JPH10132553A - Analysis method for surface roughness and waviness and its device - Google Patents

Analysis method for surface roughness and waviness and its device

Info

Publication number
JPH10132553A
JPH10132553A JP30713296A JP30713296A JPH10132553A JP H10132553 A JPH10132553 A JP H10132553A JP 30713296 A JP30713296 A JP 30713296A JP 30713296 A JP30713296 A JP 30713296A JP H10132553 A JPH10132553 A JP H10132553A
Authority
JP
Japan
Prior art keywords
surface roughness
roughness
work
detailed
undulation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP30713296A
Other languages
Japanese (ja)
Inventor
Tsutomu Kanzaki
努 神崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Seimitsu Co Ltd
Original Assignee
Tokyo Seimitsu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Priority to JP30713296A priority Critical patent/JPH10132553A/en
Publication of JPH10132553A publication Critical patent/JPH10132553A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide a method which can easily analyze surface roughness and waviness in a short time and its device. SOLUTION: When an operator inputs analyzing conditions for surface roughness and waviness (step 21) to indicate the measurement of a work (step 22), the whole estimation range of the work is measured (step 23), and the waviness of the work is analyzed from obtained measurement data (step 24), and approximate surface roughness is analyzed (step 25). Next, the detailed estimation range of the work roughness is set up from the approximate surface roughness (step 26), and only the above detailed estimation range of roughness is automatically remeasured (step 27), and the detailed surface roughness is analyzed from the obtained measurement data (step 28).

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、表面粗さ測定機で
測定した測定データから表面粗さやうねりを解析する解
析方法及びその装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an analysis method and an apparatus for analyzing surface roughness and waviness from data measured by a surface roughness measuring device.

【0002】[0002]

【従来の技術】ワークの表面形状を評価する手法として
代表的なものに、表面粗さ解析とうねり解析がある。通
常この2つは同じ測定機(表面粗さ測定機)で解析が可
能であるが、解析条件が異なる。つまり、うねりを評価
する場合は測定範囲を長くとることが必要であり、逆に
測定データのピッチは粗くてもよい。これに対し、表面
粗さを評価する場合は細かいピッチで測定データを取り
込む必要があるので、測定範囲はあまり長くとれない。
そのために、解析する項目ごとに別々にワーク測定を行
っている。
2. Description of the Related Art As typical methods for evaluating the surface shape of a work, there are surface roughness analysis and undulation analysis. Normally, the two can be analyzed by the same measuring device (surface roughness measuring device), but the analysis conditions are different. In other words, when evaluating undulation, it is necessary to increase the measurement range, and conversely, the pitch of the measurement data may be coarse. On the other hand, when evaluating the surface roughness, it is necessary to take in measurement data at a fine pitch, so that the measurement range cannot be made too long.
For this purpose, work measurement is separately performed for each item to be analyzed.

【0003】[0003]

【発明が解決しようとする課題】したがって、ワークの
表面形状の解析が面倒で時間がかかる。特に、ワークの
長い範囲にわたって表面粗さを評価しようとする場合
に、ワーク測定に長い時間がかかるという問題がある。
本発明はこのような事情に鑑みてなされたもので、表面
粗さ及びうねりが容易に短時間で解析できる方法及びそ
の装置を提供することを目的とする。
Therefore, the analysis of the surface shape of the work is troublesome and time-consuming. In particular, when trying to evaluate the surface roughness over a long range of the work, there is a problem that it takes a long time to measure the work.
The present invention has been made in view of such circumstances, and an object of the present invention is to provide a method and an apparatus for easily analyzing surface roughness and undulation in a short time.

【0004】[0004]

【課題を解決するための手段】本発明は前記目的を達成
するために、表面粗さとうねりの解析を次のようにす
る。すなわち、まず、ワークの評価範囲全体を測定して
得た測定データからワークのうねりを解析するととも
に、概略表面粗さを解析する。次に、その概略表面粗さ
からワークの粗さ詳細評価範囲を設定し、その粗さ詳細
評価範囲についてのみワークを自動的に再度測定して、
得られた測定データから詳細表面粗さを解析する。
According to the present invention, in order to achieve the above object, analysis of surface roughness and undulation is performed as follows. That is, first, the undulation of the work is analyzed from the measurement data obtained by measuring the entire evaluation range of the work, and the approximate surface roughness is analyzed. Next, a work roughness detailed evaluation range is set from the approximate surface roughness, and the work is automatically measured again only for the work roughness detailed evaluation range.
The detailed surface roughness is analyzed from the obtained measurement data.

【0005】つまり、ワークの評価範囲全体の測定デー
タから解析した概略表面粗さでは、測定データのピッチ
が粗すぎて正確な表面粗さが得られないため、概略表面
粗さは全体の傾向をつかむことに用いる。そして、詳細
に知りたい範囲についてのみ従来どおり測定(自動測
定)して解析する。一般的に、詳細に知りたい範囲は表
面粗さが大きい部分であるが、その場合は、概略表面粗
さからその大きい部分を抽出してその近傍に粗さ詳細評
価範囲を設定するようにすればよい。
That is, in the rough surface roughness analyzed from the measurement data of the entire evaluation range of the work, the pitch of the measurement data is too coarse to obtain an accurate surface roughness. Used to grab. Then, measurement (automatic measurement) is performed and analysis is performed on the range that the user wants to know in detail as before. In general, the range that the user wants to know in detail is a portion having a large surface roughness. In this case, the large portion is extracted from the approximate surface roughness, and a detailed roughness evaluation range is set in the vicinity thereof. I just need.

【0006】これによって、ワークの評価範囲全体の表
面粗さを知ることができるとともに、ワーク測定の時間
も短縮される。また、作業者としてはうねり測定と表面
粗さ測定とを分けて操作しなくてもよいので、作業が容
易になる。
[0006] This makes it possible to know the surface roughness of the entire evaluation range of the work, and also shortens the work measurement time. In addition, the operator does not need to separately perform the swell measurement and the surface roughness measurement, which facilitates the operation.

【0007】また、表面粗さとうねりの解析装置を次の
ように構成する。 (イ)表面粗さ・うねりの解析条件を入力する入力部。 (ロ)表面粗さ測定機でワークの評価範囲全体を測定し
て得られた測定データからワークのうねりを解析するう
ねり解析部。 (ハ)評価範囲全体の測定データからワークの概略表面
粗さを解析する概略表面粗さ解析部。 (ニ)概略表面粗さからワークの粗さ詳細評価範囲を設
定する粗さ詳細評価範囲設定部。 (ホ)表面粗さ測定機でワークの粗さ詳細評価範囲を測
定して得られた測定データからワークの詳細表面粗さを
解析する詳細表面粗さ解析部。
[0007] An analyzer for analyzing surface roughness and undulation is configured as follows. (A) An input section for inputting analysis conditions for surface roughness and undulation. (B) A waviness analysis unit that analyzes the waviness of a work from measurement data obtained by measuring the entire evaluation range of the work with a surface roughness measuring device. (C) A rough surface roughness analysis unit that analyzes the rough surface roughness of the work from the measurement data of the entire evaluation range. (D) A detailed roughness evaluation range setting section for setting a detailed roughness evaluation range of the workpiece from the approximate surface roughness. (E) A detailed surface roughness analysis unit that analyzes the detailed surface roughness of the work from measurement data obtained by measuring the detailed evaluation range of the work with a surface roughness measuring device.

【0008】[0008]

【発明の実施の形態】本発明に係る表面粗さ・うねり解
析装置の実施の形態のブロック図を図2に示す。図2に
おいて、表面粗さ測定機11はワークを測定して測定デ
ータを得る。入力部12は表面粗さ・うねりの解析条件
を入力する。うねり解析部13は測定データのうねりを
解析する。概略表面粗さ解析部14は測定データの概略
表面粗さを解析する。粗さ詳細評価範囲設定部15は、
概略表面粗さからワークの粗さ詳細評価範囲を設定す
る。表面粗さ解析部16は、ワークの粗さ詳細評価範囲
を測定して得られた測定データからワークの詳細表面粗
さを解析する。出力部17は解析されたうねりと表面粗
さを、CRTやプリンター等に出力する。
FIG. 2 is a block diagram showing an embodiment of a surface roughness / undulation analyzer according to the present invention. In FIG. 2, a surface roughness measuring device 11 measures a workpiece to obtain measurement data. The input unit 12 inputs analysis conditions for surface roughness and undulation. The swell analysis unit 13 analyzes the swell of the measured data. The rough surface roughness analysis unit 14 analyzes the rough surface roughness of the measurement data. The roughness detail evaluation range setting unit 15 includes:
A work roughness detailed evaluation range is set from the approximate surface roughness. The surface roughness analysis unit 16 analyzes the detailed surface roughness of the work from the measurement data obtained by measuring the detailed evaluation range of the work roughness. The output unit 17 outputs the analyzed undulation and surface roughness to a CRT, a printer, or the like.

【0009】次に、本発明に係る表面粗さ・うねり解析
方法の実施の形態を図1のフローチャート及び図3から
図6までのグラフを用いて説明する。図3は測定したデ
ータをプロットした断面曲線D、図4は断面曲線Dから
抽出したうねり曲線W、図5は断面曲線Dから抽出した
概略表面粗さ曲線R、図6は粗さ詳細評価範囲の詳細表
面粗さ曲線Rx(この例では、粗さの大きい点のうち、
R2の近傍とR4の近傍の2つについてのみ示す。)を表
している。
Next, an embodiment of the method for analyzing surface roughness and waviness according to the present invention will be described with reference to the flowchart of FIG. 1 and the graphs of FIGS. 3 is a sectional curve D plotting the measured data, FIG. 4 is a waviness curve W extracted from the sectional curve D, FIG. 5 is a schematic surface roughness curve R extracted from the sectional curve D, and FIG. The detailed surface roughness curve Rx (in this example, of the points having a large roughness,
Only the two near R2 and near R4 are shown. ).

【0010】まず、作業者は入力部12から表面粗さ・
うねりの解析条件を入力した(ステップ21)後、表面
粗さ測定機11にワークの測定を指示する(ステップ2
2)。すると、ワークの評価範囲全体が測定され(ステ
ップ23)、測定データから断面曲線Dが得られる。そ
して、うねり解析部13で、断面曲線Dについて、入力
部12に入力された解析条件に従ってうねりが解析さ
れ、うねり曲線Wやうねりパラメーターが算出される
(ステップ24)。
First, the operator inputs the surface roughness /
After inputting the undulation analysis conditions (step 21), the surface roughness measuring device 11 is instructed to measure the work (step 2).
2). Then, the entire evaluation range of the workpiece is measured (Step 23), and a cross-sectional curve D is obtained from the measurement data. The swell analysis unit 13 analyzes the swell of the cross-sectional curve D in accordance with the analysis conditions input to the input unit 12, and calculates the swell curve W and the swell parameter (step 24).

【0011】続いて、概略表面粗さ解析部14で、断面
曲線Dについて、入力部12に入力された解析条件に従
って概略表面粗さ曲線Rが解析され(ステップ25)、
次に、粗さ詳細評価範囲設定部15で、概略表面粗さ曲
線Rから粗さの大きい部分(この例ではR1からR5の5
点)の近傍がワークの粗さ詳細評価範囲に設定される
(ステップ26)。
Subsequently, the rough surface roughness analysis section 14 analyzes the rough surface roughness curve R of the cross-sectional curve D in accordance with the analysis conditions input to the input section 12 (step 25).
Next, in the detailed roughness evaluation range setting section 15, a portion having a large roughness from the rough surface roughness curve R (5 in this example, R1 to R5).
The vicinity of (point) is set as the work roughness detailed evaluation range (step 26).

【0012】次に、設定されたワークの粗さ詳細評価範
囲が表面粗さ測定機11で自動的に測定される(ステッ
プ27)。その結果、測定データからいくつか(この例
の場合は5個)の詳細表面粗さ曲線Rxが得られ、詳細
表面粗さ解析部16で、詳細表面粗さ曲線Rxについ
て、入力部12に入力された解析条件に従って表面粗さ
が解析され、詳細表面粗さ曲線Rxや表面粗さパラメー
ターが算出される(ステップ28)。
Next, the set work roughness detailed evaluation range is automatically measured by the surface roughness measuring device 11 (step 27). As a result, several (five in this example) detailed surface roughness curves Rx are obtained from the measurement data, and the detailed surface roughness analysis unit 16 inputs the detailed surface roughness curve Rx to the input unit 12. The surface roughness is analyzed according to the analysis conditions thus set, and a detailed surface roughness curve Rx and a surface roughness parameter are calculated (step 28).

【0013】以上で、うねりと表面粗さの解析が完了
し、算出されたうねり曲線W、うねりパラメーター、概
略表面粗さ曲線R、詳細表面粗さ曲線Rx、表面粗さパ
ラメーター等が、出力部17から出力される(ステップ
29)。
With the above, the analysis of the undulation and the surface roughness is completed, and the calculated undulation curve W, the undulation parameter, the approximate surface roughness curve R, the detailed surface roughness curve Rx, the surface roughness parameter, etc. are output to the output unit. 17 (step 29).

【0014】なお、以上説明した実施の形態では、概略
表面粗さ曲線Rから粗さの大きい部分を抽出し、その近
傍を粗さ詳細評価範囲に設定したが、これに限らず、他
の条件に設定しても本発明は適用できる。
In the above-described embodiment, a portion having a large roughness is extracted from the rough surface roughness curve R, and the vicinity thereof is set to the detailed roughness evaluation range. However, the present invention is not limited to this. The present invention can be applied even if it is set to.

【0015】[0015]

【発明の効果】以上説明したように本発明によれば、作
業者が表面粗さ・うねりの解析条件を入力しワークの測
定を指示すると、ワークの評価範囲全体が測定され、得
られた測定データからワークのうねりが解析されるとと
もに、概略表面粗さが解析され、次に、その概略表面粗
さからワークの粗さ詳細評価範囲が設定され、その粗さ
詳細評価範囲についてのみ自動的に再度測定されて、得
られた測定データから詳細表面粗さが解析されるように
した。したがって、表面粗さ及びうねりが容易に短時間
で解析できる。
As described above, according to the present invention, when the operator inputs the analysis conditions of the surface roughness / undulation and instructs the measurement of the work, the entire evaluation range of the work is measured, and the obtained measurement is performed. The undulation of the workpiece is analyzed from the data, and the approximate surface roughness is analyzed. Next, the detailed roughness evaluation range of the workpiece is set from the approximate surface roughness, and only the detailed roughness evaluation range is automatically set. The measurement was performed again, and the detailed surface roughness was analyzed from the obtained measurement data. Therefore, the surface roughness and undulation can be easily analyzed in a short time.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係る表面粗さ・うねり解析方法の実施
の形態のフローチャート
FIG. 1 is a flowchart of an embodiment of a surface roughness / undulation analysis method according to the present invention.

【図2】本発明に係る表面粗さ・うねり解析装置の実施
の形態のブロック図
FIG. 2 is a block diagram of an embodiment of a surface roughness / undulation analyzer according to the present invention.

【図3】断面曲線の説明図FIG. 3 is an explanatory diagram of a cross-sectional curve.

【図4】うねり曲線の説明図FIG. 4 is an explanatory diagram of a undulation curve.

【図5】概略表面粗さ曲線の説明図FIG. 5 is an explanatory diagram of a schematic surface roughness curve.

【図6】詳細表面粗さ曲線の説明図FIG. 6 is an explanatory diagram of a detailed surface roughness curve.

【符号の説明】[Explanation of symbols]

21……解析条件入力ステップ 22……ワーク測定指示ステップ 23……ワーク評価範囲全体測定ステップ 24……うねり解析ステップ 25……概略表面粗さ解析ステップ 26……粗さ詳細評価範囲設定ステップ 27……粗さ詳細評価範囲測定ステップ 28……詳細表面粗さ解析ステップ 29……解析結果出力ステップ 21: Analysis condition input step 22: Workpiece measurement instruction step 23: Workpiece evaluation range entire measurement step 24: Undulation analysis step 25: Rough surface roughness analysis step 26: Roughness detail evaluation range setting step 27 ... … Roughness evaluation range measurement step 28… Detailed surface roughness analysis step 29… Analysis result output step

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】作業者が表面粗さ・うねりの解析条件を入
力し、ワークの測定を指示すると、 ワークの評価範囲全体が測定され、 得られた測定データからワークのうねりが解析されると
ともに、概略表面粗さが解析され、 前記概略表面粗さからワークの粗さ詳細評価範囲が設定
され、 ワークの前記詳細評価範囲についてのみ自動的に再度測
定されて、得られた測定データから詳細表面粗さが解析
される、ことを特徴とする表面粗さ・うねり解析方法。
When an operator inputs analysis conditions for surface roughness and undulation and instructs measurement of a work, the entire evaluation range of the work is measured, and the undulation of the work is analyzed from the obtained measurement data. The rough surface roughness is analyzed, the detailed surface roughness evaluation range of the work is set from the rough surface roughness, and only the detailed evaluation range of the work is automatically measured again, and the detailed surface is obtained from the obtained measurement data. A surface roughness and waviness analysis method characterized in that roughness is analyzed.
【請求項2】前記概略表面粗さの大きい部分の近傍を前
記粗さ詳細評価範囲に設定することを特徴とする請求項
1に記載の表面粗さ・うねり解析方法。
2. The surface roughness / undulation analysis method according to claim 1, wherein the vicinity of the portion having the large approximate surface roughness is set in the roughness detailed evaluation range.
【請求項3】表面粗さ・うねりの解析条件を入力する入
力部と、 表面粗さ測定機でワークの評価範囲全体を測定して得ら
れた測定データからワークのうねりを解析するうねり解
析部と、 前記評価範囲全体の測定データからワークの概略表面粗
さを解析する概略表面粗さ解析部と、 前記概略表面粗さからワークの粗さ詳細評価範囲を設定
する粗さ詳細評価範囲設定部と、 前記表面粗さ測定機でワークの前記粗さ詳細評価範囲を
測定して得られた測定データからワークの詳細表面粗さ
を解析する詳細表面粗さ解析部と、から構成されたこと
を特徴とする表面粗さ・うねり解析装置。
3. An input section for inputting analysis conditions for surface roughness and undulation, and a undulation analysis section for analyzing undulation of the workpiece from measurement data obtained by measuring the entire evaluation range of the workpiece with a surface roughness measuring device. A rough surface roughness analysis unit that analyzes the rough surface roughness of the workpiece from the measurement data of the entire evaluation range; and a roughness detail evaluation range setting unit that sets a detailed roughness evaluation range of the workpiece from the rough surface roughness. And a detailed surface roughness analysis unit that analyzes the detailed surface roughness of the work from measurement data obtained by measuring the roughness detailed evaluation range of the work with the surface roughness measuring device. Characteristic surface roughness / undulation analyzer.
【請求項4】前記概略表面粗さの大きい部分の近傍を前
記粗さ詳細評価範囲に設定することを特徴とする請求項
3に記載の表面粗さ・うねり解析装置。
4. The surface roughness / undulation analyzer according to claim 3, wherein the vicinity of the portion having the large approximate surface roughness is set in the roughness detailed evaluation range.
JP30713296A 1996-11-01 1996-11-01 Analysis method for surface roughness and waviness and its device Pending JPH10132553A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30713296A JPH10132553A (en) 1996-11-01 1996-11-01 Analysis method for surface roughness and waviness and its device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30713296A JPH10132553A (en) 1996-11-01 1996-11-01 Analysis method for surface roughness and waviness and its device

Publications (1)

Publication Number Publication Date
JPH10132553A true JPH10132553A (en) 1998-05-22

Family

ID=17965422

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30713296A Pending JPH10132553A (en) 1996-11-01 1996-11-01 Analysis method for surface roughness and waviness and its device

Country Status (1)

Country Link
JP (1) JPH10132553A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006083455A (en) * 2004-09-17 2006-03-30 Nissan Motor Co Ltd Pretreated shape prior to thermal spraying, pretreatment method prior to thermal-spraying, and cylinder block of engine
WO2010029205A1 (en) * 2008-09-15 2010-03-18 Consejo Superior De Investigaciones Científicas (Csic) Method and system for estimating, in real time, surface roughness in ultra-precision machining processes
CN106441207A (en) * 2016-10-18 2017-02-22 哈尔滨理工大学 Gauss filtering method used for surface roughness measurement with surface deep valley signal

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006083455A (en) * 2004-09-17 2006-03-30 Nissan Motor Co Ltd Pretreated shape prior to thermal spraying, pretreatment method prior to thermal-spraying, and cylinder block of engine
JP4586471B2 (en) * 2004-09-17 2010-11-24 日産自動車株式会社 Thermal spraying pretreatment method and engine cylinder block
WO2010029205A1 (en) * 2008-09-15 2010-03-18 Consejo Superior De Investigaciones Científicas (Csic) Method and system for estimating, in real time, surface roughness in ultra-precision machining processes
ES2337330A1 (en) * 2008-09-15 2010-04-22 Consejo Superior De Investigaciones Cientificas (Csic) Method and system for estimating, in real time, surface roughness in ultra-precision machining processes
CN106441207A (en) * 2016-10-18 2017-02-22 哈尔滨理工大学 Gauss filtering method used for surface roughness measurement with surface deep valley signal

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