JPS453400Y1 - - Google Patents
Info
- Publication number
- JPS453400Y1 JPS453400Y1 JP1967033987U JP3398767U JPS453400Y1 JP S453400 Y1 JPS453400 Y1 JP S453400Y1 JP 1967033987 U JP1967033987 U JP 1967033987U JP 3398767 U JP3398767 U JP 3398767U JP S453400 Y1 JPS453400 Y1 JP S453400Y1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1967033987U JPS453400Y1 (en:Method) | 1967-04-24 | 1967-04-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1967033987U JPS453400Y1 (en:Method) | 1967-04-24 | 1967-04-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS453400Y1 true JPS453400Y1 (en:Method) | 1970-02-16 |
Family
ID=42832412
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1967033987U Expired JPS453400Y1 (en:Method) | 1967-04-24 | 1967-04-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS453400Y1 (en:Method) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6093973A (ja) * | 1983-10-28 | 1985-05-25 | Mitsubishi Electric Corp | 半導体試験装置の検査装置 |
-
1967
- 1967-04-24 JP JP1967033987U patent/JPS453400Y1/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6093973A (ja) * | 1983-10-28 | 1985-05-25 | Mitsubishi Electric Corp | 半導体試験装置の検査装置 |