JPH10214853A - Semiconductor sealing method - Google Patents

Semiconductor sealing method

Info

Publication number
JPH10214853A
JPH10214853A JP1416397A JP1416397A JPH10214853A JP H10214853 A JPH10214853 A JP H10214853A JP 1416397 A JP1416397 A JP 1416397A JP 1416397 A JP1416397 A JP 1416397A JP H10214853 A JPH10214853 A JP H10214853A
Authority
JP
Japan
Prior art keywords
screw
sealing material
injection molding
semiconductor
molding machine
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1416397A
Other languages
Japanese (ja)
Inventor
Fuminari Yoshizumi
文成 吉住
Katsunori Minami
勝則 南
Hideo Ito
英雄 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Bakelite Co Ltd
Original Assignee
Sumitomo Bakelite Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Bakelite Co Ltd filed Critical Sumitomo Bakelite Co Ltd
Priority to JP1416397A priority Critical patent/JPH10214853A/en
Publication of JPH10214853A publication Critical patent/JPH10214853A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To enhance the moldability of low-viscosity sealing material under low injection pressure, by providing the screw of an injection molding machine with a reverse flow preventing mechanism. SOLUTION: Sealing material fed into a hopper stays in the front part of a cylinder 3 through the rotation of a screw 1. The amount of the sealing material stayed is controlled by the position to which the screw 1 is retreated, and the sealing material is returned along the groove of the screw 1 at the next shot. Depending on the amount of this back-flow, products may develop filling failure or sink mark due to short shot. To cope with this, the screw 1 of the injection molding machine is provided with a mechanism to prevent or reduce back flow. Specifically, back flow is reduced by installing a barrier 5 in the groove of the screw 1 or installing a plunger at the tip 4 of the screw to prevent sealing material from being returned to the groove of the screw 1, immediately before the screw 1 advances farthest in the final stage of injection filing when the amount of back flow is maximized.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、エポキシ樹脂封止
材料を用い、射出成形により半導体を封止する方法に関
するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for sealing a semiconductor by injection molding using an epoxy resin sealing material.

【0002】[0002]

【従来の技術】IC、LSI、ディスクリート等の半導
体素子の封止には、エポキシ樹脂封止材料のトランスフ
ァー成形が低コスト、高信頼性及び生産性に適した方法
として従来より用いられている。トランスファー成形で
は、エポキシ樹脂封止材料をタブレット状に予備成形し
て、金型内のポットに投入し、加熱溶融させながらプラ
ンジャーで加圧することにより、金型キャビティ内に移
送し、硬化させるのが一般的である。しかしながら、こ
の成形方法ではエポキシ樹脂封止材料をタブレット状に
予備成形することが前提となるため、タブレット成形工
程が必要である。成形される半導体の形状、大きさによ
りタブレット形状は種々異なるので、タブレット成形用
の金型装置も多く必要である。
2. Description of the Related Art For sealing semiconductor elements such as ICs, LSIs, and discretes, transfer molding of an epoxy resin sealing material has conventionally been used as a method suitable for low cost, high reliability and productivity. In transfer molding, the epoxy resin sealing material is preformed in the form of a tablet, poured into a pot in a mold, and heated and melted, and is pressed into the mold cavity, transferred to the mold cavity, and cured. Is common. However, in this molding method, it is premised that the epoxy resin sealing material is preformed in a tablet shape, so that a tablet molding step is required. Since the shape of the tablet varies depending on the shape and size of the semiconductor to be molded, many mold devices for tablet molding are required.

【0003】また、成形毎にタブレットの投入と熱溶融
が必要であるため、成形サイクルを一定時間以下にでき
ない。これらの点から低コスト化、大量生産性に限界が
あり、またタブレット成形等の前工程が必要なため、封
止材料に不純物混入の恐れも多い。更にトランスファー
成形においてはポットに投入された封止材料が金型内を
流動しキャビティ内に到達するまでの流路であるランナ
ー部や、ポット内で残りのカル部が完全に硬化してしま
うため、再利用が不可能であり、必要とする半導体パッ
ケージ部以外に多量の樹脂廃棄物を生成してしまうとい
う問題がある。
In addition, since tablet injection and heat melting are required for each molding, the molding cycle cannot be made shorter than a certain time. From these points, there is a limit in cost reduction and mass productivity, and since a pre-process such as tablet molding is required, there is a high possibility that impurities are mixed in the sealing material. Furthermore, in transfer molding, the runner part, which is the flow path until the sealing material put into the pot flows in the mold and reaches the cavity, and the remaining cull part in the pot are completely cured. In addition, there is a problem that reuse is impossible and a large amount of resin waste is generated in a part other than a necessary semiconductor package part.

【0004】一方、エポキシ樹脂を含む熱硬化性樹脂成
形材料の成形として、射出成形方法の検討が従来より行
われてきた。射出成形においては、エポキシ樹脂成形材
料は射出成形機内に粉末又は顆粒状にて供給され、シリ
ンダー内で溶融状態に保ったままスクリューにより金型
に射出される。このため、タブレットの予備成形工程が
不要である等、前記トランスファー成形の問題点が解消
できる。
On the other hand, an injection molding method has been conventionally studied as a molding of a thermosetting resin molding material containing an epoxy resin. In injection molding, an epoxy resin molding material is supplied in a powder or granular form into an injection molding machine, and is injected into a mold by a screw while being kept in a molten state in a cylinder. For this reason, the problem of the transfer molding can be solved, for example, a tablet preforming step is not required.

【0005】しかしながら、エポキシ樹脂封止材料の成
形方法として射出成形は実用化されていないのが現状で
ある。その理由として、低圧による射出成形の安定性に
問題がある。これは射出成形における半導体素子上のボ
ンディングワイヤの変形もしくは切断、あるいはダイオ
ード等では内部素子への加圧による電気性能の低下等得
られた半導体パッケージの信頼性を著しく損なうことか
ら、樹脂材料の粘度を低くし、射出圧力を低圧にする必
要がある。その結果、射出時にスクリューが前進する
際、スクリュー先端部に溶融、計量された樹脂成形材料
がノズル、金型流路、ゲート等の流動抵抗を受けてスク
リュー溝に沿って後方に戻される現象が生じ、そのこと
により射出樹脂量のバラツキや圧力の伝達効率が早くな
り、成形が安定しない欠点があった。
However, at present, injection molding has not been put to practical use as a method for molding an epoxy resin sealing material. The reason is that there is a problem in the stability of injection molding at low pressure. This is because the reliability of the obtained semiconductor package is significantly impaired due to the deformation or cutting of the bonding wire on the semiconductor element in the injection molding, or in the case of diodes etc., the reduction of the electrical performance due to the pressure applied to the internal element. And the injection pressure needs to be low. As a result, when the screw advances at the time of injection, a phenomenon in which the resin molding material melted and measured at the screw tip is returned backward along the screw groove due to the flow resistance of the nozzle, the mold flow path, the gate, and the like. As a result, the amount of the injected resin varies, the transmission efficiency of the pressure is increased, and the molding is not stable.

【0006】[0006]

【発明が解決しようとする課題】本発明は、従来からの
低圧トランスファー成形方法でも成形可能である。射出
成形用エポキシ樹脂封止材料を使用し、低圧、低速射出
成形により半導体を封止する方法において、スクリュー
先端部に溶融、計量された封止材料が後方へ戻される問
題点を解決するため種々の検討の結果なされたもので、
その目的とするところは、低粘度封止材料の低射出圧力
による成形性を向上させた半導体封止方法を提供するに
ある。
The present invention can be formed by a conventional low-pressure transfer molding method. In the method of sealing semiconductor by low pressure and low speed injection molding using epoxy resin sealing material for injection molding, various methods are used to solve the problem that the sealing material melted and measured at the screw tip part is returned to the back. The result of the examination of
An object of the present invention is to provide a semiconductor encapsulation method in which the moldability of a low-viscosity encapsulating material at a low injection pressure is improved.

【0007】[0007]

【課題を解決するための手段】本発明は、半導体が接合
され、ワイヤボンディングされたリードフレーム又は半
導体素子が接合されたリード線を、射出成形金型にイン
サートとして固定し、その後、前記金型に、エポキシ樹
脂、フェノール樹脂硬化剤、硬化促進剤、無機質充填材
を必須成分とする射出成形用エポキシ樹脂封止材料を射
出成形機により注入し、硬化させる半導体封止方法にお
いて、射出成形機のスクリューに逆流防止機構を設けた
ことを特徴とする半導体封止方法である。
According to the present invention, a lead frame to which a semiconductor is joined and a wire frame to which a wire is bonded or a semiconductor element is joined is fixed to an injection mold as an insert, and thereafter, the mold is fixed. In a semiconductor encapsulation method in which an epoxy resin, a phenolic resin curing agent, a curing accelerator, and an injection molding epoxy resin encapsulating material having an inorganic filler as essential components are injected by an injection molding machine and cured, the injection molding machine has A semiconductor sealing method characterized in that a backflow prevention mechanism is provided on a screw.

【0008】本発明において用いられる射出成形機用ス
クリューは、先端部に逆流防止機構を設けたものであ
り、一般的な熱硬化性樹脂の射出成形では、図1に示し
たフルフライトスクリューが使用されている。図1にお
いて、21はスクリュー、22はスクリューのフライ
ト、23はシリンダーを示す。このスクリューでは粘度
の低い材料、例えば、3000センチポイズ以下の場
合、樹脂の逆流が大きく射出ショット量が安定しない。
本発明に用いるスクリューはこのような欠点をなくすた
め、スクリュー先端部のフライト溝をせまくし、バリヤ
(樹脂の戻りを少なくするせき)を設けた構造(図
2)、あるいは金型キャビティに樹脂が充填され、圧力
が立ち上がり始める時点で、ノズル部とのすき間をなく
するように設計された、スクリュー先端部にプランジャ
ーを有する構造(図3)等をもったものである。図2に
おいて、1はスクリュー、2はスクリューのフライト、
3はシリンダー、4はスクリュー先端部、5はバリヤを
示す。図3において、11はスクリュー、12はスクリ
ューのフライト、13はシリンダー、14はスクリュー
先端部のプランジャー、15はプランジャーに対応する
ノズルのスリーブを示す。かかる構造とすることによ
り、射出成形時樹脂の逆流を効果的に防止することがで
きる。
The screw for an injection molding machine used in the present invention is provided with a backflow prevention mechanism at a tip end thereof. In general injection molding of a thermosetting resin, the full flight screw shown in FIG. 1 is used. Have been. In FIG. 1, 21 is a screw, 22 is a flight of the screw, and 23 is a cylinder. With this screw, when the material has a low viscosity, for example, 3000 centipoise or less, the backflow of the resin is large and the shot quantity is not stable.
In order to eliminate such disadvantages, the screw used in the present invention has a structure in which a flight groove at the tip of the screw is narrowed and a barrier (a crevice for reducing the return of the resin) is provided (FIG. 2), or the resin is filled in the mold cavity. It has a structure having a plunger at the tip of the screw (FIG. 3) and the like, which is designed to eliminate the gap with the nozzle at the time of filling and when the pressure starts to rise. In FIG. 2, 1 is a screw, 2 is a flight of the screw,
Reference numeral 3 denotes a cylinder, 4 denotes a screw tip, and 5 denotes a barrier. In FIG. 3, 11 is a screw, 12 is a flight of the screw, 13 is a cylinder, 14 is a plunger at the tip of the screw, and 15 is a nozzle sleeve corresponding to the plunger. With such a structure, the backflow of the resin during injection molding can be effectively prevented.

【0009】射出成形の一般的な作用として、ホッパー
に投入された封止材料は、スクリューの回転によって、
シリンダー前部に移送され、同時にシリンダーからの熱
伝導及びシェアによる発熱等で溶融し、シリンダー前部
に滞留する。この場合の滞留させる量は1ショット分で
スクリュー後退の位置によって計量を制御する。計量さ
れた封止材料は次のショットでノズルから射出される
が、その時封止材料にかかる圧力と樹脂の粘度によって
はスクリュー溝に沿って戻される。これがバックフロー
と呼ばれるもので、その量によっては製品にショートシ
ョットによる充填不良やヒケ等を生じさせる。本発明
は、射出成形機にスクリューにバックフローを防止ない
し低減する機構を設ける。具体的には、例えば、スクリ
ュー溝にセキ(バリヤ)を設ける、あるいは、バックフ
ローが最も大きくなる射出充填の最終段階であるスクリ
ューが最前進する手前からスクリュー溝に封止材料が戻
されないように、プランジャーをスクリュー先端部に設
けることによりバックフローを低減させる。
[0009] As a general operation of the injection molding, the sealing material put into the hopper is rotated by the rotation of the screw.
It is transported to the front of the cylinder, and at the same time melts due to heat conduction from the cylinder and heat generated by the shear, and stays at the front of the cylinder. In this case, the stagnation amount is one shot, and the weighing is controlled by the position of the screw retreat. The metered sealing material is ejected from the nozzle in the next shot, but is then returned along the screw groove depending on the pressure on the sealing material and the viscosity of the resin. This is called a backflow, and depending on the amount of the backflow, a product may cause a defective filling due to a short shot, sink, or the like. According to the present invention, a screw is provided with a mechanism for preventing or reducing backflow in an injection molding machine. More specifically, for example, a screw (barrier) is provided in the screw groove, or the sealing material is not returned to the screw groove from just before the screw, which is the final stage of the injection filling in which the backflow is largest, is most advanced. By providing a plunger at the tip of the screw, backflow is reduced.

【0010】[0010]

【実施例】以下、本発明の実施例を説明する。エポキシ
樹脂封止材料として、オルソクレゾールノボラック型エ
ポキシ樹脂(エポキシ当量200)、フェノールノボラ
ック(水酸基当量103)、ジアザビシクロウンゼセン
化合物(硬化促進剤)及び溶融シリカを主成分とし、他
に離型剤、着色剤等を配合したものを使用した。
Embodiments of the present invention will be described below. As an epoxy resin encapsulating material, an ortho-cresol novolak type epoxy resin (epoxy equivalent: 200), phenol novolak (hydroxyl equivalent: 103), a diazabicyclounzecene compound (curing accelerator), and fused silica are used as main components. What mixed a molding agent, a coloring agent, etc. was used.

【0011】射出成形機は型締力50トンで、射出シリ
ンダー内径φ32mmのものに、本発明のバリヤスクリ
ュー(図2)を登載した。金型は2列で各列10個の2
0個取りとしIC素子(20pSOP)を接合し、金線
ボンディングされた10個連続の銅製リードフレーム2
本を金型にセットし、金型温度175℃とし、成形サイ
クル80秒で200ショット連続成形した。従来のフル
フライトスクリュー(図1)の場合についても同様に成
形して、ショット毎のバラツキ(標準偏差)と変動率を
求め、比較した結果を表1に示した。
The barrier screw (FIG. 2) of the present invention was mounted on an injection molding machine having a mold clamping force of 50 tons and an injection cylinder inner diameter of 32 mm. The mold has 2 rows and 10 rows of 2
10 continuous copper leadframes 2 with no IC chip (20pSOP) bonded and gold wire bonded
The book was set in a mold, the mold temperature was set to 175 ° C., and 200 shots were continuously molded in a molding cycle of 80 seconds. In the case of the conventional full-flight screw (FIG. 1), molding was performed in the same manner, and the variation (standard deviation) and the variation rate for each shot were obtained. The results of comparison are shown in Table 1.

【0012】 [0012]

【0013】ショット量のバラツキは1ショット毎の成
形品重量を測定し、そのバラツキを標準偏差で示し、変
動率は標準偏差を平均ショット量で割った値で示した。
この結果変動率は約2/3〜1/2になり、バックフロ
ーの低減により、ショット量のバラツキを少なくするこ
とが出来た。また、成形品の外観、充填性、ワイヤスイ
ープ、ボイドも評価したが、従来品と同等以上で問題が
ないことも確認出来た。
The variation in shot amount was obtained by measuring the weight of a molded product for each shot, and the variation was shown by a standard deviation, and the variation was shown by a value obtained by dividing the standard deviation by the average shot amount.
As a result, the variation rate was about 2/3 to 1/2, and the variation in shot amount could be reduced by reducing the backflow. In addition, the appearance, filling property, wire sweep, and void of the molded product were also evaluated, and it was confirmed that there was no problem at least as high as the conventional product.

【0014】[0014]

【発明の効果】本発明によれば、射出成形用エポキシ樹
脂封止材料を用いた半導体封止を射出成形により、安定
したショット量で連続成形が可能であり、充填不良や外
観不良を防止することができる。製品の品質についても
より安定したものを得ることができる。
According to the present invention, it is possible to perform continuous molding with a stable shot amount by injection molding of semiconductor encapsulation using an epoxy resin encapsulating material for injection molding, and to prevent poor filling and poor appearance. be able to. More stable products can be obtained.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 従来のフルフライトスクリューを有する射出
成形機前部の断面図
FIG. 1 is a sectional view of a front part of an injection molding machine having a conventional full flight screw.

【図2】 バリヤを設けたスクリューを有する射出成形
機前部の断面図
FIG. 2 is a sectional view of a front part of an injection molding machine having a screw provided with a barrier.

【図3】 プランジャー機構を設けたスクリューを有す
る射出成形機前部の断面図
FIG. 3 is a sectional view of a front part of an injection molding machine having a screw provided with a plunger mechanism.

【符号の説明】[Explanation of symbols]

1,11,21 スクリュー 2,12,22 スクリューのフライト 3,13,23 シリンダー 4 スクリュー先端部 5 バリヤ 14 スクリュー先端部のプランジャー 15 ノズルのスリーブ 1,11,21 Screw 2,12,22 Flight of screw 3,13,23 Cylinder 4 Screw tip 5 Barrier 14 Plunger at screw tip 15 Nozzle sleeve

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 FI // B29L 31:34 ──────────────────────────────────────────────────続 き Continued on front page (51) Int.Cl. 6 Identification code FI // B29L 31:34

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 半導体が接合され、ワイヤボンディング
されたリードフレーム、又は半導体素子が接合されたリ
ード線を、射出成形金型にインサートとして固定し、そ
の後前記金型にエポキシ樹脂、フェノール樹脂硬化剤、
硬化促進剤、無機質充填材を必須成分とする射出成形用
エポキシ樹脂封止材料を射出成形機により注入し、硬化
させる半導体封止方法において、射出成形機のスクリュ
ーに逆流防止機構を設けたことを特徴とする半導体封止
方法。
1. A lead frame to which a semiconductor is joined and wire-bonded or a lead wire to which a semiconductor element is joined is fixed as an insert to an injection molding die, and thereafter, an epoxy resin and a phenol resin curing agent are fixed to the die. ,
In a semiconductor encapsulation method of injecting and curing an epoxy resin sealing material for injection molding containing a curing accelerator and an inorganic filler as essential components by using an injection molding machine, a screw for the injection molding machine was provided with a backflow prevention mechanism. A semiconductor sealing method characterized by the above-mentioned.
【請求項2】 逆流防止機構を設けたスクリューが、バ
リヤスクリュー又は先端部にプランジャーを有するスク
リューである請求項1記載の半導体封止方法。
2. The semiconductor sealing method according to claim 1, wherein the screw provided with the backflow prevention mechanism is a barrier screw or a screw having a plunger at a tip.
JP1416397A 1997-01-28 1997-01-28 Semiconductor sealing method Pending JPH10214853A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1416397A JPH10214853A (en) 1997-01-28 1997-01-28 Semiconductor sealing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1416397A JPH10214853A (en) 1997-01-28 1997-01-28 Semiconductor sealing method

Publications (1)

Publication Number Publication Date
JPH10214853A true JPH10214853A (en) 1998-08-11

Family

ID=11853487

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1416397A Pending JPH10214853A (en) 1997-01-28 1997-01-28 Semiconductor sealing method

Country Status (1)

Country Link
JP (1) JPH10214853A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8105524B2 (en) 2006-11-02 2012-01-31 Shin-Etsu Chemical Co., Ltd. Compression molding method for electronic component and compression molding apparatus employed therefor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8105524B2 (en) 2006-11-02 2012-01-31 Shin-Etsu Chemical Co., Ltd. Compression molding method for electronic component and compression molding apparatus employed therefor
US8684718B2 (en) 2006-11-02 2014-04-01 Towa Corporation Compression molding method for electronic component and compression molding apparatus employed therefor

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