JPH1026586A - Method and apparatus for observing sample - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a method capable of observing a sample to observe cut surface and structure of the sample in more details. SOLUTION: Wavelengths of a light emitted to a cut surface of a sample S are selected by first and second light wavelength selectors 2, 4, and imaged by a camera 5 while selecting the wavelength of the light incident on the camera 5 by a third light wavelength selector 6, and hence four image data responsive to the selectors are stored for one sample cut surface. Thus, the cut surface can be observed in more details by utilizing the four data obtained at the respective cut surfaces. A three-dimensional stereoscopic structure of the sample is accurately constructed from these data, and the structure can be accurately observed in detail.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

The present invention relates to a sample useful for pathological examination in the medical field, toxicity test in the pharmaceutical field, food inspection in the food field, agricultural crop inspection and plant structure analysis in the agricultural field, biological sample inspection in the biological field, and the like. The present invention relates to an observation method and an apparatus therefor, and more particularly to a sample observation method and an apparatus for observing a sample based on image data obtained by imaging a sample cut surface.

[0002]

2. Description of the Related Art Conventionally, in this type of sample observation, a sample to be observed is cut, a sample cut surface is imaged by a CCD camera while irradiating white light, image data is stored, and the image data is stored. A normal observation method of processing a sample cut surface or a sample structure on a monitor after processing the data into observable data is generally adopted.

[0003] Further, a sample to be observed is pre-stained with a fluorescent dye, and light of a specific wavelength at which the fluorescent dye is excited is irradiated on a cut surface of the sample, so that fine substances, organs, pathogens, cancer, etc., inside the sample are observed. There is also known a fluorescence observation method for observing the image.

[0004]

However, in the conventional observation methods described above, since only one image data is obtained for one sample cut surface, the image data obtained for each sample cut surface is obtained. No matter how the treatment is performed, it is not possible to observe the sample cut surface and the sample structure in more detail than ever.

The present invention has been made in view of the above circumstances. It is an object of the present invention to provide a sample observation method capable of observing a sample cut surface and a sample structure in more detail, and a sample observation apparatus suitable for implementing the method. To provide.

[0006]

According to a first aspect of the present invention, there is provided a method for observing a sample, the method comprising the steps of: In a sample observation method of storing and observing a sample based on the image data, by performing imaging while selecting one of a wavelength of light applied to the sample cut surface and a wavelength of light incident on the imaging unit, The main feature is that a plurality of image data corresponding to the number of selected wavelengths is stored for one sample cut surface.

According to a second aspect of the present invention, there is provided a sample observing method in which an image is taken by an image pickup means while illuminating a cut surface of a sample, image data is stored, and the sample is observed based on the image data. By performing imaging while selecting the wavelength of light applied to the surface and the wavelength of light incident on the imaging unit, a plurality of image data corresponding to the number of wavelength selections is stored for one sample cut surface, That is its main feature.

According to these sample observation methods, imaging is performed while selecting at least one of the wavelength of light irradiated on the sample cut surface and the wavelength of light incident on the image pickup means, and one sample cut surface is obtained. By storing a plurality of image data corresponding to the number of selected wavelengths, the cut surface observation and the structure observation can be performed in more detail using the plurality of image data obtained for each cut surface.

According to a sixth aspect of the present invention, there is provided a sample observation apparatus, comprising: an illuminating means for illuminating a sample cut surface; an imaging means for imaging the sample cut surface; and an image obtained by the imaging means. In a sample observation device including a storage unit for storing data and a data processing unit for processing image data into observable data, a wavelength of light irradiated on a sample cut surface and a wavelength of light incident on an imaging unit. Light wavelength selecting means for selecting one of the above, and imaging control means for performing imaging by the imaging means for each wavelength selection and storing a plurality of image data corresponding to the number of wavelength selections for one sample cut surface. did,
That is its main feature.

According to a seventh aspect of the present invention, there is provided an illuminating means for illuminating a cut surface of a sample, an imaging means for imaging the cut surface of the sample, a storage means for storing image data obtained by the imaging means, In a sample observation device including a data processing unit that processes data into observable data, a light wavelength selection unit that selects a wavelength of light irradiated on the sample cut surface and a wavelength of light incident on the imaging unit, The main feature of the present invention is that an imaging control unit is provided for performing imaging by the imaging unit for each wavelength selection and storing a plurality of image data corresponding to the number of selected wavelengths on one sample cut surface.

According to these sample observation devices, the image wavelength control means selects at least one of the wavelength of the light irradiated on the sample cut surface and the wavelength of the light incident on the image pickup means, and the image control means selects the wavelength. The sample observation method according to claim 1 or 2, is preferably performed by performing imaging by an imaging unit for each selection and storing a plurality of image data corresponding to the number of selected wavelengths on one sample cut surface. it can.

[0012]

FIG. 1 shows a schematic configuration of a sample observation apparatus to which the present invention is applied. In the figure, 1 is a first light source, 2 is a first light wavelength selector, 3 is a second light source, 4 is a second light wavelength selector, 5 is a camera with a built-in two-dimensional CCD, and 6 is a second light source. Reference numeral 3 denotes an optical wavelength selector, 7 denotes a half mirror (this half mirror may be a dichroic mirror that can limit the transmission wavelength of light), 8 denotes an objective lens, 9 denotes an indirect illuminator, 10 denotes a sample mounting table, and S denotes A sample, 11 an imaging controller, 12 an optical wavelength selection controller, 13 a main controller, 14
Is a monitor.

The first optical wavelength selector 2 comprises a main body 2a having a light passage hole, a disk-shaped filter support plate 2b rotatably supported with a part inserted in the main body 2a, and a filter. And a servo motor 2c with an encoder that rotationally drives the support plate 2b. Filter support plate 2b
As shown in FIG. 2 (a), a total of eight circular filter support holes 2b1 are formed at intervals of 45 degrees in the circumferential direction.
These support holes 2b1 are provided with 4 holes used for staining the sample S.
Wavelength light (λF1 to λ
F4) Four types of optical filters F1 to F4 that can transmit light
Are mounted so as to be arranged in two sets in the circumferential direction.

Similarly to the first optical wavelength selector 2, the second optical wavelength selector 4 has a main body 4a having a light passage hole, and a rotatably supported shaft with a part inserted into the main body 4a. And a disk-shaped filter support plate 4b, and a servomotor 4c with an encoder that rotationally drives the filter support plate 4b. As shown in FIG. 2A, a circular filter support hole 4b1 is formed in the filter support plate 4b in the circumferential direction.
The support holes 2b1 have the same optical filters F1 to F1 as the first optical wavelength selector 2.
4 are mounted so as to be arranged in two sets in the circumferential direction.

Similarly to the first optical wavelength selector 2, the third optical wavelength selector 6 includes a main body 6a having a light passage hole, and a rotatably supported shaft with a part inserted into the main body 6a. A disk-shaped filter support plate 6b and a servomotor 6c with an encoder for driving the filter support plate 6b to rotate. As shown in FIG. 2B, a circular filter support hole 6b1 is formed in the filter support plate 6b in the circumferential direction.
The support holes 6b1 have optical filters f1 to f4 different from the first and second optical wavelength selectors 2 and 4, that is, four filters 4 to be used for staining the sample S. Four types of optical filters f1 to f4 capable of transmitting the wavelengths (λf1 to λf4) of light emitted when exciting various types of fluorescent dyes are mounted so as to be arranged in two sets in the circumferential direction.

In these first, second, and third optical wavelength selectors 2, 4, and 6, the filter support plates 2b, 4b, and 6b are rotated by 45 degrees by servo motors 2c, 4c, and 6c. Optical filters F1-F4 or f1-
One of f4 can be matched with the light passage hole of the main body 2a.

The first light source 1 is for direct illumination and includes a light bulb such as a mercury lamp that emits white light therein. The first light source 1 emits white light through a light propagation path such as an inner gloss tube or an optical fiber.
To the optical wavelength selector 2. Light that has passed through the first optical wavelength selector 2 is incident on the half mirror 7 through a similar light propagation path.

The second light source 3 is for indirect illumination and includes a light bulb such as a mercury lamp that emits white light therein. The second light source 3 emits white light through a light propagation path such as an inner gloss tube or an optical fiber.
To the optical wavelength selector 4. The light that has passed through the second light wavelength selector 4 is incident on an indirect illuminator 9 disposed around the lower end of the objective lens 8 through a similar light propagation path. The indirect illuminator 9 is formed in a ring shape from a light transmitting material,
The entire surface emits light of the same color by light incidence, and the cut surface of the sample S is indirectly illuminated from around the objective lens 8.

The image pickup control section 11 includes a memory, a CPU, and the like. The image pickup control section 11 receives an image pickup signal from the main control section 13, performs image pickup by the camera 5, stores image data obtained by the camera 5 in the memory, and Then, data processing such as area division, contour deformation processing, feature extraction, and synthesis is performed on the stored image data.

The optical wavelength selection control unit 12 includes a drive circuit for a servo motor, and receives a wavelength switching signal from the main control unit 13 to execute filter switching by each of the optical wavelength selectors 2, 4, and 6. I do.

The main control unit 13 includes a memory, a CPU, and the like, and controls the imaging control unit 1 according to a program for observation control.
1 and a control signal to the optical wavelength selection control unit 12 to perform cut plane imaging and filter switching, and also obtain necessary processing data from the imaging control unit 11 to monitor a cut plane image or a three-dimensional image of the sample S. 14 is displayed.

The sample S is appropriately selected from the medical field, pharmaceutical field, food field, agricultural field, biological field, etc.
It is dyed in advance by four kinds of fluorescent dyes which are excited by lights of different wavelengths (wavelength lights λF1 to λF4 transmitted through the optical filters F1 to F4). When a soft material such as an organism, a plant, or a food is used as the sample S, these samples are subjected to a solidification treatment after dyeing by a method such as heating, oxygen cutoff, and passage of time in order to obtain a clean cut surface.

Hereinafter, a sample observing method realized by the above-described sample observing apparatus will be described with reference to FIGS.

First, a sample S to be observed is cut along a surface Sa shown in FIG. 3 using a rotary cutting blade or a slide cutting blade, and the table 10 is cut so that the cut surface Sa faces the objective lens 8. Place on.

Next, the filter support plates 2b, 4b, 6 of the optical wavelength selectors 2, 4, 6 are controlled by the optical wavelength selection controller 12.
b at the same time, the first and second optical wavelength selectors 2,
4, wavelength light λF that excites one of the four types of fluorescent dyes
The optical filter F1 that can transmit the light 1 is matched with the light passing holes of the main bodies 2a and 4a, while the third light wavelength selector 6 emits the wavelength light λf1 excited when the wavelength light λF1 is irradiated on the cut surface Sa. The optical filter f1 capable of transmitting the light is made to coincide with the light passage hole of the main body 6a, and the imaging controller 11 performs imaging by the camera 5.

As a result, of the white light emitted from the first light source 1, only the wavelength light of λF1 passes through the optical filter F1 of the first optical wavelength selector 2, and the wavelength light λF1 is In addition, while being irradiated on the cut surface Sa of the sample S through the objective lens 8, only the wavelength light of λF1 out of the white light emitted from the second light source 3 passes through the optical filter F1 of the second optical wavelength selector 4. Then, the wavelength light λF1 is indirectly applied to the cut surface Sa of the sample S through the indirect illuminator 9, and the cut surface Sa of the sample S emits only a portion stained with a fluorescent dye that can be excited by the wavelength light λF1. I do.

The reflected light from the cut surface Sa, that is, the wavelength light λF1 applied to the cut surface Sa and the wavelength light λf1 excited by the wavelength light λF1 are transmitted through the objective lens 8 and the half mirror 7 to the third light wavelength Optical filter f1 of selector 6
And only the wavelength light of λf1 of the reflected light is transmitted through the optical filter f1 and guided to the camera 5.

That is, here, the wavelength light λF1 is
a to the light excited by the wavelength light λF1 (wavelength light λF1).
f1) is guided to the camera 5 to capture an image of the cut surface Sa, and the image of the cut surface Sa (the image at the left end in FIG. 4A) is stored in the memory.

Next, the filter support plates 2b, 4b, 6 of the respective optical wavelength selectors 2, 4, 6 are controlled by the optical wavelength selection controller 12.
b at the same time, the first and second optical wavelength selectors 2,
4, the wavelength light λF2 for exciting another fluorescent dye is used.
An optical filter F2 capable of transmitting light is matched with the light passage holes of the main bodies 2a and 4a, while the third optical wavelength selector 6 converts the wavelength light λf2 excited when the wavelength light λF2 is applied to the cut surface Sa. The transmissible optical filter f2 is made to coincide with the light passage hole of the main body 6a, and the imaging controller 11 performs imaging by the camera 5.

That is, here, the wavelength light λF2 is
a to the light excited by the wavelength light λF2 (wavelength light λF2).
f2) is guided to the camera 5 to capture an image of the cut surface Sa, and the image of the cut surface Sa (the second image from the left in FIG. 4A) is stored in the memory.

Next, the filter support plates 2b, 4b, 6 of the respective optical wavelength selectors 2, 4, 6 are controlled by the optical wavelength selection controller 12.
b at the same time, the first and second optical wavelength selectors 2,
4, the wavelength light λF3 that excites another fluorescent dye
The optical filter F3 that can transmit the wavelength light λf3 is made to coincide with the light passing holes of the main bodies 2a and 4a, while the third light wavelength selector 6 converts the wavelength light λf3 excited when the wavelength light λF3 is applied to the cut surface Sa. The transmissible optical filter f3 is made to coincide with the light passage hole of the main body 6a, and the imaging by the camera 5 is performed by the imaging controller 11.

That is, here, the wavelength light λF3 is
a to the light excited by the wavelength light λF3 (wavelength light λF3).
f3) is guided to the camera 5 to capture an image of the cut surface Sa, and the image of the cut surface Sa (the second image from the right in FIG. 4A) is stored in the memory.

Next, the filter support plates 2b, 4b, 6 of the optical wavelength selectors 2, 4, 6 are controlled by the optical wavelength selection controller 12.
b at the same time, the first and second optical wavelength selectors 2,
4, the wavelength light λF4 for exciting another fluorescent dye is used.
The optical filter F4 capable of transmitting the light is matched with the light passing holes of the main bodies 2a and 4a, while the third light wavelength selector 6 emits the wavelength light λf4 excited when the wavelength light λF4 is irradiated on the cut surface Sa. The optical filter f4 capable of transmitting the light through the optical filter f4 is made to coincide with the light passage hole of the main body 6a, and the imaging controller 11 performs imaging by the camera 5.

That is, here, the wavelength light λF4 is
a, and the light excited by the wavelength light λF4 (wavelength light λ
f4) is guided to the camera 5 to capture an image of the cut surface Sa, and the image of the cut surface Sa (the second image from the right in FIG. 4A) is stored in the memory.

Thereafter, as in the above, the sample S
Are sequentially cut at the planes Sb, Sc, and Sd shown in FIG.
While irradiating b, Sc, and Sd with four types of wavelength lights λF1 to λF4, the light (wavelength lights λf1 to λf4) excited by the respective wavelength lights λF1 to λF4 is guided to the camera 5, and the cut surface S
b, Sc, and Sd are imaged, and the images of the cut surfaces Sb, Sc, and Sd shown in FIGS. 4B, 4C, and 4D are stored in the memory.

The four image data obtained for each of the cut surfaces Sa to Sd are subjected to data processing such as area division, contour deformation processing, feature extraction, and synthesis by the imaging control unit 11. These processing data are taken into the main control unit 13 as needed,
Each cut plane image, three-dimensional image, and the like are displayed on the monitor 14.

As described above, according to the sample observation method and the apparatus described above, the cut surface can be observed in more detail by using the four image data obtained for each of the cut surfaces Sa to Sd. Thus, the three-dimensional structure of the sample can be constructed with high precision, and the structure can be observed in detail and accurately.

Further, since four pieces of image data having different fluorescent coloring states are obtained for each of the cut surfaces Sa to Sd, the cut surface observation and the structure observation by the fluorescence observation can be performed with high sensitivity, and the fine substance and the fine substance inside the sample can be observed. This is extremely useful when observing organs, pathogens, cancer, and the like.

Further, since the image is taken by illuminating the sample cut surface with the direct light and the indirect light, it is possible to eliminate noise caused by shadows and unevenness of the illumination and to acquire image data suitable for observation.

In the embodiment shown in FIGS. 1 to 4,
Although each of the optical wavelength selectors switches the optical filters by rotating the filter support plate, the optical wavelength selector shown in FIG. 5 or 6 can be used instead.

The optical wavelength selector 21 shown in FIG.
1a, an optical splitter 21b, an optical combiner 21c, four types of optical filters F1 to F4 (f1 to f4), and an opening and closing provided on a light incident surface of each of the optical filters F1 to F4 (f1 to f4). Flexible shutter 21d and 8 mirrors 21 in total
e. The shutter 21 can be opened and closed by a power source (not shown), for example, a motor, a solenoid, or the like, and selectively controls light incidence on the optical filters F1 to F4 (f1 to f4) by opening and closing by two or sliding.

In the optical wavelength selector 21, the light incident on the end of the optical splitter 21b from the light source is split in four directions by the optical splitter 21b, and each split light is transmitted to each shutter via the mirror 21e. If the shutter 21d is selectively opened in accordance with an optical filter to be used, light is incident only on a predetermined optical filter, and light having a specific wavelength transmitted through the optical filter is mirrored. The light can be guided to the optical combiner 21c through the end 21e and emitted from the end.

The optical wavelength selector 22 shown in FIG.
2a, a polygon mirror 22b, a total of nine mirrors,
It is composed of four types of optical filters F1 to F4 (f1 to f4) and an optical combiner 22d. Polygon mirror 2
2b enables angular displacement by a power source (not shown) such as a motor, and selectively controls light incidence on the optical filters F1 to F4 (f1 to f4) by its own angular displacement.

In the optical wavelength selector 22, the light incident on the polygon mirror 22b from the light source is
2b, the reflected light can be guided to one of the optical filters F1 to F4 via the mirror 22c. If the reflection angle of the polygon mirror 22b is changed according to the optical filter to be used, Light can be incident only on a predetermined optical filter, and light of a specific wavelength transmitted through the optical filter can be guided to the optical combiner 22d via the mirror 22c and emitted from the end. Also, polygon mirror 2
By directing the reflected light of 2b directly to the optical combiner 22d, it is possible to emit wavelength-nonselective white light from its end.

In each of the optical wavelength selectors 2, 4, and 6 shown in FIG. 1, if a portion where the optical filter is not mounted is left on the filter support plate, white light with non-selective wavelength can be irradiated on the cut surface of the sample. Can be. Also, in the optical wavelength selector 21 shown in FIG. 5, if one of the branched lights can be guided to a shutter provided in a place where there is no optical filter, white light of non-selective wavelength is irradiated on the sample cut surface. be able to.

As described above, if the function of directly irradiating the sample cut surface with the white light emitted from the light source is added to the optical wavelength selector, an image obtained when the white light is irradiated on the sample cut surface can be cut. It can be obtained for each surface, enabling fluorescence observation and normal observation using white light to enable more detailed cut surface observation, and combining a white light image with a fluorescent color image to create a three-dimensional image. By constructing the structure, the observation of the sample structure can be performed in more detail and accurately.

Further, in the embodiment shown in FIGS. 1 to 4, an example in which a sample separately cut at a position different from that of the sample observation device is placed on the table is illustrated.
When the cutting device shown in FIG. 1 is used in combination with the device shown in FIG. 1, the cutting of the sample and the imaging of the cut surface can be continuously performed by a single device.

The cutting device 31 shown in FIG. 6 includes a base frame 32 and a cutting blade mounting disk 34 having a cutting blade 33.
A motor 35 for rotating a cutting blade mounting disk, a table 36 on which the sample S is placed, a pair of guide rods 37 for supporting the table 36 in a vertically movable manner, a motor 38 for moving the table up and down, and a motor rotation. Is converted into linear power and transmitted to the table 36 by a ball screw 39. The cutting blade mounting disk 36 has a cutting blade 33 between two large and small annular rings, and can cut the sample S by the cutting blade 33 by its own rotation.

In the cutting device 31, the motor 38 is operated to raise the table 36, and the motor 35 is operated with the upper end of the sample S protruding beyond the cutting blade 33 by a predetermined amount. Is rotated once, the protruding portion of the sample S is cut by the cutting blade 33, and the cut surface can be exposed from between the rings of the cutting blade mounting disk 36.
That is, if the apparatus is arranged so that the table 36 is located directly below the objective lens 4 of the sample observation apparatus shown in FIG. 1, the required amount of the sample S to be observed is fed and cut,
The cut surface can be imaged by the camera 5.

Further, in the embodiment shown in FIGS. 1 to 4, the wavelength of the light to be irradiated on the cut surface of the sample is selected by the first and second light wavelength selectors 2 and 4, and is incident on the camera 5. In this example, the third light wavelength selector 6 is used to select the wavelength of the light to be output. It is possible to obtain an image similar to that of FIG. 4 for each section even if the image is taken while selecting the wavelength of the light irradiated to the section and incident on the camera 5 by the third optical wavelength selector 6. It is. Further, the device configuration excluding the third optical wavelength selector 6, that is, the wavelength of the light applied to the sample cut surface is changed to the first and second optical wavelength selectors 2,
It is also possible to obtain an image similar to that of FIG. 4 for each cut surface by making the reflected light from the cut surface of the sample incident on the camera 5 and taking an image while selecting in step 4. In particular, in the latter case, if a dichroic mirror is used as the half mirror, the wavelength of light incident on the camera 5 by the dichroic mirror can be limited in accordance with the selected wavelength.

Further, the embodiment shown in FIGS. 1 to 4 exemplifies an embodiment in which the light from the first light source 1 and the light from the second light source 3 are used to illuminate the sample cut surface. However, the device configuration excluding the first light source 1, that is, the second
By simply indirectly illuminating the sample cut surface with the light from the light source 3, the desired image can be captured by the camera 5. The indirect illumination in this case is not limited to the ring-shaped illuminator shown in FIG. 1, and a plurality of flat illuminators may be used to illuminate the sample cut surface obliquely from above.

Further, in the embodiment shown in FIGS. 1 to 4, the cutting of the sample and the imaging of the cut surface are sequentially repeated, but the imaging of the cut surface is not necessarily performed every time the sample is cut. It is not necessary to perform the imaging, and the image data may be stored only for the necessary cutting plane out of all the cutting planes.

[0053]

As described above in detail, according to the sample observation method and apparatus according to the present invention, it is possible to observe a cut surface in more detail by using a plurality of image data obtained for each cut surface. The three-dimensional structure of the sample can be constructed with high precision from these image data, and the structure can be observed in detail and accurately.

[Brief description of the drawings]

FIG. 1 is a diagram showing a schematic configuration of a sample observation device to which the present invention is applied.

FIG. 2 is a top view of a filter support plate.

FIG. 3 is a perspective view of a sample.

FIG. 4 is a diagram showing an image for each cut surface.

FIG. 5 is a diagram showing another example of the structure of the optical wavelength selector.

FIG. 6 is a diagram showing another example of the structure of the optical wavelength selector.

FIG. 7 is a diagram showing a schematic configuration of a cutting device.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 ... Camera, 2 ... 1st light wavelength selector, 2b ... Filter support plate, F1-F4 ... Optical filter, 3 ... Half mirror, 4 ... Objective lens, 5 ... 1st light source, 6 ... 2nd light Wavelength selector, 6b: filter support plate, 7: second light source, 8
... Third light wavelength selector, 8b. Filter support plate, 9 indirect illuminator, 10 table, S. sample, 11 imaging control unit, 12 light wavelength selection control unit, 13 main control unit, 14 …
Monitor, Sa, Sb, Sc, Sd: Sample cut surface.

 ──────────────────────────────────────────────────続 き Continued on the front page (72) Inventor Toshiro Higuchi 3-4-26, Edahigashi, Tsuzuki-ku, Yokohama, Kanagawa Prefecture (72) Inventor Kenichi Kudo 5-15-16, Sugamo, Toshima-ku, Tokyo (72) Inventor Yokota Hideo 206 Inada Tsutsumi, 2-15-5 Suga, Tama-ku, Kawasaki City, Kanagawa Prefecture (72) Inventor Shoshin Fukuda 3-8-3, Shinsaku, Takatsu-ku, Kawasaki City, Kanagawa Prefecture (72) Inventor Mitsunori Kokubo Ooka, Numazu-shi, Shizuoka Prefecture 2068-3 Toshiba Machine Co., Ltd. Numazu Office

Claims (11)

[Claims] 1. A method for observing a sample based on the image data by capturing an image with an imaging unit while illuminating the sample cut surface, and observing a sample based on the image data. Specimen observation characterized by storing a plurality of image data corresponding to the number of selected wavelengths for one sample cut surface by performing imaging while selecting one of the wavelengths of light incident on the imaging means. Method. 2. A sample observing method in which an image is taken by an image pickup means while illuminating a sample cut surface, image data is stored, and a sample is observed based on the image data. A sample observing method, characterized in that a plurality of image data corresponding to the number of selected wavelengths is stored for one sample cut surface by performing imaging while selecting the wavelength of light incident on the imaging means. 3. The sample observation method according to claim 1, wherein the wavelength of the light is selected using an optical filter. 4. The sample observation method according to claim 1, wherein the sample is pre-stained with a plurality of fluorescent dyes excited by light of different wavelengths. 5. The sample observation method according to claim 1, wherein the image data obtained on one cut surface of the sample includes image data captured by white light. 6. An illuminating means for illuminating a sample cut surface, an imaging means for imaging the sample cut surface, a storage means for storing image data obtained by the imaging means, and processing the image data into observable data. A sample observing apparatus having data processing means, wherein: a light wavelength selecting means for selecting one of a wavelength of light irradiated on the sample cut surface and a wavelength of light incident on the imaging means; and A sample observation device, comprising: imaging control means for performing imaging and storing a plurality of image data corresponding to the number of wavelengths selected for one sample cut surface. 7. An illuminating means for illuminating a sample cut surface, an imaging means for imaging the sample cut surface, a storage means for storing image data obtained by the imaging means, and processing the image data into observable data. A sample observing apparatus including a data processing unit, a light wavelength selecting unit for selecting a wavelength of light irradiated on the sample cut surface and a wavelength of light incident on the imaging unit, and imaging by the imaging unit for each wavelength selection. A sample observation device, comprising: an imaging control unit that stores a plurality of image data according to the number of wavelengths selected for one sample cut surface. 8. The optical wavelength selecting means comprises: a filter support plate for supporting a plurality of optical filters; and a power source for switching an optical filter to be used by changing the filter support plate. The sample observation device according to claim 6 or 7, wherein 9. An optical wavelength selection unit switches between a plurality of optical filters, an openable / closable shutter provided on one surface of each optical filter, and an optical filter to be used by selectively opening each shutter. The sample observation device according to claim 6, comprising a power source. 10. An optical wavelength selecting means for switching between a plurality of optical filters, a variable mirror for selectively inputting light to each optical filter, and an optical filter to be used by changing a reflection angle of the variable mirror. The sample observation device according to claim 6, comprising a power source for performing the operation. 11. The sample observation device according to claim 6, wherein the light wavelength selection means has a function of passing white light.