JPS4324372Y1 - - Google Patents
Info
- Publication number
- JPS4324372Y1 JPS4324372Y1 JP562864U JP562864U JPS4324372Y1 JP S4324372 Y1 JPS4324372 Y1 JP S4324372Y1 JP 562864 U JP562864 U JP 562864U JP 562864 U JP562864 U JP 562864U JP S4324372 Y1 JPS4324372 Y1 JP S4324372Y1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP562864U JPS4324372Y1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1964-01-28 | 1964-01-28 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP562864U JPS4324372Y1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1964-01-28 | 1964-01-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS4324372Y1 true JPS4324372Y1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1968-10-14 |
Family
ID=31736308
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP562864U Expired JPS4324372Y1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1964-01-28 | 1964-01-28 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS4324372Y1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5582041A (en) * | 1978-11-16 | 1980-06-20 | Philips Corp | Article inspecting apparatus |
JP2006266941A (ja) * | 2005-03-24 | 2006-10-05 | Sekisui Chem Co Ltd | 導電性粒子の表面検査方法及び表面検査装置 |
-
1964
- 1964-01-28 JP JP562864U patent/JPS4324372Y1/ja not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5582041A (en) * | 1978-11-16 | 1980-06-20 | Philips Corp | Article inspecting apparatus |
JP2006266941A (ja) * | 2005-03-24 | 2006-10-05 | Sekisui Chem Co Ltd | 導電性粒子の表面検査方法及び表面検査装置 |