JPS409924B1 - - Google Patents

Info

Publication number
JPS409924B1
JPS409924B1 JP3872663A JP3872663A JPS409924B1 JP S409924 B1 JPS409924 B1 JP S409924B1 JP 3872663 A JP3872663 A JP 3872663A JP 3872663 A JP3872663 A JP 3872663A JP S409924 B1 JPS409924 B1 JP S409924B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3872663A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3872663A priority Critical patent/JPS409924B1/ja
Publication of JPS409924B1 publication Critical patent/JPS409924B1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2637Circuits therefor for testing other individual devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/041Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
JP3872663A 1962-07-17 1963-07-17 Pending JPS409924B1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3872663A JPS409924B1 (ja) 1962-07-17 1963-07-17

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DES0080435 1962-07-17
JP3872663A JPS409924B1 (ja) 1962-07-17 1963-07-17

Publications (1)

Publication Number Publication Date
JPS409924B1 true JPS409924B1 (ja) 1965-05-20

Family

ID=7508868

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3872663A Pending JPS409924B1 (ja) 1962-07-17 1963-07-17

Country Status (4)

Country Link
US (1) US3287637A (ja)
JP (1) JPS409924B1 (ja)
CH (1) CH399588A (ja)
GB (1) GB1040630A (ja)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3416078A (en) * 1965-07-08 1968-12-10 Motorola Inc Method of determining resistivity of a thin layer
US3381206A (en) * 1965-10-18 1968-04-30 Army Usa Method and apparatus for measurement of incremental resistances with capacitively coupled probe means
US3624496A (en) * 1969-12-31 1971-11-30 Nasa Method and apparatus for swept-frequency impedance measurements of welds
US3735253A (en) * 1971-09-23 1973-05-22 Aluminium Comp Method and means for measuring electrode resistance
US3974443A (en) * 1975-01-02 1976-08-10 International Business Machines Corporation Conductive line width and resistivity measuring system
US4024561A (en) * 1976-04-01 1977-05-17 International Business Machines Corporation Field effect transistor monitors
US4565966A (en) * 1983-03-07 1986-01-21 Kollmorgen Technologies Corporation Method and apparatus for testing of electrical interconnection networks
US4560924A (en) * 1983-07-22 1985-12-24 Magnetic Peripherals Inc. Flatness measuring apparatus
DE3505387A1 (de) * 1985-02-16 1986-08-28 W.C. Heraeus Gmbh, 6450 Hanau Sensor zur messung elektrischer eigenschaften im elektrischen feld
US5347226A (en) * 1992-11-16 1994-09-13 National Semiconductor Corporation Array spreading resistance probe (ASRP) method for profile extraction from semiconductor chips of cellular construction
CN104677953B (zh) * 2015-02-27 2018-01-30 山西潞安太阳能科技有限责任公司 一种快速检测黑心片的方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2351201A (en) * 1942-07-16 1944-06-13 Western Electric Co Method of and means for measuring
US2428700A (en) * 1943-09-17 1947-10-07 Wolgen Company Capacitative feed-back device for electrical testing
US2631188A (en) * 1949-10-06 1953-03-10 Gen Electric Electrical testing apparatus
US2752434A (en) * 1949-10-19 1956-06-26 Gen Electric Magneto-responsive device
US2766421A (en) * 1952-02-26 1956-10-09 Newmont Mining Corp Method and apparatus for geophysical exploration
US2966628A (en) * 1954-02-25 1960-12-27 Frieseke And Hoepfner G M B H System for measuring moisture content of paper or the like
US2802173A (en) * 1954-03-01 1957-08-06 Phillips Petroleum Co Core saturation distribution measurement and apparatus therefor
US2871446A (en) * 1955-01-28 1959-01-27 Continental Oil Co Wide-range resistance and resistivity measuring apparatus
US2934700A (en) * 1955-05-27 1960-04-26 Charles E Holaday Apparatus for determining the oil content of substances
US3031616A (en) * 1957-07-18 1962-04-24 Hummel Heinz Apparatus for analyzing gaseous or liquid mixtures
DE1089887B (de) * 1959-11-21 1960-09-29 Siemens Ag Verfahren und Einrichtung zur Bestimmung des elektrischen Widerstandes eines Koerpers aus einem extrem reinen Halbleitermaterial fuer elektronische Zwecke
FR1253531A (fr) * 1960-03-24 1961-02-10 Hoechst Ag Procédé et appareil pour mesurer les variations d'épaisseur de fils continus

Also Published As

Publication number Publication date
GB1040630A (en) 1966-09-01
CH399588A (de) 1965-09-30
US3287637A (en) 1966-11-22

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