JPS48100152A - - Google Patents
Info
- Publication number
- JPS48100152A JPS48100152A JP3243672A JP3243672A JPS48100152A JP S48100152 A JPS48100152 A JP S48100152A JP 3243672 A JP3243672 A JP 3243672A JP 3243672 A JP3243672 A JP 3243672A JP S48100152 A JPS48100152 A JP S48100152A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Instruments For Measurement Of Length By Optical Means (AREA)
- Microscoopes, Condenser (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3243672A JPS48100152A (en:Method) | 1972-03-31 | 1972-03-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3243672A JPS48100152A (en:Method) | 1972-03-31 | 1972-03-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS48100152A true JPS48100152A (en:Method) | 1973-12-18 |
Family
ID=12358889
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3243672A Pending JPS48100152A (en:Method) | 1972-03-31 | 1972-03-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS48100152A (en:Method) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5370234U (en:Method) * | 1976-11-16 | 1978-06-13 | ||
| JP2002268145A (ja) * | 2001-03-13 | 2002-09-18 | Nikon Corp | チャート投影機能を持つ投影機 |
| JP2010185727A (ja) * | 2009-02-10 | 2010-08-26 | Olympus Corp | 干渉計 |
-
1972
- 1972-03-31 JP JP3243672A patent/JPS48100152A/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5370234U (en:Method) * | 1976-11-16 | 1978-06-13 | ||
| JP2002268145A (ja) * | 2001-03-13 | 2002-09-18 | Nikon Corp | チャート投影機能を持つ投影機 |
| JP2010185727A (ja) * | 2009-02-10 | 2010-08-26 | Olympus Corp | 干渉計 |