JPS446160Y1 - - Google Patents
Info
- Publication number
- JPS446160Y1 JPS446160Y1 JP7053765U JP7053765U JPS446160Y1 JP S446160 Y1 JPS446160 Y1 JP S446160Y1 JP 7053765 U JP7053765 U JP 7053765U JP 7053765 U JP7053765 U JP 7053765U JP S446160 Y1 JPS446160 Y1 JP S446160Y1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Microscoopes, Condenser (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7053765U JPS446160Y1 (cs) | 1965-08-28 | 1965-08-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7053765U JPS446160Y1 (cs) | 1965-08-28 | 1965-08-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS446160Y1 true JPS446160Y1 (cs) | 1969-03-05 |
Family
ID=31803054
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7053765U Expired JPS446160Y1 (cs) | 1965-08-28 | 1965-08-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS446160Y1 (cs) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5188281U (cs) * | 1975-01-10 | 1976-07-15 | ||
| JPS5312379A (en) * | 1976-07-20 | 1978-02-03 | Nippon Steel Corp | Illuminating method in surface flaw inspecting system |
| JPS56157841A (en) * | 1980-05-07 | 1981-12-05 | Koyo Seiko Co Ltd | Detecting apparatus for surface defect of body |
| JPH01201140A (ja) * | 1988-02-05 | 1989-08-14 | Nissan Motor Co Ltd | 表面欠陥検査装置 |
| JPH0248626A (ja) * | 1988-08-11 | 1990-02-19 | Nikon Corp | 反射型照明光学装置 |
| JPH0310249U (cs) * | 1989-06-19 | 1991-01-31 | ||
| JPH0310250U (cs) * | 1989-06-19 | 1991-01-31 |
-
1965
- 1965-08-28 JP JP7053765U patent/JPS446160Y1/ja not_active Expired
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5188281U (cs) * | 1975-01-10 | 1976-07-15 | ||
| JPS5312379A (en) * | 1976-07-20 | 1978-02-03 | Nippon Steel Corp | Illuminating method in surface flaw inspecting system |
| JPS5814984B2 (ja) * | 1976-07-20 | 1983-03-23 | 新日本製鐵株式会社 | 圧延鋼板表面疵検査システムに於ける照明方法 |
| JPS56157841A (en) * | 1980-05-07 | 1981-12-05 | Koyo Seiko Co Ltd | Detecting apparatus for surface defect of body |
| JPS6353493B2 (cs) * | 1980-05-07 | 1988-10-24 | Koyo Seiko Co | |
| JPH01201140A (ja) * | 1988-02-05 | 1989-08-14 | Nissan Motor Co Ltd | 表面欠陥検査装置 |
| JPH0248626A (ja) * | 1988-08-11 | 1990-02-19 | Nikon Corp | 反射型照明光学装置 |
| JPH0310249U (cs) * | 1989-06-19 | 1991-01-31 | ||
| JPH0310250U (cs) * | 1989-06-19 | 1991-01-31 |