JPS4430779Y1 - - Google Patents

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Publication number
JPS4430779Y1
JPS4430779Y1 JP6165367U JP6165367U JPS4430779Y1 JP S4430779 Y1 JPS4430779 Y1 JP S4430779Y1 JP 6165367 U JP6165367 U JP 6165367U JP 6165367 U JP6165367 U JP 6165367U JP S4430779 Y1 JPS4430779 Y1 JP S4430779Y1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP6165367U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6165367U priority Critical patent/JPS4430779Y1/ja
Publication of JPS4430779Y1 publication Critical patent/JPS4430779Y1/ja
Expired legal-status Critical Current

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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP6165367U 1967-07-18 1967-07-18 Expired JPS4430779Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6165367U JPS4430779Y1 (en) 1967-07-18 1967-07-18

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6165367U JPS4430779Y1 (en) 1967-07-18 1967-07-18

Publications (1)

Publication Number Publication Date
JPS4430779Y1 true JPS4430779Y1 (en) 1969-12-18

Family

ID=31795078

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6165367U Expired JPS4430779Y1 (en) 1967-07-18 1967-07-18

Country Status (1)

Country Link
JP (1) JPS4430779Y1 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5092169U (en) * 1973-12-25 1975-08-04
JPS5117008Y1 (en) * 1970-12-29 1976-05-08
JPS53147877U (en) * 1977-04-26 1978-11-21
JPS57130276U (en) * 1981-02-09 1982-08-13
JPS6140041A (en) * 1984-07-31 1986-02-26 Yokowo Mfg Co Ltd Inspection of electronic parts and device therefore
JPS6282739U (en) * 1985-11-12 1987-05-27
JPS63293845A (en) * 1987-05-27 1988-11-30 Hitachi Ltd Apparatus for inspecting semiconductor element
JP2012083234A (en) * 2010-10-13 2012-04-26 Hioki Ee Corp Probe and measuring apparatus

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5117008Y1 (en) * 1970-12-29 1976-05-08
JPS5092169U (en) * 1973-12-25 1975-08-04
JPS53147877U (en) * 1977-04-26 1978-11-21
JPS5757331Y2 (en) * 1977-04-26 1982-12-09
JPS57130276U (en) * 1981-02-09 1982-08-13
JPS6140041A (en) * 1984-07-31 1986-02-26 Yokowo Mfg Co Ltd Inspection of electronic parts and device therefore
JPH0340940B2 (en) * 1984-07-31 1991-06-20
JPS6282739U (en) * 1985-11-12 1987-05-27
JPS63293845A (en) * 1987-05-27 1988-11-30 Hitachi Ltd Apparatus for inspecting semiconductor element
JP2012083234A (en) * 2010-10-13 2012-04-26 Hioki Ee Corp Probe and measuring apparatus

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