JPH10282140A - Contact probe having detachable tip - Google Patents
Contact probe having detachable tipInfo
- Publication number
- JPH10282140A JPH10282140A JP9089317A JP8931797A JPH10282140A JP H10282140 A JPH10282140 A JP H10282140A JP 9089317 A JP9089317 A JP 9089317A JP 8931797 A JP8931797 A JP 8931797A JP H10282140 A JPH10282140 A JP H10282140A
- Authority
- JP
- Japan
- Prior art keywords
- contact probe
- tip
- connecting portion
- fitting hole
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】この発明は、プリント配線基
板（ベアボ−ド、インサ−キット等）の電気回路の断
線、ショート等を検査するコンタクトプローブに係り、
詳記すれば、プランジャ−を交換可能に形成したコンタ
クトプローブに関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a contact probe for inspecting an electric circuit of a printed wiring board (bare board, insert kit, etc.) for disconnection or short circuit.
More specifically, the present invention relates to a contact probe having a replaceable plunger.
【０００２】[0002]
【従来の技術】プリント配線基板の電気回路の断線、シ
ョート等を点検するため従来から一体型コンタクトプロ
ーブが使用されている。従来の一体型コンタクトプロー
ブは、図１に示すように、プリント基板検査機の取付板
１に固定的に装着されるソケット２と、該ソケット２に
嵌合される胴部３と、この胴部３にバネ４等を介して装
着されるプランジャ−５とからなり、該プランジャ−５
の先端チップ６がプリント基板の被測定面７に押し当て
られた時に、プランジャ−５の摺動部８が胴部３に対し
て相対移動可能に構成されてなるコンタクトプローブが
知られていた。2. Description of the Related Art An integrated contact probe has conventionally been used for checking a disconnection or a short circuit of an electric circuit of a printed wiring board. As shown in FIG. 1, a conventional integrated contact probe includes a socket 2 fixedly mounted on a mounting plate 1 of a printed circuit board inspection machine, a body 3 fitted to the socket 2, and a body 3 3, a plunger 5 mounted via a spring 4 or the like.
A contact probe has been known in which the sliding portion 8 of the plunger 5 is configured to be relatively movable with respect to the body 3 when the tip chip 6 is pressed against the surface 7 to be measured of the printed circuit board.
【０００３】[0003]
【発明が解決しようとする課題】しかしながら、上記従
来のコンタクトプローブは、プランジャ−５は一体に形
成されていたので、多数回使用してチップ６先端が摩耗
し、正確な検査を行うことができなくなると、コンタク
トプローブ全体ををソケット２から抜いて交換してい
た。チップ以外は使用できる状態であっても、全体を交
換していたことと、多数本のコンタクトプローブを全て
交換していたので、非常に不経済であった。However, in the above-mentioned conventional contact probe, since the plunger 5 is formed integrally, the tip of the tip 6 is worn many times by using the plunger 5 and an accurate inspection can be performed. When it disappeared, the entire contact probe was removed from the socket 2 and replaced. Even if it was possible to use it except for the tip, it was very uneconomical because the whole was replaced and many contact probes were all replaced.
【０００４】そればかりか、ソケット２を使用せずに、
そのままコンタクトプローブを取付板１に嵌合し、ハン
ダ若しくは接着剤１３で固定する場合もあるが、この場
合は、ハンダ等を溶解させて、取り外し、またハンダ等
で新しいコンタクトプローブを固定しなければならなか
ったので、不経済であるだけでなく、大変な労力を必要
とする問題があった。In addition, without using the socket 2,
In some cases, the contact probe is directly fitted to the mounting plate 1 and fixed with solder or an adhesive 13, but in this case, the solder or the like must be dissolved and removed, and a new contact probe must be fixed with the solder or the like. Not only was uneconomical, but also required great effort.
【０００５】この発明は、このような問題点を解消しよ
うとするものであり、チップ６先端が摩耗した場合に、
チップ６だけを交換すれば済むようにしたコンタクトプ
ローブを提供することを目的とする。[0005] The present invention is intended to solve such a problem, and when the tip of the tip 6 is worn,
An object of the present invention is to provide a contact probe in which only the tip 6 needs to be replaced.
【０００６】[0006]
【課題を解決するための手段】上記目的に沿う本発明の
構成は、被測定部に当接するチップと、胴部に密嵌摺動
する摺動部と、該摺動部と前記チップとを連結する連結
部とを有するプランジャ−を具備したコンタクトプロー
ブに於いて、前記チップに前記連結部が密嵌する嵌合孔
を形成し、該嵌合孔に嵌合する連結部先端を、該嵌合孔
よりも若干大径に形成すると共に、前記連結部先端中央
部に、下方に向けたスリットを形成して、前記チップを
着脱可能に形成したことを特徴とする。According to the present invention, there is provided a semiconductor device comprising: a chip which comes into contact with a portion to be measured; a sliding portion which closely fits and slides on a body; In a contact probe having a plunger having a connecting portion to be connected, a fitting hole in which the connecting portion is closely fitted to the chip is formed, and a tip of the connecting portion fitted in the fitting hole is fitted into the fitting hole. It is characterized in that it is formed to have a slightly larger diameter than the hole, and a slit is formed in the center of the connecting portion at the center of the tip thereof so as to be detachable.
【０００７】コンタクトプローブ全体が太く、連結部も
ある程度の太さがある場合は、チップと連結部とを螺合
させることによって、交換可能とすることもできるが、
最近検査するプリント基板のピッチ間隔は非常に狭くな
ってきているので、それに対応して細くしたコンタクト
プローブでは、ネジを切ることは不可能であった。その
ため、従来は、チップと連結部とを着脱自在としたコン
タクトプローブは全く知られていないし、このような発
想も全く知られていない。If the entire contact probe is thick and the connecting portion has a certain thickness, it can be replaced by screwing the tip and the connecting portion.
Since the pitch interval between printed circuit boards to be inspected recently has become very narrow, it has not been possible to cut a screw with a contact probe that has been correspondingly narrowed. Therefore, conventionally, no contact probe in which the tip and the connecting portion are detachable is known at all, and no such idea is known.
【０００８】[0008]
【発明の実施の形態】次に、本発明の実施の形態を図面
に基づいて説明する。図２は、本発明の実施例を示す断
面図であり、チップ６に連結部９が嵌合する嵌合孔１０
を形成し、チップ９の上端中央には、下方に向けたスリ
ット１１を形成し、連結部９の外径を嵌合孔１０の内径
よりも若干太く形成した例を示す。Next, an embodiment of the present invention will be described with reference to the drawings. FIG. 2 is a cross-sectional view showing an embodiment of the present invention.
An example is shown in which a slit 11 facing downward is formed at the center of the upper end of the chip 9, and the outer diameter of the connecting portion 9 is formed slightly larger than the inner diameter of the fitting hole 10.
【０００９】嵌合させ易くするため、連結部９先端と嵌
合孔１０との当接部の少なくとも一方には、面取り１
２，１２′を施すと良い。手でスム−ズに嵌合させるに
は、面取りは、両方１２，１２′に施したほうが好まし
い。本発明のコンタクトプローブは、外径（胴部３の
径）が、０．５〜２ｍｍで連結部の径が、０．３〜１．
０ｍｍ程度の細いコンタクトプローブに特に好適であ
る。In order to facilitate the fitting, at least one of the contact portions between the end of the connecting portion 9 and the fitting hole 10 has a chamfer 1
It is good to apply 2,12 '. For a smooth fit by hand, the chamfers are preferably applied to both 12, 12 '. The contact probe of the present invention has an outer diameter (diameter of the trunk portion 3) of 0.5 to 2 mm and a diameter of the connecting portion of 0.3 to 1.
It is particularly suitable for a contact probe as thin as about 0 mm.
【００１０】連結部９の外径は、嵌合孔１０の内径の
０．５％〜２％程度太くすれば良く、連結部の太さに応
じて適当な太さを選択すれば良い。この場合、太さにも
よるが、３００ｇ〜１ｋｇの力で引っ張った場合に抜け
るように選択するのが良い。３００ｇ以下の力で抜けな
ければ、コンタクトプローブの使用中、チップ６が抜け
る恐れはないことと交換し易くなるからである。The outer diameter of the connecting portion 9 may be increased by about 0.5% to 2% of the inner diameter of the fitting hole 10, and an appropriate thickness may be selected according to the thickness of the connecting portion. In this case, although it depends on the thickness, it is preferable to select so as to come off when pulled with a force of 300 g to 1 kg. If the contact probe does not come off with a force of 300 g or less, the tip 6 does not come off during use of the contact probe, and it is easy to replace the chip.
【００１１】スリット１１は、連結部９が上記したよう
に細い場合は、単に切り込みを形成すれば良く、連結部
９が太い場合は、若干の幅のスリットとすれば良い。チ
ップ６、連結部９及び摺動部８からなるプランジャ−
は、通常この種目的に使用される金属で形成すれば良
い。When the connecting portion 9 is narrow as described above, the slit 11 may simply be formed by cutting, and when the connecting portion 9 is thick, the slit may be formed to have a width slightly. Plunger consisting of tip 6, connecting part 9 and sliding part 8
May be formed of a metal usually used for this kind of purpose.
【００１２】チップ６の連結部９への装着と脱着は、特
別な装置を必要とすることなく、作業員の手作業で容易
に行うことができる。上記実施例では、本発明のコンタ
クトチップは、取付板１にソケット２を介して装着して
いる。このように形成すると、チップ６以外の部分が使
用できなくなった場合に、コンタクトチップを交換する
のに便利である。The attachment and detachment of the chip 6 to and from the connecting portion 9 can be easily performed manually by an operator without requiring any special device. In the above embodiment, the contact chip of the present invention is mounted on the mounting plate 1 via the socket 2. When formed in this manner, it is convenient to replace the contact chip when a portion other than the chip 6 cannot be used.
【００１３】しかしながら、コンタクトチップの使用態
様においては、ソケット２を使用せずに、そのまま取付
板１に嵌合装着させる場合がある。本発明のコンタクト
チップは、特にこのような場合に極めて有用である。チ
ップ６が摩耗した場合に、チップ６だけを交換すれば良
く、ハンダ１３を溶解させてコンタクトチップを取り外
し、再度ハンダ付けする面倒な作業が不要となるからで
ある。However, in the usage mode of the contact chip, the socket 2 may not be used but may be fitted and mounted on the mounting plate 1 as it is. The contact tip of the present invention is extremely useful especially in such a case. This is because when the chip 6 is worn, only the chip 6 needs to be replaced, and the troublesome work of dissolving the solder 13, removing the contact chip and soldering again is not required.
【００１４】[0014]
【発明の効果】以上述べたごとく、本発明によれば、チ
ップが摩耗した場合に、チップだけを交換することがで
きるので、経済的な利点が大きいほか、特にソケットを
使用しない場合は、交換作業が著しく軽減される利点が
得られる。As described above, according to the present invention, when the tip is worn, only the tip can be replaced, so that the economical advantage is great. In particular, when the socket is not used, the replacement can be achieved. The advantage is that the work is significantly reduced.
【００１５】[0015]
【図１】従来のコンタクトプローブの断面図である。FIG. 1 is a sectional view of a conventional contact probe.
【図２】本発明の実施例を示す断面図である。FIG. 2 is a sectional view showing an embodiment of the present invention.
１ プリント基板検査機の取付板 ２ ソケット ５ プランジャ− ９ 連結部 １０ 嵌合孔 １２，１２′ 面取り DESCRIPTION OF SYMBOLS 1 Mounting board of printed circuit board inspection machine 2 Socket 5 Plunger 9 Connection part 10 Fitting hole 12, 12 'Chamfer
Claims (7)
摺動する摺動部と、該摺動部と前記チップとを連結する
連結部とを有するプランジャ−を具備したコンタクトプ
ローブに於いて、前記チップに前記連結部が密嵌する嵌
合孔を形成し、該嵌合孔に嵌合する連結部先端を、該嵌
合孔よりも若干大径に形成すると共に、前記連結部先端
中央部に、下方に向けたスリットを形成して、前記チッ
プを着脱可能に形成したことを特徴とするコンタクトプ
ローブ。1. A contact probe comprising a plunger having a tip abutting on a part to be measured, a sliding part closely fittingly sliding on a body part, and a connecting part connecting the sliding part and the chip. In the above, a fitting hole in which the connecting portion is closely fitted in the chip is formed, and a distal end of the connecting portion fitted in the fitting hole is formed to have a slightly larger diameter than the fitting hole, and the connection is formed. A contact probe, characterized in that a downwardly directed slit is formed in the center of the distal end, and the tip is detachably formed.
少なくとも一方に面取りを施してなる請求項１に記載の
コンタクトプローブ。2. The contact probe according to claim 1, wherein at least one of a contact portion between the distal end of the connecting portion and the fitting hole is chamfered.
両方に面取りを施してなる請求項２に記載のコンタクト
プローブ。3. The contact probe according to claim 2, wherein both of the abutting portion of the connecting portion and the fitting hole are chamfered.
０．５％〜２％大径に形成してなる請求項１または３に
記載のコンタクトプローブ。4. The contact probe according to claim 1, wherein an outer diameter of the connecting portion is formed to be 0.5% to 2% larger than an inner diameter of the fitting hole.
ある請求項１または４に記載のコンタクトプローブ。5. The contact probe according to claim 1, wherein the diameter of the connecting portion is 0.2 to 1.0 mm.
〜２．０ｍｍである請求項１〜５のいずれか１項に記載
のコンタクトプローブ。6. An outer diameter of said contact probe is 0.5
The contact probe according to any one of claims 1 to 5, which has a thickness of 2.0 mm.
合固定してなる請求項１〜６のいずれか１項に記載のコ
ンタクトプローブ。7. The contact probe according to claim 1, wherein said contact probe is directly fitted and fixed to a mounting plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9089317A JPH10282140A (en) | 1997-04-08 | 1997-04-08 | Contact probe having detachable tip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9089317A JPH10282140A (en) | 1997-04-08 | 1997-04-08 | Contact probe having detachable tip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH10282140A true JPH10282140A (en) | 1998-10-23 |
Family
ID=13967297
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9089317A Pending JPH10282140A (en) | 1997-04-08 | 1997-04-08 | Contact probe having detachable tip |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH10282140A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001041979A (en) * | 1999-05-26 | 2001-02-16 | Nidec-Read Corp | Printed circuit board inspecting device and probe to be used for the same |
| US6486689B1 (en) | 1999-05-26 | 2002-11-26 | Nidec-Read Corporation | Printed circuit board testing apparatus and probe device for use in the same |
| US7262614B1 (en) | 2005-02-10 | 2007-08-28 | Lecroy Corporation | Planar on edge probing tip with flex |
| US7321234B2 (en) | 2003-12-18 | 2008-01-22 | Lecroy Corporation | Resistive test probe tips and applications therefor |
| JP2010071954A (en) * | 2008-09-22 | 2010-04-02 | Toyo Denshi Giken Kk | Measuring probe, and measuring probe body member, inside probe element and peripheral side probe element constituting it |
-
1997
- 1997-04-08 JP JP9089317A patent/JPH10282140A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001041979A (en) * | 1999-05-26 | 2001-02-16 | Nidec-Read Corp | Printed circuit board inspecting device and probe to be used for the same |
| US6486689B1 (en) | 1999-05-26 | 2002-11-26 | Nidec-Read Corporation | Printed circuit board testing apparatus and probe device for use in the same |
| US7321234B2 (en) | 2003-12-18 | 2008-01-22 | Lecroy Corporation | Resistive test probe tips and applications therefor |
| US7262614B1 (en) | 2005-02-10 | 2007-08-28 | Lecroy Corporation | Planar on edge probing tip with flex |
| JP2010071954A (en) * | 2008-09-22 | 2010-04-02 | Toyo Denshi Giken Kk | Measuring probe, and measuring probe body member, inside probe element and peripheral side probe element constituting it |
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