JPS4736767A - - Google Patents

Info

Publication number
JPS4736767A
JPS4736767A JP1149272A JP1149272A JPS4736767A JP S4736767 A JPS4736767 A JP S4736767A JP 1149272 A JP1149272 A JP 1149272A JP 1149272 A JP1149272 A JP 1149272A JP S4736767 A JPS4736767 A JP S4736767A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1149272A
Other languages
Japanese (ja)
Other versions
JPS5232555B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4736767A publication Critical patent/JPS4736767A/ja
Publication of JPS5232555B1 publication Critical patent/JPS5232555B1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273Test methods
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/90Masterslice integrated circuits
    • H10D84/901Masterslice integrated circuits comprising bipolar technology

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP47011492A 1971-03-30 1972-02-02 Pending JPS5232555B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12950071A 1971-03-30 1971-03-30

Publications (2)

Publication Number Publication Date
JPS4736767A true JPS4736767A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1972-11-29
JPS5232555B1 JPS5232555B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1977-08-22

Family

ID=22440271

Family Applications (1)

Application Number Title Priority Date Filing Date
JP47011492A Pending JPS5232555B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1971-03-30 1972-02-02

Country Status (5)

Country Link
US (2) US3762037A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS5232555B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE2207657A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
FR (1) FR2131978B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB1366194A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5113228A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1974-07-24 1976-02-02 Canon Kk
JPS52104922A (en) * 1976-02-28 1977-09-02 Fujitsu Ltd Rolling up method of belt type film
JPS5373043A (en) * 1976-12-13 1978-06-29 Fujitsu Ltd Logical circuit device
JPS5461919A (en) * 1977-10-27 1979-05-18 Tokyo Karaa Kk Device for controlling photographic film stopping position
JPS5688062A (en) * 1979-12-14 1981-07-17 Canon Inc Ink ribbon feeder

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3761695A (en) * 1972-10-16 1973-09-25 Ibm Method of level sensitive testing a functional logic system
US3842491A (en) * 1972-12-08 1974-10-22 Ibm Manufacture of assorted types of lsi devices on same wafer
US4220917A (en) * 1978-07-31 1980-09-02 International Business Machines Corporation Test circuitry for module interconnection network
DE3382183D1 (de) * 1982-12-23 1991-04-04 Sumitomo Electric Industries Monolithische integrierte mikrowellenschaltung und verfahren zum auswaehlen derselben.
US4638246A (en) * 1984-09-21 1987-01-20 Gte Laboratories Incorporated Integrated circuit input-output diagnostic system
US4791359A (en) * 1987-11-18 1988-12-13 Zehntel, Inc. Method of detecting possibly electrically-open connections between circuit nodes and pins connected to those nodes
US4924589A (en) * 1988-05-16 1990-05-15 Leedy Glenn J Method of making and testing an integrated circuit
US5225771A (en) * 1988-05-16 1993-07-06 Dri Technology Corp. Making and testing an integrated circuit using high density probe points
JP3151203B2 (ja) * 1988-11-23 2001-04-03 テキサス インスツルメンツ インコーポレイテツド 集積回路の自己検査装置
US5070296A (en) * 1990-06-22 1991-12-03 Honeywell Inc. Integrated circuit interconnections testing
US5101154A (en) * 1990-11-13 1992-03-31 Motorola, Inc. Open bond detector for an integrated circuit
WO1996013003A1 (en) * 1994-10-19 1996-05-02 Micron Technology, Inc. An efficient method for obtaining usable parts from a partially good memory integrated circuit
US5946257A (en) * 1996-07-24 1999-08-31 Micron Technology, Inc. Selective power distribution circuit for an integrated circuit
US8258806B2 (en) * 2007-12-24 2012-09-04 Texas Instruments Incorporated Self-isolating mixed design-rule integrated yield monitor

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1401289A (fr) * 1964-04-17 1965-06-04 Constr Telephoniques Système de détection et d'élimination des défauts pour circuits électriques
US3466544A (en) * 1965-10-18 1969-09-09 Boeing Co Integrated circuits having integrated test transformation networks incorporated therewith on common substrate chips
US3423822A (en) * 1967-02-27 1969-01-28 Northern Electric Co Method of making large scale integrated circuit
US3590378A (en) * 1967-11-16 1971-06-29 Gen Electric Information Syste Fault-detecting monitor for integrated circuit units
US3618201A (en) * 1968-02-19 1971-11-09 Hitachi Ltd Method of fabricating lsi circuits
US3528104A (en) * 1968-03-08 1970-09-08 Western Electric Co Bridge circuit methods of and apparatus for testing and locating faults in electrical circuits

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5113228A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1974-07-24 1976-02-02 Canon Kk
JPS52104922A (en) * 1976-02-28 1977-09-02 Fujitsu Ltd Rolling up method of belt type film
JPS5373043A (en) * 1976-12-13 1978-06-29 Fujitsu Ltd Logical circuit device
JPS5461919A (en) * 1977-10-27 1979-05-18 Tokyo Karaa Kk Device for controlling photographic film stopping position
JPS5688062A (en) * 1979-12-14 1981-07-17 Canon Inc Ink ribbon feeder

Also Published As

Publication number Publication date
US3801905A (en) 1974-04-02
FR2131978B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1974-09-13
DE2207657A1 (de) 1972-10-12
JPS5232555B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1977-08-22
US3762037A (en) 1973-10-02
FR2131978A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1972-11-17
GB1366194A (en) 1974-09-11

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