JPH1073580A - Ion exchange column - Google Patents

Ion exchange column

Info

Publication number
JPH1073580A
JPH1073580A JP8230661A JP23066196A JPH1073580A JP H1073580 A JPH1073580 A JP H1073580A JP 8230661 A JP8230661 A JP 8230661A JP 23066196 A JP23066196 A JP 23066196A JP H1073580 A JPH1073580 A JP H1073580A
Authority
JP
Japan
Prior art keywords
ion exchange
group
ion
holding part
exchange column
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8230661A
Other languages
Japanese (ja)
Inventor
Masanao Shiyouji
雅直 少路
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP8230661A priority Critical patent/JPH1073580A/en
Publication of JPH1073580A publication Critical patent/JPH1073580A/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

PROBLEM TO BE SOLVED: To perform ion exchange having the adequate amount of solvent without preliminary experiment by supporting the ion exchange part of the ion exchange column having the ion exchange part on the inner wall surface of a capillary tube with a holding part, wherein the ion exchange group of the inner wall surface comprises a semiconductor. SOLUTION: An ion exchange part 12a, which is applied on the inner surface of a tube 11, is constituted of a holding part 14 comprising a semiconductor layer and an ion exchange group 16 held by the holding part 14. As the material of the semiconductor used in the holding part 14, e.g. a polyacetyl group is used. For the ion exchange group 16, which is applied on the surface of the holding part 14, a sulfone group or the like is used. An electric circuit 15 measures the electric conductivity between two points, which are provided on the holding part 14 separated by a specified distance. For the connection of the electric circuit 15 and the ion exchange part 12a, a part of the ion exchange group 16 in the vicinities of both ends of the ion exchange part 12 is peeled and removed beforehand, and the terminal of the electric circuit 15 is connected to the holding part 14 of the semiconductor.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明はイオン交換カラムに
関する。
[0001] The present invention relates to an ion exchange column.

【0002】[0002]

【従来の技術】特定の被測定液体中からイオンを取り出
し、イオン分析を行うためにイオン交換カラムが用いら
れている。従来のイオン交換カラムの構成を図1に示
す。
2. Description of the Related Art An ion exchange column is used for extracting ions from a specific liquid to be measured and performing ion analysis. FIG. 1 shows the configuration of a conventional ion exchange column.

【0003】1はチューブ内にイオン交換樹脂が充填さ
れたイオン交換カラムで、1aはイオン交換カラム1の
入口、1bはイオン交換カラムの出口である。イオン交
換カラム1内に充填されたイオン交換樹脂2の1つ1つ
は、図1に示した拡大断面図に見られるように珪藻土な
どからなる担体2bの表面にイオン交換部2aが形成さ
れたものからなる。イオン交換部2aとしては、アミノ
基、スルホン酸基を表面に有する物質が一般的であり、
それぞれ陰イオン、陽イオンを吸着する。イオン交換カ
ラム1を通過する試料とイオン交換部2aとの接触の機
会を増やすために、イオン交換部2aは粒状の担体2b
の表面に形成している。3a、3bは液体採集用の受け
皿となるビーカーである。
[0003] Reference numeral 1 denotes an ion exchange column in which a tube is filled with an ion exchange resin, 1a denotes an inlet of the ion exchange column 1, and 1b denotes an outlet of the ion exchange column. Each of the ion-exchange resins 2 packed in the ion-exchange column 1 has an ion-exchange portion 2a formed on the surface of a carrier 2b made of diatomaceous earth or the like as seen in the enlarged sectional view shown in FIG. Consist of things. As the ion exchange part 2a, a substance having an amino group and a sulfonic acid group on the surface is generally used.
Adsorb anions and cations respectively. In order to increase the chance of contact between the sample passing through the ion exchange column 1 and the ion exchange section 2a, the ion exchange section 2a is
Formed on the surface. Reference numerals 3a and 3b denote beakers serving as saucers for collecting liquid.

【0004】分析者は試料を入口1aより注ぐ。試料中
の目的となるイオンは、あらかじめ選定されたイオン交
換樹脂2中(たとえば陰イオンのときはアミノ基、陽イ
オンのときはスルホン基が選定される)のイオン交換部
2aに捕捉され、その他の成分は試料の溶媒と共に、出
口1bの下部に固定されたビーカー3aに溜る。
An analyst pours a sample through the inlet 1a. The target ions in the sample are captured by the ion exchange part 2a in the ion exchange resin 2 selected in advance (for example, an amino group is selected for an anion and a sulfone group is selected for a cation). Together with the solvent of the sample accumulates in the beaker 3a fixed below the outlet 1b.

【0005】次に目的となるイオンをイオン交換部2a
から分離するために,イオンを剥離する溶媒を入口1a
より注ぐ。新たに用意したビーカー3bに目的となるイ
オンを含んだ溶媒を得ることが出来る。
[0005] Next, the target ions are transferred to the ion exchange section 2a.
To separate ions from the inlet 1a
Pour more. A solvent containing a target ion can be obtained in a newly prepared beaker 3b.

【0006】[0006]

【発明が解決しようとする課題】従来技術に於いては、
イオン交換基からイオンが充分に分離したかどうかは、
イオン分離の際に流す溶媒の量によって決定される。流
す溶媒の量が少ないと、イオン交換基にイオンが残留
し、流す溶媒の量が多いと、不経済であり、またビーカ
ー3b内の目的とするイオンの濃度が低くなり、後の分
析の障害となる。よって溶媒を、例えば10ml、20
ml、40ml流してその時にビーカー3b内のイオン
量を分析し、図2の様に横軸が流した溶媒の量、縦軸が
溶媒中に存在するイオン量としたグラフを作成し、目的
となるイオンをイオン交換部2aから充分に剥離するこ
との出来る溶媒量を把握する、という予備実験が必要で
あった。そのため手間がかかり、予備実験のための溶媒
も必要であった。本発明は、予備実験の必要の無いイオ
ン交換カラムを提供することを目的とする。
SUMMARY OF THE INVENTION In the prior art,
Whether the ions have been sufficiently separated from the ion exchange groups
It is determined by the amount of the solvent flowing at the time of ion separation. When the amount of the flowing solvent is small, ions remain in the ion exchange group, and when the amount of the flowing solvent is large, it is uneconomical, and the concentration of the target ion in the beaker 3b becomes low, which hinders the subsequent analysis. Becomes Therefore, the solvent is, for example, 10 ml, 20
The amount of ions in the beaker 3b was analyzed at that time by flowing 40 ml and 40 ml, and as shown in FIG. 2, a graph was prepared in which the horizontal axis represents the amount of flowing solvent and the vertical axis represents the amount of ions existing in the solvent. Preliminary experiments were needed to determine the amount of solvent that could sufficiently separate the ions from the ion exchange section 2a. Therefore, it was troublesome and required a solvent for preliminary experiments. An object of the present invention is to provide an ion exchange column that does not require a preliminary experiment.

【0007】[0007]

【課題を解決するための手段】上記問題を解決するため
になされた本発明のイオン交換カラムは、キャピラリチ
ューブ内壁面にイオン交換部を有するイオン交換カラム
であって、前記イオン交換部は内壁表面のイオン交換基
が半導体からなる保持部に保持されたことを特徴とする
An ion exchange column according to the present invention, which has been made to solve the above problem, is an ion exchange column having an ion exchange portion on the inner wall surface of a capillary tube, wherein the ion exchange portion is provided on the inner wall surface. Characterized in that the ion-exchange groups are held by a holding portion made of a semiconductor.

【0008】[0008]

【発明の実施の形態】本発明に係るイオン交換カラムで
は、イオン交換基を保持する保持部が半導体層からな
る。イオン交換基にイオンが捕捉されたときのこの半導
体層の電気伝導度とイオンが捕捉されていないときの保
持部の半導体層の電気伝導度とが異なることから、この
電気伝導度を測定することにより、イオン交換基にイオ
ンが捕捉されているか否かを判断することができる。
BEST MODE FOR CARRYING OUT THE INVENTION In an ion exchange column according to the present invention, a holding portion for holding an ion exchange group comprises a semiconductor layer. Since the electric conductivity of this semiconductor layer when ions are trapped by the ion exchange group is different from the electric conductivity of the semiconductor layer of the holding portion when ions are not trapped, this electric conductivity must be measured. Thereby, it can be determined whether or not ions are captured by the ion exchange groups.

【0009】以下、本発明を実施例を用いて説明する。
図3に本発明の一実施例であるイオン交換カラムの構成
を示す。10は本発明によるイオン交換カラムであり、
11はガラスにより形成されるチューブ、12aはチュ
ーブ11の内壁に塗布されたイオン交換部、10aはイ
オン交換カラム10の入口、10bはイオン交換カラム
10の出口、13a,13bは受け皿となるビーカーで
ある。チューブ11の内側表面に塗布されるイオン交換
部12aは、半導体層からなる保持部14と保持部によ
り保持されるイオン交換基16とから構成される。保持
部14に用いられる半導体の材料としては、たとえば図
3の拡大部分に示すようにポリアセチル基が用いられ
る。保持部14の表面に塗布されるイオン交換基16と
しては従来例と同じくスルホン基などが用いられる。
Hereinafter, the present invention will be described with reference to examples.
FIG. 3 shows the configuration of an ion exchange column according to one embodiment of the present invention. 10 is an ion exchange column according to the present invention,
Reference numeral 11 denotes a tube formed of glass, 12a denotes an ion exchange section applied to the inner wall of the tube 11, 10a denotes an inlet of the ion exchange column 10, 10b denotes an outlet of the ion exchange column 10, and 13a and 13b denote beakers serving as trays. is there. The ion exchange section 12a applied to the inner surface of the tube 11 includes a holding section 14 made of a semiconductor layer and an ion exchange group 16 held by the holding section. As a semiconductor material used for the holding portion 14, for example, a polyacetyl group is used as shown in an enlarged portion of FIG. As the ion exchange group 16 applied to the surface of the holding section 14, a sulfone group or the like is used as in the conventional example.

【0010】15は保持部14の電気伝導度を測定する
ための電気回路で、保持部14に一定距離を離れて設け
られたの2点間の電気伝導度を測定するための電気回路
である。具体的には電源と抵抗とが直列接続され、この
抵抗両端の電圧を測定することにより、測定電圧から電
気伝導度が得られるようにしてある。電気回路15とイ
オン交換部12aとの接続は、あらかじめイオン交換部
12aの両端近傍の一部のイオン交換基16を剥離除去
して半導体の保持部14に電気回路の端子を接続するよ
うにする。イオン交換カラム10のチューブ11のガラ
ス表面に保持部14と電気的に接続する金属電極を形成
しておいて、これに電気回路を接続するようにしてもよ
い。
Reference numeral 15 denotes an electric circuit for measuring the electric conductivity of the holding section 14, which is provided at a predetermined distance from the holding section 14 and for measuring the electric conductivity between two points. . Specifically, a power supply and a resistor are connected in series, and by measuring the voltage across the resistor, the electrical conductivity can be obtained from the measured voltage. The connection between the electric circuit 15 and the ion exchange unit 12a is such that some of the ion exchange groups 16 near both ends of the ion exchange unit 12a are peeled off in advance and the terminals of the electric circuit are connected to the semiconductor holding unit 14. . A metal electrode electrically connected to the holding unit 14 may be formed on the glass surface of the tube 11 of the ion exchange column 10, and an electric circuit may be connected to the metal electrode.

【0011】分析者はあらかじめ保持部14の電気抵抗
(電気伝導度の逆数)を電気回路15により測定する。
その時の値をX1 Ωとする。次に試料を入口10aより
注ぐ。試料中の目的となるイオンは、あらかじめ選定さ
れたイオン交換基16に捕捉され、その他の成分は試料
の溶媒と共に、出口10bの下部に固定されたビーカー
13aに溜る。その際には、イオン交換基と試料中の目
的となるイオンの結合が保持部14の伝導帯電子に影響
を及ぼし、その結果として、保持部14の電気伝導度が
変化する。この時の電気抵抗値をX2 Ωとする。次に目
的となるイオンをイオン交換基16から分離するため
に,イオンを剥離する溶媒を入口10aより注ぎ、新た
に用意したビーカー13bに目的となるイオンを含んだ
溶媒を得る。その際には電気回路15より検出される保
持部14の電気抵抗値X3 Ωを連続的に計測しながら溶
媒を注ぎ、X3 がX2 に対してX1 Ωに充分近くなった
時点で、目的となるイオンは、その大部分がイオン交換
部より剥離された、と考えることが出来るので溶媒の注
入を終了する。本発明の実施態様を以下にまとめる。キ
ャピラリチューブ内壁面にイオン交換部を有するイオン
交換カラムであって、前記イオン交換部は内壁表面のイ
オン交換基が半導体からなる保持部に保持され、前記保
持部の離隔した2点に電極が形成されていることを特徴
とするイオン交換カラム。
The analyst measures the electric resistance (reciprocal of the electric conductivity) of the holding unit 14 by the electric circuit 15 in advance.
The value at that time is defined as X1Ω. Next, the sample is poured from the inlet 10a. The target ions in the sample are captured by the ion-exchange groups 16 selected in advance, and the other components collect together with the solvent of the sample in the beaker 13a fixed below the outlet 10b. At that time, the bond between the ion exchange group and the target ion in the sample affects the conduction band electrons of the holding unit 14, and as a result, the electrical conductivity of the holding unit 14 changes. The electric resistance value at this time is assumed to be X2 Ω. Next, in order to separate the target ion from the ion exchange group 16, a solvent for stripping the ion is poured from the inlet 10a, and a solvent containing the target ion is obtained in a newly prepared beaker 13b. At this time, the solvent is poured while continuously measuring the electric resistance value X3 Ω of the holding unit 14 detected by the electric circuit 15, and when X3 becomes sufficiently close to X1 Ω with respect to X2, the objective is achieved. Since it can be considered that most of the ions have been separated from the ion exchange part, the injection of the solvent is terminated. The embodiments of the present invention are summarized below. An ion exchange column having an ion exchange section on an inner wall surface of a capillary tube, wherein the ion exchange section has an ion exchange group on the inner wall surface held by a holding section made of a semiconductor, and electrodes are formed at two separated points of the holding section. An ion-exchange column, characterized in that it is made.

【0012】[0012]

【発明の効果】以上、発明したように本発明のイオン交
換カラムでは、分析者は、イオン交換基の保持部の電気
抵抗(電気伝導度)を計測することにより、イオンの剥
離状態を連続的に測定しながら溶媒の注入を行うことが
出来るので、予備実験を行うことなく最適な溶媒量のイ
オン交換を行うことができる。
As described above, in the ion-exchange column of the present invention, as described above, the analyst measures the electric resistance (electrical conductivity) of the ion-exchange group holding section to continuously change the ion exfoliated state. Injection of the solvent can be performed while the measurement is being performed in a short time, so that ion exchange with an optimum amount of the solvent can be performed without performing a preliminary experiment.

【図面の簡単な説明】[Brief description of the drawings]

【図1】従来のイオン交換カラムの構成図FIG. 1 is a configuration diagram of a conventional ion exchange column.

【図2】従来における予備実験のグラフを示す図FIG. 2 is a diagram showing a graph of a conventional preliminary experiment.

【図3】本発明の一実施例であるイオン交換カラムの構
成図
FIG. 3 is a configuration diagram of an ion exchange column according to an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

10:イオン交換カラム 11:チューブ 12a:イオン交換部 13a:ビーカー 13b:ビーカー 14:保持部(半導体) 15:電気回路(電気伝導度測定用) 16:イオン交換基 10: Ion exchange column 11: Tube 12a: Ion exchange unit 13a: Beaker 13b: Beaker 14: Holding unit (semiconductor) 15: Electric circuit (for measuring electric conductivity) 16: Ion exchange group

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 キャピラリチューブ内壁面にイオン交換
部を有するイオン交換カラムであって、前記イオン交換
部は内壁表面のイオン交換基が半導体からなる保持部に
保持されたことを特徴とするイオン交換カラム。
1. An ion exchange column having an ion exchange portion on the inner wall surface of a capillary tube, wherein the ion exchange portion has an ion exchange group on the inner wall surface held by a holding portion made of a semiconductor. column.
JP8230661A 1996-08-30 1996-08-30 Ion exchange column Pending JPH1073580A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8230661A JPH1073580A (en) 1996-08-30 1996-08-30 Ion exchange column

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8230661A JPH1073580A (en) 1996-08-30 1996-08-30 Ion exchange column

Publications (1)

Publication Number Publication Date
JPH1073580A true JPH1073580A (en) 1998-03-17

Family

ID=16911317

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8230661A Pending JPH1073580A (en) 1996-08-30 1996-08-30 Ion exchange column

Country Status (1)

Country Link
JP (1) JPH1073580A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6480409B2 (en) 2000-05-19 2002-11-12 Samsung Electronics Co., Ltd. Memory modules having integral terminating resistors and computer system boards for use with same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6480409B2 (en) 2000-05-19 2002-11-12 Samsung Electronics Co., Ltd. Memory modules having integral terminating resistors and computer system boards for use with same

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