JPS4429151Y1 - - Google Patents
Info
- Publication number
- JPS4429151Y1 JPS4429151Y1 JP3166168U JP3166168U JPS4429151Y1 JP S4429151 Y1 JPS4429151 Y1 JP S4429151Y1 JP 3166168 U JP3166168 U JP 3166168U JP 3166168 U JP3166168 U JP 3166168U JP S4429151 Y1 JPS4429151 Y1 JP S4429151Y1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3166168U JPS4429151Y1 (de) | 1968-04-18 | 1968-04-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3166168U JPS4429151Y1 (de) | 1968-04-18 | 1968-04-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4429151Y1 true JPS4429151Y1 (de) | 1969-12-03 |
Family
ID=31766732
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3166168U Expired JPS4429151Y1 (de) | 1968-04-18 | 1968-04-18 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4429151Y1 (de) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6032756U (ja) * | 1983-08-12 | 1985-03-06 | 日本電子株式会社 | 電子線反射回折像観察装置 |
| WO2000016372A1 (fr) * | 1998-09-11 | 2000-03-23 | Japan Science And Technology Corporation | Appareil de diffraction d'electrons a haute energie |
-
1968
- 1968-04-18 JP JP3166168U patent/JPS4429151Y1/ja not_active Expired
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6032756U (ja) * | 1983-08-12 | 1985-03-06 | 日本電子株式会社 | 電子線反射回折像観察装置 |
| JPH037880Y2 (de) * | 1983-08-12 | 1991-02-27 | ||
| WO2000016372A1 (fr) * | 1998-09-11 | 2000-03-23 | Japan Science And Technology Corporation | Appareil de diffraction d'electrons a haute energie |
| US6677581B1 (en) | 1998-09-11 | 2004-01-13 | Japan Science And Technology Corporation | High energy electron diffraction apparatus |