JPS447702Y1 - - Google Patents
Info
- Publication number
- JPS447702Y1 JPS447702Y1 JP2492865U JP2492865U JPS447702Y1 JP S447702 Y1 JPS447702 Y1 JP S447702Y1 JP 2492865 U JP2492865 U JP 2492865U JP 2492865 U JP2492865 U JP 2492865U JP S447702 Y1 JPS447702 Y1 JP S447702Y1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2492865U JPS447702Y1 (cs) | 1965-03-31 | 1965-03-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2492865U JPS447702Y1 (cs) | 1965-03-31 | 1965-03-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS447702Y1 true JPS447702Y1 (cs) | 1969-03-25 |
Family
ID=31760022
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2492865U Expired JPS447702Y1 (cs) | 1965-03-31 | 1965-03-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS447702Y1 (cs) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS519636Y1 (cs) * | 1970-08-31 | 1976-03-15 | ||
| JPS5335979A (en) * | 1976-09-14 | 1978-04-03 | Sumitomo Electric Ind Ltd | Incorrect filming sense-off method of insulated wire |
| JPH03160355A (ja) * | 1989-11-17 | 1991-07-10 | Kuwabara Yasunaga | 有機被膜層の欠陥検査方法 |
-
1965
- 1965-03-31 JP JP2492865U patent/JPS447702Y1/ja not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS519636Y1 (cs) * | 1970-08-31 | 1976-03-15 | ||
| JPS5335979A (en) * | 1976-09-14 | 1978-04-03 | Sumitomo Electric Ind Ltd | Incorrect filming sense-off method of insulated wire |
| JPH03160355A (ja) * | 1989-11-17 | 1991-07-10 | Kuwabara Yasunaga | 有機被膜層の欠陥検査方法 |