JPS4430779Y1 - - Google Patents
Info
- Publication number
- JPS4430779Y1 JPS4430779Y1 JP6165367U JP6165367U JPS4430779Y1 JP S4430779 Y1 JPS4430779 Y1 JP S4430779Y1 JP 6165367 U JP6165367 U JP 6165367U JP 6165367 U JP6165367 U JP 6165367U JP S4430779 Y1 JPS4430779 Y1 JP S4430779Y1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6165367U JPS4430779Y1 (en) | 1967-07-18 | 1967-07-18 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6165367U JPS4430779Y1 (en) | 1967-07-18 | 1967-07-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS4430779Y1 true JPS4430779Y1 (en) | 1969-12-18 |
Family
ID=31795078
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6165367U Expired JPS4430779Y1 (en) | 1967-07-18 | 1967-07-18 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS4430779Y1 (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5092169U (en) * | 1973-12-25 | 1975-08-04 | ||
JPS5117008Y1 (en) * | 1970-12-29 | 1976-05-08 | ||
JPS53147877U (en) * | 1977-04-26 | 1978-11-21 | ||
JPS57130276U (en) * | 1981-02-09 | 1982-08-13 | ||
JPS6140041A (en) * | 1984-07-31 | 1986-02-26 | Yokowo Mfg Co Ltd | Inspection of electronic parts and device therefore |
JPS6282739U (en) * | 1985-11-12 | 1987-05-27 | ||
JPS63293845A (en) * | 1987-05-27 | 1988-11-30 | Hitachi Ltd | Apparatus for inspecting semiconductor element |
JP2012083234A (en) * | 2010-10-13 | 2012-04-26 | Hioki Ee Corp | Probe and measuring apparatus |
-
1967
- 1967-07-18 JP JP6165367U patent/JPS4430779Y1/ja not_active Expired
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5117008Y1 (en) * | 1970-12-29 | 1976-05-08 | ||
JPS5092169U (en) * | 1973-12-25 | 1975-08-04 | ||
JPS53147877U (en) * | 1977-04-26 | 1978-11-21 | ||
JPS5757331Y2 (en) * | 1977-04-26 | 1982-12-09 | ||
JPS57130276U (en) * | 1981-02-09 | 1982-08-13 | ||
JPS6140041A (en) * | 1984-07-31 | 1986-02-26 | Yokowo Mfg Co Ltd | Inspection of electronic parts and device therefore |
JPH0340940B2 (en) * | 1984-07-31 | 1991-06-20 | ||
JPS6282739U (en) * | 1985-11-12 | 1987-05-27 | ||
JPS63293845A (en) * | 1987-05-27 | 1988-11-30 | Hitachi Ltd | Apparatus for inspecting semiconductor element |
JP2012083234A (en) * | 2010-10-13 | 2012-04-26 | Hioki Ee Corp | Probe and measuring apparatus |