JPH1144632A - Method for determining abnormality in data of particle-measuring device - Google Patents

Method for determining abnormality in data of particle-measuring device

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Publication number
JPH1144632A
JPH1144632A JP9201450A JP20145097A JPH1144632A JP H1144632 A JPH1144632 A JP H1144632A JP 9201450 A JP9201450 A JP 9201450A JP 20145097 A JP20145097 A JP 20145097A JP H1144632 A JPH1144632 A JP H1144632A
Authority
JP
Japan
Prior art keywords
deviation
degree
sample
particle
distribution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9201450A
Other languages
Japanese (ja)
Inventor
Yoshihiro Mishima
義博 三島
Kinya Uchihashi
欣也 内橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sysmex Corp
Original Assignee
Sysmex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sysmex Corp filed Critical Sysmex Corp
Priority to JP9201450A priority Critical patent/JPH1144632A/en
Publication of JPH1144632A publication Critical patent/JPH1144632A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To quantatively determine abnormality of a particle weighing device by supplying a reference specimen on a particle measuring device which is reference and an object, making a degree of deviation for the normal distribution of obtained frequency distribution a degree of reference deviation and a degree of comparison deviation, and comparing them with each other. SOLUTION: When valves 1, 2 are opened, sample liquid from a suction nozzle 3 is filled between the valves 1, 2. Next, the sample liquid between the valves 1, 2 is pushed from a sample nozzle 6 in a constant flow rate with a syringe 4, discharged to a flow cell 5, and when a valve 8 is opened, sheath liquid is supplied from a sheath liquid vessel 9 to the flow cell 5, the sample liquid is wrapped by the sheath liquid, and previously contained particles are arranged in one row to be flowed. A laser beam from a light source 17 to the sample liquid flow 26 of an orifice 11 is irradiated through a condenser lens 18, and low and high angle dispersion light is received on a photodiodes 21, 22 through a collector lens 20. An analysis part 23 compares a degree of deviation for normal distribution of frequency distribution obtained from the sample liquid with a degree of reference deviation.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は、粒子計測装置の
データ異常判定方法に関し、特に、粒子計測装置の各種
測定条件が安定に保たれているか否かを決定するため
に、粒子計測装置から得られる分布データの異常性を判
定する方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for judging data abnormality of a particle measuring device, and more particularly to a method for determining whether or not various measurement conditions of the particle measuring device are stably maintained. The present invention relates to a method for determining anomalies in distribution data obtained.

【0002】[0002]

【従来の技術と発明が解決しようとする課題】粒子計測
装置の計測結果は測定部の出力変動や汚れによって影響
を受ける上、試料を反応させる場合にはその反応部や試
薬などの変動によって影響を受ける。そこで、その測定
条件が正常に保たれているか否かを確認するために、予
め測定結果が分かっている標準試料を計測して精度管理
を行なうことが行なわれている。
2. Description of the Related Art The measurement results of a particle measuring device are affected by fluctuations in the output of a measuring section and contamination, and when a sample is reacted, the results are affected by fluctuations in the reaction section and reagents. Receive. Therefore, in order to confirm whether or not the measurement conditions are normally maintained, a precision measurement is performed by measuring a standard sample whose measurement result is known in advance.

【0003】しかし、血液や尿などの生体試料等の分析
には、目的とする粒子の個数の計数だけではなく、その
粒子の状態やそれ以外の粒子の出現をも調べる総合的な
粒度状態分析が望まれてきている。
However, in analyzing biological samples such as blood and urine, not only the counting of the number of target particles but also a comprehensive particle size analysis for examining the state of the particles and the appearance of other particles. Has been desired.

【0004】従って、精度管理も目的とする粒子の個数
やその粒子集団のピーク位置を判定するだけでは不十分
な場合がしばしば経験されてきた。この発明はこのよう
な事情を考慮してなされたもので、粒子計測装置の粒度
分布データの分布状態を精度よく判定する判定方法を提
供するものである。
[0004] Accordingly, it has often been experienced that the accuracy control is not sufficient only by determining the number of target particles or the peak position of the target particle population. The present invention has been made in view of such circumstances, and provides a determination method for accurately determining the distribution state of particle size distribution data of a particle measuring device.

【0005】[0005]

【課題を解決するための手段】この発明は、基準とする
粒子計測装置に標準試料を供給し、得られた度数分布の
正規分布に対する逸脱の度合を基準逸脱度として算出
し、対象とする粒子計測装置に標準試料を供給し、得ら
れた度数分布の正規分布に対する逸脱の度合を比較逸脱
度として算出し、基準逸脱度と比較逸脱度とを比較し、
その比較結果により、対象とする粒子計測装置から得ら
れた度数分布が異常であるか否かを判定する粒子計測装
置のデータ異常判定方法を提供するものである。
According to the present invention, a standard sample is supplied to a reference particle measuring apparatus, and the degree of deviation of the obtained frequency distribution from a normal distribution is calculated as a reference deviation degree, and the target particle is measured. The standard sample is supplied to the measuring device, the degree of deviation of the obtained frequency distribution from the normal distribution is calculated as a comparative deviation, and the standard deviation and the comparative deviation are compared.
An object of the present invention is to provide a data abnormality determination method for a particle measurement device that determines whether or not a frequency distribution obtained from a target particle measurement device is abnormal based on the comparison result.

【0006】[0006]

【発明の実施の形態】この発明における粒子計測装置と
は、液中に含まれる各粒子の特徴を表わすパラメータを
光学的又は電気的に検出してその度数分布や計数結果な
どを出力するものであり、これには、例えば、市販の血
球分析装置NEシリーズ(東亞医用電子株式会社製)や
SF−3000型(同社製)を適用することができる。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A particle measuring device according to the present invention is a device which optically or electrically detects a parameter representing a characteristic of each particle contained in a liquid and outputs a frequency distribution, a counting result, and the like. For example, a commercially available blood cell analyzer NE series (manufactured by Toa Medical Electronics Co., Ltd.) or SF-3000 (manufactured by the company) can be applied to this.

【0007】この発明における標準試料とは、目的とす
る粒子の管理項目が予め分かっている試料をいう。試料
を反応させるのでなければ標準試料としてラテックス等
の人工担体を用いることができる。また、試料を反応さ
せ試薬の状態をも管理する場合には、標準試料として測
定試料と同じ生体材料、例えば血液や尿を用いることが
好ましい。これには、その特性を保ちながら保存料や安
定性を向上させた試料、例えばSFチェックやUFチェ
ック(いずれも東亞医用電子株式会社製)も同様に用い
ることができる。
[0007] The standard sample in the present invention is a sample in which the control items of the target particles are known in advance. Unless the sample is reacted, an artificial carrier such as latex can be used as a standard sample. When the sample is reacted to control the state of the reagent, it is preferable to use the same biological material as the measurement sample, for example, blood or urine, as the standard sample. For this purpose, a sample in which preservatives and stability are improved while maintaining its properties, for example, SF check and UF check (both manufactured by Toa Medical Electronics Co., Ltd.) can be similarly used.

【0008】度数分布の正規分布に対する逸脱の度合い
とは、度数分布が正規分布からどの程度逸脱しているか
をみる統計量であり、次式(1),(2)で表わされる
歪度b1と尖度b2があげられる。歪度b1は分布の非
対称度を表し、尖度b2は、分布の裾の長さを表す指標
である。
The degree of deviation of the frequency distribution from the normal distribution is a statistic that indicates how much the frequency distribution deviates from the normal distribution. The degree of skewness b1 expressed by the following equations (1) and (2) is Kurtosis b2. The skewness b1 represents the degree of asymmetry of the distribution, and the kurtosis b2 is an index representing the length of the tail of the distribution.

【0009】[0009]

【数1】 (Equation 1)

【0010】この発明においては、度数分布の正規分布
に対する逸脱の度合いとして、歪度および尖度のいずれ
を用いてもよいが、歪度を用いると、その値の正負によ
って逸脱の方向性が決定されるので、好ましい。また、
この発明において、基準とする粒子計測装置と、対象と
する粒子計測装置とは、同一のものであってもよいが、
この場合には、基準とする粒子計測装置は、その光学系
や流体系が正常に較正,調整および清掃されたものであ
り、それを任意の期間使用したものが、対象とする粒子
計測装置に対応する。
In the present invention, either the skewness or the kurtosis may be used as the degree of deviation of the frequency distribution from the normal distribution, but if the skewness is used, the direction of the deviation is determined by the sign of the value. Is preferred. Also,
In the present invention, the reference particle measurement device and the target particle measurement device may be the same,
In this case, the reference particle measurement device is one whose optical system and fluid system have been normally calibrated, adjusted, and cleaned, and the one that has been used for an arbitrary period of time is used as the target particle measurement device. Corresponding.

【0011】さらに、基準とする粒子計測装置と、対象
とする粒子計測装置とは、必ずしも同一のものである必
要はなく、同一機種のものであってもよい。この場合に
は、一つの正常な粒子計測装置を基準の粒子計測装置と
し、他の粒子計測装置を対象とする粒子計測装置とする
ことができる。
Further, the reference particle measuring device and the target particle measuring device are not necessarily the same, and may be of the same model. In this case, one normal particle measurement device can be used as a reference particle measurement device, and another particle measurement device can be used as a target particle measurement device.

【0012】なお、この発明においては、通常の粒子計
測装置から得られる度数分布データからその度数分布の
正規分布に対する逸脱の度合いを算出して比較する演算
作業が必要とされるが、この演算作業は例えば、別途に
設けたパーソナルコンピュータで行ってもよいし、この
演算作業を行う機能を予め粒子計測装置自体に備えるよ
うにしてもよい。
In the present invention, an operation for calculating and comparing the degree of deviation of the frequency distribution from the normal distribution from the frequency distribution data obtained from a normal particle measuring device is required. For example, the measurement may be performed by a personal computer provided separately, or a function of performing the calculation may be provided in advance in the particle measuring device itself.

【0013】実施例 以下、図面に示す実施形態に基づいてこの発明を詳述す
る。なお、これによってこの発明が限定されるものでは
ない。
The present invention will be described below in detail based on an embodiment shown in the drawings. Note that the present invention is not limited to this.

【0014】図1はこの発明によるデータ異常判定機能
を備えた粒子計測装置の要部構成を示す説明図であり、
1および2は弁、3は前処理部3aにおいて希釈、染色
などの前処理がなされた試料液を吸引する吸引ノズル、
4はシリンジ、5はフローセル、6は試料ノズル、8は
弁、9はシース液容器、10はシース液をフローセル5
に供給する供給口、26は試料ノズル6から出力される
試料液、11はフローセル5に設けられた細孔であり、
オリフィス状のものを含む(以後、オリフィスと称して
説明する)。
FIG. 1 is an explanatory diagram showing a main configuration of a particle measuring apparatus having a data abnormality determining function according to the present invention.
1 and 2 are valves, 3 is a suction nozzle for sucking a sample liquid which has been subjected to pretreatment such as dilution and staining in the pretreatment unit 3a,
Reference numeral 4 denotes a syringe, 5 denotes a flow cell, 6 denotes a sample nozzle, 8 denotes a valve, 9 denotes a sheath liquid container, and 10 denotes a sheath liquid.
, A sample liquid output from the sample nozzle 6, a pore 11 provided in the flow cell 5,
Including orifices (hereinafter referred to as orifices).

【0015】また、17は半導体レーザ光源(波長:6
50nm)、18はコンデンサーレンズ、19はビームス
トッパ、20はコレクターレンズ、21は1〜6度の低
角度散乱光を検出するホトダイオード,22は8〜20
度の高角度散乱光を検出するホトダイオード,23はホ
トダイオード21,22の出力信号を受けて分析を行う
分析部である。
Reference numeral 17 denotes a semiconductor laser light source (wavelength: 6).
50 nm), 18 is a condenser lens, 19 is a beam stopper, 20 is a collector lens, 21 is a photodiode for detecting low-angle scattered light of 1 to 6 degrees, and 22 is 8 to 20
A photodiode 23 for detecting high-angle scattered light is an analysis unit for receiving and analyzing the output signals of the photodiodes 21 and 22.

【0016】このような構成において、まず、弁1、2
を所定時間開けると、陰圧により吸引ノズル3から試料
液が弁1、2の間に満たされる。
In such a configuration, first, the valves 1, 2
Is opened for a predetermined time, the sample liquid is filled between the valves 1 and 2 from the suction nozzle 3 by the negative pressure.

【0017】次に、シリンジ4が一定流量で弁1、2間
の試料液を試料ノズル6へ押し出すことにより、試料ノ
ズル6から試料液がフローセル5に吐出される。それと
同時に弁8を開けることによりフローセル5にシース液
が供給される。
Next, the syringe 4 pushes the sample liquid between the valves 1 and 2 to the sample nozzle 6 at a constant flow rate, so that the sample liquid is discharged from the sample nozzle 6 to the flow cell 5. At the same time, the sheath liquid is supplied to the flow cell 5 by opening the valve 8.

【0018】これによって試料液はシース液に包まれ、
さらにオリフィス11によって細く絞られてシースフロ
ーを形成する。
Thus, the sample solution is wrapped in the sheath solution,
Further, the sheath flow is narrowed down by the orifice 11.

【0019】このようにシースフローを形成することに
よって試料液に予め含まれた粒子を一個ずつオリフィス
11を介して一列に整列して流すことができる。
By forming the sheath flow in this manner, particles contained in the sample solution in advance can be flowed in a line through the orifice 11 one by one.

【0020】一方、オリフィス11を流れる試料液流2
6へ光源17から発振したレーザ光がコンデンサーレン
ズ18で絞られて照射される。
On the other hand, the sample liquid flow 2 flowing through the orifice 11
The laser light oscillated from the light source 17 is squeezed by the condenser lens 18 and emitted to 6.

【0021】試料液中の粒子に当たらずそのままフロー
セル5を透過したレーザ光はビームストッパ19で遮光
される。レーザ光をうけた粒子から発せられる低角度散
乱光及び高角度散乱光はコレクターレンズ20により集
光され、それぞれホトダイオード21,22により受光
される。
The laser beam that has passed through the flow cell 5 as it is without hitting particles in the sample liquid is shielded by the beam stopper 19. The low-angle scattered light and the high-angle scattered light emitted from the particles that have received the laser light are collected by the collector lens 20 and received by the photodiodes 21 and 22, respectively.

【0022】図2は、分析部23の構成を示すブロック
図である。図2において、61は各種の数値や領域など
の条件を予め設定するためのデータの入力部であり、例
えば、キーボードやマウスにより構成される。
FIG. 2 is a block diagram showing the configuration of the analysis unit 23. In FIG. 2, reference numeral 61 denotes a data input unit for setting conditions such as various numerical values and regions in advance, and includes, for example, a keyboard and a mouse.

【0023】また、61aは設定された各種条件を格納
する設定条件格納部、47はホトダイオート21,22
の出力信号から得られるパラメータ情報を格納するデー
タ格納部である。62はデータ格納部47に格納された
パラメータ情報に基づいて分布図、つまり高角度散乱光
強度と低角度散乱光強度についてのスキャッタグラムを
作成する分布図作成部、63は分布図作成部62で作成
された分布図から座標や領域を抽出する抽出部である。
Reference numeral 61a denotes a set condition storage unit for storing various set conditions, and reference numeral 47 denotes a photo die auto 21 and 22.
Is a data storage unit for storing parameter information obtained from the output signal of the first embodiment. Reference numeral 62 denotes a distribution map creating unit for creating a scattergram based on the parameter information stored in the data storage unit 47, that is, a scattergram of the high-angle scattered light intensity and the low-angle scattered light intensity. An extraction unit that extracts coordinates and regions from the created distribution map.

【0024】64は分布図作成部62で作成される分布
図において各粒子の分画領域を決定する分画領域決定
部、65は分画領域内の粒子数の計数や各分画領域内に
おける度数分布の正規分布に対する逸脱度などの各種の
演算を行う演算部、66は分画や演算の結果に異常を検
出すると警告を発する警告部、67は決定された分画領
域に存在する粒子の種類を判定する判定部である。そし
て、演算部65の演算結果および警告部66の発する警
告は分布図作成部62で作成された分布図と同様に表示
部49に表示される。また、分析部23はパーソナルコ
ンピュータで構成できる。
Reference numeral 64 denotes a fractionation region determining unit that determines the fractionation region of each particle in the distribution map created by the distribution diagram creation unit 62, and 65 denotes the number of particles in the fractionation region and the number of particles in each fractionation region. An operation unit that performs various calculations such as a deviation degree of the frequency distribution from the normal distribution, 66 is a warning unit that issues a warning when an abnormality is detected in the result of the fractionation or the calculation, and 67 is a warning unit that detects particles existing in the determined fractionation region. This is a determination unit for determining the type. The calculation result of the calculation unit 65 and the warning issued by the warning unit 66 are displayed on the display unit 49 in the same manner as the distribution chart created by the distribution map creation unit 62. Further, the analysis unit 23 can be constituted by a personal computer.

【0025】入力部61において、「赤血球測定モー
ド」,「ヘモグロビン測定モード」,「白血球測定モー
ド」,「異常判定モード」などの各種モードの中から所
望のモードが設定されると、前処理部3aは、設定モー
ドに対応して血液試料に希釈,染色などの前処理を施し
て試料液を作製する。分析部23は作製された試料液か
ら得られるパラメータ情報つまり高角度および低角度散
乱光強度に基づいて、2次元分布図を作成し分画結果と
共に表示部49に表示し、さらに演算部65で演算した
数値データを表示部49に表示する。
In the input section 61, when a desired mode is set from various modes such as "red blood cell measurement mode", "hemoglobin measurement mode", "white blood cell measurement mode", and "abnormality determination mode", a preprocessing section is set. 3a prepares a sample liquid by performing a pretreatment such as dilution and staining on a blood sample in accordance with the setting mode. The analysis unit 23 creates a two-dimensional distribution map based on the parameter information obtained from the prepared sample solution, that is, the high-angle and low-angle scattered light intensities, and displays the two-dimensional distribution map on the display unit 49 together with the fractionation results. The calculated numerical data is displayed on the display unit 49.

【0026】ここで、「異常判定モード」について、実
測例を用いてさらに詳述する。入力部61において「異
常測定モード」を設定すると、前処理部3aは、標準試
料33μLを0.967mLの白血球分類用試薬1で希
釈し、それに0.2mLの白血球分類用試薬2を加えて
試料液を作成する。
Here, the "abnormality determination mode" will be described in more detail using an actual measurement example. When the “abnormal measurement mode” is set in the input unit 61, the preprocessing unit 3a dilutes 33 μL of the standard sample with 0.967 mL of the leukocyte classification reagent 1 and adds 0.2 mL of the leukocyte classification reagent 2 thereto. Make a liquid.

【0027】ここで、標準試料には、SFチェック(東
亞医用電子株式会社製)を用い、白血球分類用試薬1,
2には、それぞれストマトライザーFD(I)とストマ
トライザーFD(II)を用いた。なお、ストマトライザ
ーFD(I)は、好酸球のみを染色すると共に白血球の
形態を安定させるために用いられ、ストマトライザFD
(II)は、赤血球の溶血のために用いられる。
Here, SF check (manufactured by Toa Medical Electronics Co., Ltd.) was used as a standard sample, and reagents 1 and 2 for leukocyte classification were used.
For Structural No. 2, a stoma riser FD (I) and a stoma riser FD (II) were used. The stoma riser FD (I) is used for staining only eosinophils and stabilizing the form of leukocytes.
(II) is used for hemolysis of red blood cells.

【0028】分析部23は上記の反応をさせた試料液か
ら得られる高角度散乱光強度(IH)と低角度散乱光強
度(IL)とについて図3に示すように2次元分布図を
作成する。リンパ球領域L,単球領域M,好中球および
好塩基球領域N、好酸球領域Eとゴースト領域Gに分画
し、ゴースト領域以外の各領域の粒子数およびその総和
である白血球数を表示する。上記のいずれにも分画され
ない粒子が所定以上であればその出現位置に応じて、そ
の異常細胞の出現を報知する。
The analyzing unit 23 creates a two-dimensional distribution diagram as shown in FIG. 3 for the high-angle scattered light intensity (IH) and the low-angle scattered light intensity (IL) obtained from the sample solution reacted as described above. . Lymphocyte region L, monocyte region M, neutrophil and basophil region N, eosinophil region E and ghost region G, and the number of particles in each region other than the ghost region and the total number of leukocytes Is displayed. If the number of particles not fractionated by any of the above is equal to or more than a predetermined value, the appearance of the abnormal cell is reported according to the appearance position.

【0029】図4は正常な粒度分布の例で、図5はその
機器が微妙に光学的にずれた場合の粒度分布の例であ
る。分画領域Nの粒子数NS,ピーク座標(Xp,Y
p),Y軸方向での分布幅をYw、Y軸方向での歪度を
b1として演算結果を表示する。
FIG. 4 shows an example of a normal particle size distribution, and FIG. 5 shows an example of a particle size distribution when the device is slightly shifted optically. The number of particles NS and the peak coordinates (Xp, Y
p), the calculation result is displayed with the distribution width in the Y-axis direction as Yw and the skewness in the Y-axis direction as b1.

【0030】図4と図5とで分画領域Nを比較すると、
粒子数NSは2936と2923と差がなく、ピーク座標(X
p,Yp)も(195、185)と(193、188)と差がみられ
ない。さらに分布幅Ywも35と36と差がなく、両者
には差がないように見えるが、歪度b1をみると+0.10
と−0.13と正負が入れ替わるほどの大きな差がみられ
る。すなわち、正常な状態(図4)では分画領域Nは上
方向に広がりを持つ分布であったが、図5では下方向に
広がりを持つ分布になっている。そのため、正常細胞領
域(図3の各領域L,M,N,E)以外にまで正常細胞
の分布が伸びることが起こりうる。その場合、正常細胞
を異常細胞と認識して、誤った結果をだしてしまう。特
に、この実施例のように正常な状態が正規分布ではなく
片方に裾広がりしている場合にも歪度を使うと精度良く
監視できる。
When comparing the fractionation area N between FIG. 4 and FIG.
The number of particles NS does not differ from 2936 and 2923, and the peak coordinates (X
(p, Yp) also shows no difference between (195, 185) and (193, 188). Further, the distribution width Yw does not differ from 35 and 36, and it seems that there is no difference between them. However, the skewness b1 is +0.10.
There is a large difference between -0.13 and -0.13. In other words, in the normal state (FIG. 4), the distribution of the fractionation area N has an upward spread, but in FIG. 5, the distribution has a downward spread. Therefore, the distribution of normal cells may extend to areas other than the normal cell area (each area L, M, N, and E in FIG. 3). In that case, the normal cell is recognized as an abnormal cell and an incorrect result is obtained. In particular, even when the normal state is not normal distribution but spreads to one side as in this embodiment, it is possible to monitor with high accuracy by using the skewness.

【0031】[0031]

【発明の効果】この発明によれば、粒子計測装置におい
て得られる度数分布から、粒子計測装置の異常を定量的
に判定することができ、そのメンテナンス時期を適格に
知ることが可能になる。
According to the present invention, it is possible to quantitatively determine the abnormality of the particle measuring device from the frequency distribution obtained by the particle measuring device, and to appropriately know the maintenance time.

【図面の簡単な説明】[Brief description of the drawings]

【図1】実施例の粒子計測装置の構成説明図である。FIG. 1 is an explanatory diagram of a configuration of a particle measuring device according to an embodiment.

【図2】実施例の粒子計測装置の要部のブロック図であ
る。
FIG. 2 is a block diagram of a main part of the particle measuring device according to the embodiment.

【図3】実施例の表示例を示す説明図である。FIG. 3 is an explanatory diagram illustrating a display example of an embodiment.

【図4】実施例の表示例を示す説明図である。FIG. 4 is an explanatory diagram showing a display example of the embodiment.

【図5】実施例の表示例を示す説明図である。FIG. 5 is an explanatory diagram showing a display example of the embodiment.

【符号の説明】[Explanation of symbols]

1 弁 2 弁 3 吸引ノズル 4 シリンジ 5 フローセル 6 試料ノズル 7a 第1セル 7b 第2セル 8 弁 9 シース液容器 10 供給口 11 オリフィス 14 排液口 17 光源 18 コンデンサーレンズ 19 ビームストッパ 20 コレクターレンズ 21 ホトダイオード 22 ホトダイオード 23 分析部 Reference Signs List 1 valve 2 valve 3 suction nozzle 4 syringe 5 flow cell 6 sample nozzle 7a first cell 7b second cell 8 valve 9 sheath liquid container 10 supply port 11 orifice 14 drain port 17 light source 18 condenser lens 19 beam stopper 20 collector lens 21 photodiode 22 Photodiode 23 Analyzer

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 基準とする粒子計測装置に標準試料を供
給し、得られた度数分布の正規分布に対する逸脱の度合
を基準逸脱度として算出し、 対象とする粒子計測装置に標準試料を供給し、得られた
度数分布の正規分布に対する逸脱の度合を比較逸脱度と
して算出し、 基準逸脱度と比較逸脱度とを比較し、その比較結果によ
り、対象とする粒子計測装置から得られた度数分布が異
常であるか否かを判定する粒子計測装置のデータ異常判
定方法。
1. A standard sample is supplied to a reference particle measuring device, a degree of deviation of the obtained frequency distribution from a normal distribution is calculated as a reference deviation, and the standard sample is supplied to a target particle measuring device. , The degree of deviation of the obtained frequency distribution from the normal distribution is calculated as a comparative deviation, and the standard deviation and the comparative deviation are compared. Based on the comparison result, the frequency distribution obtained from the target particle measurement device is calculated. A data abnormality determination method for a particle measurement device that determines whether or not the data is abnormal.
【請求項2】 基準および比較逸脱度が歪度である請求
項1記載の粒子計測装置のデータ異常判定方法。
2. The method according to claim 1, wherein the criterion and the comparative deviation are skewness.
【請求項3】 基準および比較逸脱度が尖度である請求
項1記載の粒子計測装置のデータ異常判定方法。
3. The method according to claim 1, wherein the reference and the relative deviation are kurtosis.
【請求項4】 基準とする粒子計測装置と、対象とする
粒子計測装置とは、機種が同一である請求項1記載の粒
子計測装置のデータ異常判定方法。
4. The data abnormality determination method for a particle measurement device according to claim 1, wherein the reference particle measurement device and the target particle measurement device have the same model.
JP9201450A 1997-07-28 1997-07-28 Method for determining abnormality in data of particle-measuring device Pending JPH1144632A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9201450A JPH1144632A (en) 1997-07-28 1997-07-28 Method for determining abnormality in data of particle-measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9201450A JPH1144632A (en) 1997-07-28 1997-07-28 Method for determining abnormality in data of particle-measuring device

Publications (1)

Publication Number Publication Date
JPH1144632A true JPH1144632A (en) 1999-02-16

Family

ID=16441297

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9201450A Pending JPH1144632A (en) 1997-07-28 1997-07-28 Method for determining abnormality in data of particle-measuring device

Country Status (1)

Country Link
JP (1) JPH1144632A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006162524A (en) * 2004-12-09 2006-06-22 Sysmex Corp Standard solution for particle image analyzer
JP2014062917A (en) * 2013-12-25 2014-04-10 Sysmex Corp Specimen examination device and examination information output method
JP2014106161A (en) * 2012-11-28 2014-06-09 Horiba Ltd Display device and method of scattergram as to blood cell and blood analyzer having display device
JP2016502078A (en) * 2012-11-16 2016-01-21 ベックマン コールター, インコーポレイテッド Evaluation system and method for data classification result of flow cytometry

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004214306A (en) * 2002-12-27 2004-07-29 Okano Electric Wire Co Ltd Manufacturing method of thermoelectric conversion module
WO2007029696A1 (en) * 2005-09-05 2007-03-15 Chisso Corporation Electron transporting material and organic electroluminescent device using the same
JP2008150365A (en) * 2006-11-20 2008-07-03 Chisso Corp Electron transport material and organic electroluminescent device using the same
JP2008214307A (en) * 2007-03-07 2008-09-18 Chisso Corp Electron transport material and organic electroluminescent element using the same
JP2008247895A (en) * 2007-03-07 2008-10-16 Chisso Corp Electron transport material and organic electroluminescent element using the same
JP2008543086A (en) * 2005-05-31 2008-11-27 ユニバーサル ディスプレイ コーポレイション Triphenylene host in phosphorescent light-emitting diodes
JP2010535806A (en) * 2007-08-08 2010-11-25 ユニバーサル ディスプレイ コーポレイション Single triphenylene chromophore in phosphorescent light-emitting diodes
WO2011057461A1 (en) * 2009-11-13 2011-05-19 北京维信诺科技有限公司 Organic materials and organic electroluminescent apparatuses using the same
CN102532105A (en) * 2010-12-17 2012-07-04 清华大学 Triphenylene compound containing pyridine group and application thereof
JP2013048192A (en) * 2011-08-29 2013-03-07 Konica Minolta Holdings Inc Organic electroluminescent element, lighting device, and display device
JP5453621B2 (en) * 2011-02-23 2014-03-26 保土谷化学工業株式会社 Compound having substituted triphenylene ring structure and organic electroluminescence device

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004214306A (en) * 2002-12-27 2004-07-29 Okano Electric Wire Co Ltd Manufacturing method of thermoelectric conversion module
JP2008543086A (en) * 2005-05-31 2008-11-27 ユニバーサル ディスプレイ コーポレイション Triphenylene host in phosphorescent light-emitting diodes
WO2007029696A1 (en) * 2005-09-05 2007-03-15 Chisso Corporation Electron transporting material and organic electroluminescent device using the same
JP2008150365A (en) * 2006-11-20 2008-07-03 Chisso Corp Electron transport material and organic electroluminescent device using the same
JP2008214307A (en) * 2007-03-07 2008-09-18 Chisso Corp Electron transport material and organic electroluminescent element using the same
JP2008247895A (en) * 2007-03-07 2008-10-16 Chisso Corp Electron transport material and organic electroluminescent element using the same
JP2010535806A (en) * 2007-08-08 2010-11-25 ユニバーサル ディスプレイ コーポレイション Single triphenylene chromophore in phosphorescent light-emitting diodes
WO2011057461A1 (en) * 2009-11-13 2011-05-19 北京维信诺科技有限公司 Organic materials and organic electroluminescent apparatuses using the same
CN102532105A (en) * 2010-12-17 2012-07-04 清华大学 Triphenylene compound containing pyridine group and application thereof
JP5453621B2 (en) * 2011-02-23 2014-03-26 保土谷化学工業株式会社 Compound having substituted triphenylene ring structure and organic electroluminescence device
JP5861843B2 (en) * 2011-02-23 2016-02-16 保土谷化学工業株式会社 Compound having substituted triphenylene ring structure and organic electroluminescence device
JP2013048192A (en) * 2011-08-29 2013-03-07 Konica Minolta Holdings Inc Organic electroluminescent element, lighting device, and display device

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
JPN6013017756; 日本化学会講演予稿集 Vol.91st, No.3, 2011, p.820(1 D4-44, 1 D4-46) *
JPN6013017758; 日本化学会講演予稿集 Vol.92nd, No.4, 20120309, p.1626(2 PA-053) *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006162524A (en) * 2004-12-09 2006-06-22 Sysmex Corp Standard solution for particle image analyzer
JP4744132B2 (en) * 2004-12-09 2011-08-10 シスメックス株式会社 Display value creation method for standard solution for particle image analyzer
JP2016502078A (en) * 2012-11-16 2016-01-21 ベックマン コールター, インコーポレイテッド Evaluation system and method for data classification result of flow cytometry
JP2014106161A (en) * 2012-11-28 2014-06-09 Horiba Ltd Display device and method of scattergram as to blood cell and blood analyzer having display device
JP2014062917A (en) * 2013-12-25 2014-04-10 Sysmex Corp Specimen examination device and examination information output method

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