JPS4717779Y1 - - Google Patents
Info
- Publication number
- JPS4717779Y1 JPS4717779Y1 JP1968112116U JP11211668U JPS4717779Y1 JP S4717779 Y1 JPS4717779 Y1 JP S4717779Y1 JP 1968112116 U JP1968112116 U JP 1968112116U JP 11211668 U JP11211668 U JP 11211668U JP S4717779 Y1 JPS4717779 Y1 JP S4717779Y1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1968112116U JPS4717779Y1 (cs) | 1968-12-24 | 1968-12-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1968112116U JPS4717779Y1 (cs) | 1968-12-24 | 1968-12-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4717779Y1 true JPS4717779Y1 (cs) | 1972-06-20 |
Family
ID=42915028
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1968112116U Expired JPS4717779Y1 (cs) | 1968-12-24 | 1968-12-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4717779Y1 (cs) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53141464A (en) * | 1977-05-13 | 1978-12-09 | Usm Corp | Successive testing device for electronic parts |
-
1968
- 1968-12-24 JP JP1968112116U patent/JPS4717779Y1/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53141464A (en) * | 1977-05-13 | 1978-12-09 | Usm Corp | Successive testing device for electronic parts |