ ゲレーテバウ ゲーエムベーハー | Measuring arrangement and method for thermal analysis of sample |
| JP2019215326A (en) * | 2018-06-06 | 2019-12-19 | ネッチ ゲレーテバウ ゲーエムベーハー | Measuring device and method for performing thermal analysis of sample |
| JP2020008569A (en) * | 2018-06-06 | 2020-01-16 | ネッチ ゲレーテバウ ゲーエムベーハー | Device and method for measurement for thermal analysis of sample |