JPS4628235Y1 - - Google Patents
Info
- Publication number
- JPS4628235Y1 JPS4628235Y1 JP5904967U JP5904967U JPS4628235Y1 JP S4628235 Y1 JPS4628235 Y1 JP S4628235Y1 JP 5904967 U JP5904967 U JP 5904967U JP 5904967 U JP5904967 U JP 5904967U JP S4628235 Y1 JPS4628235 Y1 JP S4628235Y1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5904967U JPS4628235Y1 (en) | 1967-07-08 | 1967-07-08 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5904967U JPS4628235Y1 (en) | 1967-07-08 | 1967-07-08 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS4628235Y1 true JPS4628235Y1 (en) | 1971-09-29 |
Family
ID=42889161
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5904967U Expired JPS4628235Y1 (en) | 1967-07-08 | 1967-07-08 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS4628235Y1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002181635A (en) * | 2000-12-15 | 2002-06-26 | Nichiyu Giken Kogyo Co Ltd | Heating temperature confirmation indicator |
JP2006153469A (en) * | 2004-11-25 | 2006-06-15 | Jiikuesuto:Kk | Temperature measuring instrument for silicon wafer |
-
1967
- 1967-07-08 JP JP5904967U patent/JPS4628235Y1/ja not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002181635A (en) * | 2000-12-15 | 2002-06-26 | Nichiyu Giken Kogyo Co Ltd | Heating temperature confirmation indicator |
JP2006153469A (en) * | 2004-11-25 | 2006-06-15 | Jiikuesuto:Kk | Temperature measuring instrument for silicon wafer |
JP4708769B2 (en) * | 2004-11-25 | 2011-06-22 | 株式会社ジークエスト | Silicon wafer temperature measuring instrument |