JPH1010176A - Method and system for evaluating receiving characteristics - Google Patents
Method and system for evaluating receiving characteristicsInfo
- Publication number
- JPH1010176A JPH1010176A JP15824696A JP15824696A JPH1010176A JP H1010176 A JPH1010176 A JP H1010176A JP 15824696 A JP15824696 A JP 15824696A JP 15824696 A JP15824696 A JP 15824696A JP H1010176 A JPH1010176 A JP H1010176A
- Authority
- JP
- Japan
- Prior art keywords
- value
- error rate
- unit
- counter
- threshold voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は受信特性評価方法お
よび装置に関し、特に高信頼性の要求される被測定物
(例えば海底中継器等)の受信特性評価方法および装置
に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for evaluating reception characteristics, and more particularly to a method and an apparatus for evaluating reception characteristics of a device under test (for example, a submarine repeater) requiring high reliability.
【0002】海底中継器等の受信特性を評価するために
は、高い誤り率から低い誤り率に亘って広範囲に誤り率
測定を行う必要がある。また、信頼性を保証するために
は、非常に低い誤り率(例えば10−13 程度)の測定
が必要となり、測定に長時間を要している。このため、
短い測定時間で受信特性を評価できる方法としてQ値を
用いた評価方法が注目されており、装置化が要望されて
いる。In order to evaluate the receiving characteristics of a submarine repeater or the like, it is necessary to perform error rate measurement over a wide range from a high error rate to a low error rate. Further, in order to guarantee the reliability, it is necessary to measure an extremely low error rate (for example, about 10 −13 ), and the measurement requires a long time. For this reason,
An evaluation method using a Q value has attracted attention as a method for evaluating the reception characteristics in a short measurement time, and there is a demand for a device.
【0003】[0003]
【従来の技術】従来の受信特性評価装置としては、例え
ば特開昭62−212584号公報が知られている。2. Description of the Related Art As a conventional reception characteristic evaluation apparatus, for example, Japanese Patent Application Laid-Open No. 62-212584 is known.
【0004】この従来の受信特性評価装置は、搬送波に
付加する雑音レベルを段階的に変化させ、各搬送波対雑
音(C/N)点での1回の測定により誤り率特性を算出
し、受信特性を評価するもので、人手を不要とし、測定
の効率化を図ることを目的としたものである。This conventional reception characteristic evaluation device changes the noise level added to a carrier stepwise, calculates an error rate characteristic by one measurement at each carrier-to-noise (C / N) point, and performs reception. The purpose of this is to evaluate the characteristics and to eliminate the need for manual labor and to improve the efficiency of measurement.
【0005】つぎに、この従来の受信特性評価装置につ
いて図面を参照して説明する。図2は従来の受信特性評
価装置の実施例を示すブロック図である。Next, this conventional reception characteristic evaluation apparatus will be described with reference to the drawings. FIG. 2 is a block diagram showing an embodiment of a conventional reception characteristic evaluation device.
【0006】この場合、送信側誤り率測定器25を単な
るパルス信号発生器として用い、パルス信号25aをP
CM変調装置26に印加する。PCM変調装置26の変
調信号26aに雑音付加器27により雑音を付加し、雑
音を付加した変調波27aを被測定物であるPCM復調
装置28に印加し、PCM復調装置28の出力28aの
エラー数またはエラーレートを受信側誤り率測定器29
で測定する。受信側誤り率測定器29からの出力値29
aを受けたコンピュータ30は、つぎに、制御信号30
aを雑音付加器27に送り、付加すべき雑音レベルを変
化させる。そして、コンピュータ30は、各C/N点に
対して受信側誤り率測定器29の出力するエラー数また
はエラーレートに対する出力値29aを、一定の直線を
示す近似値として算出し、これにより誤り率特性を算出
する。In this case, the transmission side error rate measuring device 25 is used as a simple pulse signal generator, and the pulse signal
It is applied to the CM modulator 26. Noise is added to the modulated signal 26a of the PCM modulator 26 by the noise adder 27, and the modulated wave 27a to which the noise is added is applied to the PCM demodulator 28, which is the device under test, and the number of errors in the output 28a of the PCM demodulator 28 Alternatively, the error rate is measured by the error rate measuring device 29 on the receiving side.
Measure with Output value 29 from reception side error rate measuring device 29
The computer 30 that has received the control signal 30a
a is sent to the noise adder 27 to change the noise level to be added. Then, the computer 30 calculates, for each C / N point, an output value 29a corresponding to the number of errors or the error rate output from the receiving-side error rate measuring device 29 as an approximate value indicating a constant straight line. Calculate the characteristics.
【0007】[0007]
【発明が解決しようとする課題】上述した従来の受信特
性評価装置は、受信特性評価用に誤り率直線(あるいは
曲線)を作成する場合、被測定物への印加雑音レベルを
変化させ各値での誤り率を測定して作成するが、要求さ
れる誤り率が満たされるまで複数の点で測定するため、
測定に時間がかかる。また、高信頼性が要求される被測
定物の場合、誤り率が良くなるにつれて、この誤り率を
保証するためのデータを多く必要とすることから、1点
の測定時間が長くなり、より一層全体の測定時間に影響
を及ぼすという問題点がある。When the error rate straight line (or curve) for evaluating the reception characteristic is created, the conventional reception characteristic evaluation apparatus described above changes the noise level applied to the device under test and changes each value. The error rate is measured and created, but at multiple points until the required error rate is met,
Measurement takes time. In the case of a device under test that requires high reliability, as the error rate increases, more data is required to guarantee the error rate. There is a problem that it affects the entire measurement time.
【0008】本発明の目的は、測定精度を下げずに測定
時間を短縮可能な受信特性評価方法および装置を提供す
ることにある。An object of the present invention is to provide a receiving characteristic evaluation method and apparatus capable of shortening the measurement time without lowering the measurement accuracy.
【0009】[0009]
【課題を解決するための手段】本発明の受信特性評価方
法は、ディジタルデータ信号を中継する被測定物の受信
特性を評価するための受信特性評価方法において、前記
被測定物に前記ディジタルデータ信号を入力し、前記被
測定物の出力の予測される論理値の高電位および低電位
の二値をしきい値電位の中央値としてそれぞれ含む二組
の複数のしきい値電位ごとに誤り率を測定し、前記高電
位および低電位の各しきい値電位に対する誤り率を用い
てそれぞれ直線近似して直線を表示する係数を算出し、
前記二組の係数を用いて前記高電位および低電位それぞ
れの平均電位と雑音標準偏差とを求め、前記平均電位と
雑音標準偏差とからQ値を算出するようにしている。A receiving characteristic evaluation method according to the present invention is a receiving characteristic evaluating method for evaluating a receiving characteristic of a device under test for relaying a digital data signal. And an error rate for each of two sets of a plurality of threshold potentials each including a high potential and a low potential of a predicted logical value of the output of the device under test as a median of the threshold potentials. Measure and calculate a coefficient to display a straight line by linear approximation using the error rate for each threshold potential of the high potential and the low potential,
An average potential and a noise standard deviation of each of the high potential and the low potential are obtained using the two sets of coefficients, and a Q value is calculated from the average potential and the noise standard deviation.
【0010】本発明の受信特性評価装置は、被測定物に
対し測定信号を入力する送信側誤り率測定器と、前記送
信側誤り率測定器の測定信号を入力した前記被測定物の
出力信号と送信側誤り率測定器からの同期信号を入力す
る受信側誤り率測定器と、前記受信側誤り率測定器の誤
り率測定の基準となるスレショルド電圧の変更回数を予
め記憶しておく測定回数記憶部と、スレショルド電圧を
微細に変更して測定する測定領域の数として「2」を予
め記憶しておく領域数記憶部と、スレショルド電圧の測
定領域を示す数をカウントする第一カウンタと、スレシ
ョルド電圧を微細に変更した変更回数をカウントする第
二カウンタと、前記第一カウンタの値が増加したとき前
記第二カウンタの値を消去するカウンタ消去部と、前記
第一カウンタの値が「1」の場合に測定するスレショル
ド電圧を前記測定回数記憶部の記憶する変更回数分記憶
する第一スレショルド電圧表と、前記第二カウンタの値
が「2」の場合に測定するスレショルド電圧を前記測定
回数記憶部の記憶する変更回数分記憶する第二スレショ
ルド電圧表と、誤り率の測定動作ごとに前記第一カウン
タの値および前記第二カウンタの値を入力しこれら2つ
の値に対応して定まるスレショルド電圧の値を前記第一
スレショルド電圧表および前記第二スレショルド電圧表
のいずれか一方から読み出すスレショルド電圧読出部
と、前記スレショルド電圧読出部が読み出した値をスレ
ショルド電圧の変更値として前記受信側誤り率測定器に
指示するスレショルド電圧変更部と、前記スレショルド
電圧変更部が指示終了後前記受信側誤り率測定器に誤り
率測定を指示する誤り率測定指示部と、前記誤り率測定
指示部が指示終了後前記受信側誤り率測定器から測定し
た誤り率を受信する誤り率測定結果受信部と、前記第一
カウンタの値が「1」の場合にスレショルド電圧対誤り
率を記憶する第一データ保存部と、前記第一カウンタの
値が「2」の場合にスレショルド電圧対誤り率を記憶す
る第二データ保存部と、前記スレショルド電圧変更部が
指示した値と前記誤り率測定結果受信部の受信結果を前
記第一カウンタの値が「1」のとき前記第一データ保存
部に書き込みを行い同様に前記第一カウンタの値が
「2」のとき前記第二データ保存部にデータを書き込む
データ書込部と、前記データ書込部の書き込み後前記第
二カウンタの値と前記測定回数記憶部の値とを比較し前
記第二カウンタの値が前記測定回数記憶部の示す値に満
たないとき前記第二カウンタに制御を戻す第一比較部
と、前記第一比較部の比較結果が一致のとき前記第一カ
ウンタの値と前記領域数記憶部の値とを比較し前記第一
カウンタの値と前記領域数記憶部の示す値とが一致しな
いとき前記第一カウンタに制御を戻す第二比較部と、前
記第二比較部の比較結果が一致だった場合前記第一デー
タ保存部のデータを直線近似する第一近似部と、前記第
一近似部が近似終了後前記第二データ保存部のデータを
直線近似する第二近似部と、前記第一近似部および前記
第二近似部が算出した近似式の各係数から平均スペース
レベルと平均マークレベルとスペース雑音標準偏差とマ
ーク雑音標準偏差とを算出する変数算出部と、前記変数
算出部の計算結果を用いてQ値を算出するQ値算出部と
を含む構成である。A receiving characteristic evaluation apparatus according to the present invention comprises: a transmitter-side error rate measuring device for inputting a measurement signal to a device-under-test; And a receiving-side error-rate measuring device for inputting a synchronization signal from the transmitting-side error-rate measuring device, and a number of measurements in which the number of changes of a threshold voltage serving as a reference of the error-rate measurement of the receiving-side error-rate measuring device is stored in advance. A storage unit, a region number storage unit that previously stores “2” as the number of measurement regions to be measured by finely changing the threshold voltage, a first counter that counts the number indicating the measurement region of the threshold voltage, A second counter that counts the number of times the threshold voltage has been finely changed, a counter erasing unit that erases the value of the second counter when the value of the first counter increases, and a value of the first counter. A first threshold voltage table that stores the threshold voltage measured in the case of “1” for the number of changes stored in the measurement count storage unit, and a threshold voltage measured in the case where the value of the second counter is “2”. A second threshold voltage table stored for the number of changes stored in the number-of-measurements storage unit, and a value of the first counter and a value of the second counter are input for each error rate measurement operation, and the values corresponding to these two values are input. A threshold voltage reading unit that reads a determined threshold voltage value from one of the first threshold voltage table and the second threshold voltage table; and a value read by the threshold voltage reading unit as a threshold voltage change value. A threshold voltage changing unit for instructing an error rate measuring device; and An error rate measurement instructing unit that instructs an error rate measurement to a rate measuring device, and an error rate measurement result receiving unit that receives the error rate measured from the receiving side error rate measuring device after the error rate measurement instructing unit has completed the instruction. A first data storage unit that stores a threshold voltage vs. error rate when the value of the first counter is “1”; and a second data storage unit that stores a threshold voltage vs. error rate when the value of the first counter is “2”. (Ii) writing the value specified by the threshold voltage changing unit and the reception result of the error rate measurement result receiving unit to the first data storing unit when the value of the first counter is “1”; A data writing unit that writes data to the second data storage unit when the value of the first counter is “2”; and a value of the second counter and the number of measurement times storage unit after writing of the data writing unit. Compare the value with the second A first comparison unit that returns control to the second counter when the value of the counter is less than the value indicated by the measurement times storage unit, and the value of the first counter when the comparison result of the first comparison unit is the same. A second comparison unit that compares the value of the area number storage unit and returns control to the first counter when the value of the first counter does not match the value indicated by the area number storage unit; A first approximation unit that linearly approximates the data of the first data storage unit when the comparison result is a match, and a second approximation unit that linearly approximates the data of the second data storage unit after the first approximation unit finishes the approximation. A variable calculation unit that calculates an average space level, an average mark level, a space noise standard deviation, and a mark noise standard deviation from each coefficient of the approximation formula calculated by the first approximation unit and the second approximation unit; Using the calculation result of the calculation unit A configuration including a Q value calculation unit for calculating a value.
【0011】本発明の受信特性評価方法および装置は、
被測定物が光海底中継器であってもよい。[0011] A receiving characteristic evaluation method and apparatus according to the present invention include:
The device under test may be an optical submarine repeater.
【0012】[作用]本発明の受信特性評価方法および
装置は、被測定物に基準のレベルのディジタルデータ信
号を入力し、出力するディジタルデータ信号の「アイパ
ターン」を示す論理値“1”および論理値“0”のそれ
ぞれについて、入力信号に同期して予め定める複数のス
レショルド電圧で検出し、このときの誤り率を記録す
る。被測定物の特性が安定していれば、誤り率100%
と誤り率0%を示すスレショルド電圧が、非常に接近し
て表示されることになる。通常は、誤り率100%と誤
り率0%を示すスレショルド電圧の間に、複数のスレシ
ョルド電圧が設定され、誤り率100%と誤り率0%と
の間の誤り率が算出される。この場合、各スレショルド
電圧ごとの誤り率の算出に使用するデータとしては、各
測定電位ごとに従来の測定ほどの時間を掛けずに測定し
たものでも、直線近似を算出できれば十分であり、直線
近似の各係数から、平均スペースレベルと平均マークレ
ベルとスペース雑音標準偏差とマーク雑音標準偏差とを
算出し、この計算結果を用いてQ値を算出することで、
短時間の測定でも受信特性評価の精度を上げることが可
能となる。[Operation] In the method and the apparatus for evaluating reception characteristics of the present invention, a digital data signal of a reference level is input to a device under test, and a logical value "1" indicating an "eye pattern" of the digital data signal to be output and a logic value "1" are output. Each of the logical values “0” is detected at a plurality of predetermined threshold voltages in synchronization with the input signal, and the error rate at this time is recorded. 100% error rate if the characteristics of the device under test are stable
And the threshold voltage indicating the error rate of 0% are displayed very close. Normally, a plurality of threshold voltages are set between a threshold voltage indicating an error rate of 100% and an error rate of 0%, and an error rate between the error rate of 100% and the error rate of 0% is calculated. In this case, as data used for calculating the error rate for each threshold voltage, even data measured for each measurement potential without taking as much time as conventional measurement is sufficient if it can calculate a linear approximation. By calculating an average space level, an average mark level, a space noise standard deviation, and a mark noise standard deviation from each coefficient of, and calculating a Q value using the calculation result,
Even in a short measurement, the accuracy of the reception characteristic evaluation can be improved.
【0013】[0013]
【発明の実施の形態】次に、本発明の実施の形態につい
て図面を参照して説明する。Next, embodiments of the present invention will be described with reference to the drawings.
【0014】図1は本発明の実施の形態を示すブロック
図である。FIG. 1 is a block diagram showing an embodiment of the present invention.
【0015】本発明の受信特性評価装置は、被測定物に
対し測定信号1aを入力する送信側誤り率測定器1と、
送信側誤り率測定器1の測定信号1a入力した被測定物
の出力信号1bと送信側誤り率測定器1からの同期信号
1cを入力する受信側誤り率測定器2と、受信側誤り率
測定器2の誤り率測定の基準となるスレショルド電圧の
変更回数を予め記憶しておく測定回数記憶部3と、スレ
ショルド電圧を微細に変更して測定する測定領域の数と
して「2」を予め記憶しておく領域数記憶部4と、スレ
ショルド電圧の測定領域を示す数をカウントするカウン
タ5と、スレショルド電圧を微細に変更した変更回数を
カウントするカウンタ6と、カウンタ5の値が「1」増
加したときカウンタ6の値を消去するカウンタ消去部7
と、カウンタ5の値が「1」の場合に測定するスレショ
ルド電圧を測定回数記憶部3の記憶する変更回数分記憶
するスレショルド電圧表8と、カウンタ5の値が「2」
の場合に測定するスレショルド電圧を測定回数記憶部3
の記憶する変更回数分記憶するスレショルド電圧表9
と、誤り率の測定動作ごとにカウンタ5の値およびカウ
ンタ6の値を入力しこれら2つの値に対応して定まるス
レショルド電圧の値をスレショルド電圧表8およびスレ
ショルド電圧表9のいずれか一方から読み出すスレショ
ルド電圧読出部10と、スレショルド電圧読出部10が
読み出した値をスレショルド電圧の変更値として受信側
誤り率測定器2に指示するスレショルド電圧変更部11
と、スレショルド電圧変更部11が指示終了後受信側誤
り率測定器2に誤り率測定を指示する誤り率測定指示部
12と、誤り率測定指示部12が指示終了後受信側誤り
率測定器2から測定した誤り率を受信する誤り率測定結
果受信部13と、カウンタ5の値が「1」の場合にスレ
ショルド電圧対誤り率を記憶するデータ保存部14と、
カウンタ5の値が「2」の場合にスレショルド電圧対誤
り率を記憶するデータ保存部15と、スレショルド電圧
変更部11が指示した値と誤り率測定結果受信部13の
受信結果をカウンタ5の値が「1」のときデータ保存部
14に書き込みを行い同様にカウンタ5の値が「2」の
ときデータ保存部15にデータを書き込むデータ書込部
16と、データ書込部16の書き込み後カウンタ6の値
と測定回数記憶部3の値とを比較し、カウンタ6の値が
測定回数記憶部3の示す値に満たないときカウンタ6に
制御を戻す比較部17と、比較部17の比較結果が一致
のときカウンタ5の値と領域数記憶部4の値とを比較
し、カウンタ5の値と領域数記憶部4の示す値とが一致
しないときカウンタ5に制御を戻す比較部18と、比較
部18の比較結果が一致だった場合データ保存部14の
データを直線近似する近似部19と、近似部19が近似
終了後データ保存部15のデータを直線近似する近似部
20と、近似部19および近似部20が算出した近似式
の各係数から、平均スペースレベルと平均マークレベル
とスペース雑音標準偏差とマーク雑音標準偏差とを算出
する変数算出部21と、変数算出部21の計算結果を用
いてQ値を算出するQ値算出部22とを含んで構成され
る。The receiving characteristic evaluation apparatus of the present invention comprises: a transmitting side error rate measuring device 1 for inputting a measurement signal 1a to a device under test;
An error rate measuring device 2 on the receiving side, which receives the output signal 1b of the device under test inputted from the measuring signal 1a of the measuring device 1 on the transmitting side and a synchronizing signal 1c from the measuring device 1 on the transmitting side, and measures the error rate on the receiving side The number-of-measures storage unit 3 in which the number of changes of the threshold voltage serving as a reference of the error rate measurement of the measuring device 2 is stored in advance, and “2” is stored in advance as the number of measurement areas to be measured by finely changing the threshold voltage. The number of areas to be stored, a counter 5 for counting the number indicating the threshold voltage measurement area, a counter 6 for counting the number of times the threshold voltage has been finely changed, and the value of the counter 5 has increased by “1”. Counter erasing section 7 for erasing the value of counter 6 when
And a threshold voltage table 8 for storing the threshold voltage measured when the value of the counter 5 is "1" for the number of changes stored in the number-of-measures storage unit 3, and the value of the counter 5 being "2".
The threshold voltage to be measured in the case of
Threshold voltage table 9 for the number of changes stored in Table 9
And the value of the counter 5 and the value of the counter 6 are input for each error rate measurement operation, and the threshold voltage value determined corresponding to these two values is read out from one of the threshold voltage table 8 and the threshold voltage table 9. A threshold voltage reading unit 10 and a threshold voltage changing unit 11 for instructing the error rate measuring device 2 on the reception side with a value read by the threshold voltage reading unit 10 as a changed value of the threshold voltage.
And an error rate measurement instructing unit 12 in which the threshold voltage changing unit 11 instructs the error rate measurement unit 2 on the receiving side after the instruction is completed, and an error rate measurement instructing unit 12 in which the error rate measurement instructing unit 12 is instructed after the instruction is completed. An error rate measurement result receiving unit 13 for receiving an error rate measured from the data storage unit 14 for storing a threshold voltage versus an error rate when the value of the counter 5 is “1”;
When the value of the counter 5 is “2”, the data storage unit 15 stores the threshold voltage versus the error rate, and the value specified by the threshold voltage changing unit 11 and the reception result of the error rate measurement result receiving unit 13 are stored in the counter 5 When the value of the counter 5 is "1", the data writing unit 16 writes the data into the data storage unit 15, and when the value of the counter 5 is "2", the data writing unit 16 writes the data into the data storage unit 15; 6 and the value of the number-of-measurements storage unit 3, and when the value of the counter 6 is smaller than the value indicated by the number-of-measures storage unit 3, the comparison unit 17 returns control to the counter 6, and the comparison result of the comparison unit 17 A comparison unit 18 that compares the value of the counter 5 with the value of the number-of-regions storage unit 4 when the values match, and returns control to the counter 5 when the value of the counter 5 does not match the value indicated by the number-of-regions storage unit 4; The comparison result of the comparison unit 18 is If it is, an approximation unit 19 that approximates the data of the data storage unit 14 with a straight line, an approximation unit 20 that approximates the data of the data storage unit 15 with a straight line after the approximation is completed, and an approximation unit 19 and an approximation unit 20 that calculate A variable calculator 21 that calculates an average space level, an average mark level, a space noise standard deviation, and a mark noise standard deviation from each coefficient of the approximate expression thus calculated, and calculates a Q value using the calculation result of the variable calculator 21. And a Q value calculation unit 22.
【0016】次に動作について説明する。Next, the operation will be described.
【0017】図3は送信側誤り率測定器の出信号及び被
測定物の出力信号のアイパターンの一例を示す説明図で
ある。FIG. 3 is an explanatory diagram showing an example of an eye pattern of an output signal of the transmission side error rate measuring device and an output signal of the device under test.
【0018】送信側誤り率測定器1は、測定信号1aを
連続で出力し被測定物に入力する。受信側誤り率測定器
2は、被測定物からの出力信号1bを受信し誤り率を測
定する。また、送信側誤り率測定器1と受信側誤り率測
定器2とは、同期信号1cによって同期している。The transmission-side error rate measuring device 1 continuously outputs the measurement signal 1a and inputs it to the device under test. The receiving side error rate measuring device 2 receives the output signal 1b from the device under test and measures the error rate. The transmission-side error rate measurement device 1 and the reception-side error rate measurement device 2 are synchronized by a synchronization signal 1c.
【0019】図4はアイパターンとスレショルド電圧の
初期設定箇所との関係を説明する説明図である。以下の
説明には、主に図1の名称と符号とを用い、適宜図3お
よび図4を引用する。FIG. 4 is an explanatory diagram for explaining the relationship between the eye pattern and the location where the threshold voltage is initially set. In the following description, the names and reference numerals of FIG. 1 are mainly used, and FIGS. 3 and 4 are appropriately referred to.
【0020】特性評価に先立ち、予め図4に示すマーク
レベル(データ1レベル)23での誤り率がエラーフリ
ーから全エラーになるスレショルド電圧をスレショルド
電圧表8に書き込む。スペースレベル(データ0レベ
ル)24についても同様にスレショルド電圧を同数スレ
ショルド電圧表9に書き込む。また、スレショルド電圧
表8及び9に書き込んだ各電圧数を測定回数記憶部3に
も書き込んでおく。同時に、領域数記憶部4には「2」
を書き込んでおく。Prior to the characteristic evaluation, the threshold voltage at which the error rate at the mark level (data 1 level) 23 shown in FIG. Similarly for the space level (data 0 level) 24, the threshold voltage is written in the same number threshold voltage table 9. The number of voltages written in the threshold voltage tables 8 and 9 is also written in the number-of-measures storage unit 3. At the same time, "2" is stored in the number-of-regions storage unit 4.
Is written.
【0021】特性評価を開始すると、まず、カウンタ5
を「1」増加する(カウンタ値1)。つぎにカウンタ消
去部7でカウンタ6をクリア後、改めてカウンタ6を
「1」増加する(カウンタ値1)。続いてスレショルド
電圧読出部10でカウンタ5の値を参照してカウンタ値
が「1」の時はスレショルド電圧表8から、カウンタ値
が「2」の時はスレショルド電圧表9から、予め書き込
まれているカウンタ6の示す番地に記憶されているスレ
ショルド電圧値10aを読み出す。このスレショルド電
圧読出部10が読み出したスレショルド電圧値10a
を、スレショルド電圧変更部11が受信側誤り率測定器
2に測定器制御信号2aとして設定する。設定完了後、
誤り率測定指示部12が受信側誤り率測定器2に同様に
測定器制御信号2aとして誤り率測定を指示する。指示
後、受信側誤り率測定器2が送信する測定結果を測定器
制御信号2aを通じて誤り率測定結果受信部13で受け
取る。受信した結果は、データ書込部16でカウンタ5
の値(5a)を参照してカウンタ値が「1」の時はデー
タ保存部14に、カウンタ値が「2」の時はデータ保存
部15に、スレショルド電圧(10b)対誤り率をデー
タ16aとして書き込む。書き込み後、カウンタ6の値
(6a)と測定回数記憶部3の値とを比較し、カウンタ
6の値(6a)<測定回数記憶部3の値、であるとき、
カウンタ6の値を「1」増加させ以下同様に繰り返す。
カウンタ6値(6a)=測定回数記憶部3値の時、カウ
ンタ5の値と領域数記憶部4の値を比較し、カウンタ5
の値(5a)<領域数記憶部4の値、であるとき、カウ
ンタ5を「1」増加させ以下同様に繰り返す。カウンタ
5の値(5a)=領域数記憶部4の値、であるとき、近
似部19にてデータ保存部14のデータ14aを直線近
似(y=a1x+b1)し、係数a1,b1を算出す
る。同様に、近似部20にてデータ保存部15のデータ
15aを直線近似(y=a2x+b2)し、係数a2,
b2を算出する。続いて、変数算出部21が各係数から
なる近似結果19a,20aを用いて平均スペースレベ
ルμ0、平均マークレベルμ1、スペース雑音標準偏差
σ0、マーク雑音標準偏差σ1を計算する。この結果を
用いてQ値算出部22にてQ値(Q値:電圧あるいは電
流単位による受信部のSN(信号/雑音比)を求める。
この場合のQ値計算方法は、次の式による。 Q[dB]=20×log {|μ1−μ0|/(σ1−σ
0)} なお、説明は、カウンタ5の値が「1」の場合のスレシ
ョルド電圧の測定回数と、カウンタ5の値が「2」の場
合の測定回数とを測定回数記憶部3の記憶する回数にし
て同一としたが、別途測定回数記憶部を増加し、それぞ
れ別の回数として測定することも可能である。When the characteristic evaluation is started, first, the counter 5
Is increased by “1” (counter value 1). Next, after the counter 6 is cleared by the counter erasing section 7, the counter 6 is incremented by "1" again (counter value 1). Subsequently, the threshold voltage reading unit 10 refers to the value of the counter 5 and is written in advance from the threshold voltage table 8 when the counter value is “1” and from the threshold voltage table 9 when the counter value is “2”. The threshold voltage value 10a stored at the address indicated by the counter 6 is read. The threshold voltage value 10a read by the threshold voltage reading unit 10
Is set as the measuring device control signal 2a in the receiving side error rate measuring device 2 by the threshold voltage changing unit 11. After completing the settings,
The error rate measurement instructing unit 12 similarly instructs the reception side error rate measurement device 2 to perform the error rate measurement as the measurement device control signal 2a. After the instruction, the error rate measurement result receiving unit 13 receives the measurement result transmitted by the reception side error rate measurement device 2 through the measurement device control signal 2a. The received result is stored in the data
With reference to the value (5a), when the counter value is “1”, the data storage unit 14 stores the counter value, and when the counter value is “2”, the data storage unit 15 stores the threshold voltage (10b) versus the error rate in the data 16a. Write as After writing, the value (6a) of the counter 6 is compared with the value of the number-of-measurements storage unit 3, and when the value of the counter 6 (6a) <the value of the number-of-measures storage unit 3 is satisfied,
The value of the counter 6 is increased by "1", and the same is repeated thereafter.
When the value of the counter 6 (6a) = the value of the number-of-measurements storage unit 3, the value of the counter 5 is compared with the value of the number-of-regions storage unit 4, and
When the value of (5a) <the value of the number-of-regions storage unit 4, the counter 5 is incremented by "1", and the same is repeated. When the value of the counter 5 (5a) = the value of the number-of-regions storage unit 4, the approximation unit 19 linearly approximates the data 14a of the data storage unit 14 (y = a1x + b1), and calculates coefficients a1 and b1. Similarly, the approximation unit 20 performs linear approximation (y = a2x + b2) of the data 15a of the data storage unit 15 to obtain a coefficient a2
b2 is calculated. Subsequently, the variable calculation unit 21 calculates the average space level μ0, the average mark level μ1, the space noise standard deviation σ0, and the mark noise standard deviation σ1 using the approximation results 19a and 20a including the respective coefficients. Using the result, a Q value (Q value: SN (signal / noise ratio) of the receiving unit in units of voltage or current) is obtained in the Q value calculation unit 22.
The Q value calculation method in this case is based on the following equation. Q [dB] = 20 × log {| μ1-μ0 | / (σ1-σ
0)} Note that the number of times the threshold voltage is measured when the value of the counter 5 is “1” and the number of measurements when the value of the counter 5 is “2” are stored in the number-of-measures storage unit 3. However, it is also possible to separately increase the number-of-measurements storage unit and perform measurement as different numbers.
【0022】[0022]
【発明の効果】以上説明したように、本発明は、被測定
物にディジタルデータ信号を入力し、被測定物の出力の
予測される論理値の高電位および低電位の二値をしきい
値電位の中央値としてそれぞれ含む二組の複数のしきい
値電位ごとに誤り率を測定し、この高電位および低電位
の各しきい値電位に対する誤り率を用いてそれぞれ直線
近似して直線を表示する係数を算出し、二組の係数を用
いて高電位および低電位それぞれの平均電位と雑音標準
偏差とを求め、平均電位と雑音標準偏差とからQ値を算
出するようにしているので、測定精度を下げずに測定時
間を短縮可能とする効果が有る。As described above, according to the present invention, a digital data signal is inputted to a device under test, and two values of a high potential and a low potential of a predicted logical value of an output of the device under test are set as threshold values. The error rate is measured for each of two sets of threshold potentials, each of which is included as the median of the potential, and a straight line is displayed using the error rates for each of the high potential and the low potential for each threshold potential. The coefficient to be calculated is calculated, the average potential and the noise standard deviation of each of the high potential and the low potential are obtained using the two sets of coefficients, and the Q value is calculated from the average potential and the noise standard deviation. There is an effect that the measurement time can be reduced without lowering the accuracy.
【図1】本発明の実施の形態を示すブロック図である。FIG. 1 is a block diagram showing an embodiment of the present invention.
【図2】従来の受信特性評価装置の実施例を示すブロッ
ク図である。FIG. 2 is a block diagram illustrating an embodiment of a conventional reception characteristic evaluation device.
【図3】送信側誤り率測定器の出信号及び被測定物の出
力信号のアイパターンの一例を示す説明図である。FIG. 3 is an explanatory diagram showing an example of an eye pattern of an output signal of a transmission-side error rate measuring device and an output signal of a device under test.
【図4】アイパターンとスレショルド電圧の初期設定箇
所との関係を説明する説明図である。FIG. 4 is an explanatory diagram for explaining a relationship between an eye pattern and a threshold voltage initial setting portion.
1 送信側誤り率測定器 1a 測定信号 1b 出力信号 1c 同期信号 2 受信側誤り率測定器 2a 測定器制御信号 3 測定回数記憶部 4 領域記憶部 5,6 カウンタ 5a カウンタ5の値 6a カウンタ6の値 7 カウンタ消去部 8,9 スレショルド電圧表 10 スレショルド電圧読みだし部 10a,10b スレショルド電圧値 11 スレショルド電圧変更部 12 誤り率測定指示部 13 誤り率測定結果受信部 14,15 データ保存部 14a,15a,16a データ 16 データ書込部 17,18 比較部 19,20 近似部 19a,20a 近似結果 21 変数算出部 22 Q値算出部 23 マークレベル位置 24 スペースレベル位置 DESCRIPTION OF SYMBOLS 1 Transmission side error rate measuring device 1a Measurement signal 1b Output signal 1c Synchronization signal 2 Receiving side error rate measurement device 2a Measurement device control signal 3 Measurement frequency storage unit 4 Area storage unit 5, 6 Counter 5a Counter 5 value 6a Counter 6 Value 7 Counter erasing section 8, 9 Threshold voltage table 10 Threshold voltage reading section 10a, 10b Threshold voltage value 11 Threshold voltage changing section 12 Error rate measurement instruction section 13 Error rate measurement result receiving section 14, 15 Data storage section 14a, 15a , 16a Data 16 Data writing unit 17, 18 Comparison unit 19, 20 Approximation unit 19a, 20a Approximation result 21 Variable calculation unit 22 Q value calculation unit 23 Mark level position 24 Space level position
Claims (4)
物の受信特性を評価するための受信特性評価方法におい
て、前記被測定物に前記ディジタルデータ信号を入力
し、前記被測定物の出力の予測される論理値の高電位お
よび低電位の二値をしきい値電位の中央値としてそれぞ
れ含む二組の複数のしきい値電位ごとに誤り率を測定
し、前記高電位および低電位の各しきい値電位に対する
誤り率を用いてそれぞれ直線近似して直線を表示する係
数を算出し、前記二組の係数を用いて前記高電位および
低電位それぞれの平均電位と雑音標準偏差とを求め、前
記平均電位と雑音標準偏差とからQ値を算出することを
特徴とする受信特性評価方法。In a receiving characteristic evaluation method for evaluating a receiving characteristic of a device under test that relays a digital data signal, the digital data signal is input to the device under test, and an output of the device under test is predicted. The error rate is measured for each of a plurality of sets of threshold potentials each including a high value and a low value of a logical value as a median of the threshold value, and the thresholds of the high and low potentials are measured. A coefficient for displaying a straight line is calculated by linear approximation using the error rate for the value potential, and an average potential and a noise standard deviation of each of the high potential and the low potential are calculated using the two sets of coefficients. A receiving characteristic evaluation method, wherein a Q value is calculated from a potential and a noise standard deviation.
側誤り率測定器と、前記送信側誤り率測定器の測定信号
を入力した前記被測定物の出力信号と送信側誤り率測定
器からの同期信号を入力する受信側誤り率測定器と、前
記受信側誤り率測定器の誤り率測定の基準となるスレシ
ョルド電圧の変更回数を予め記憶しておく測定回数記憶
部と、スレショルド電圧を微細に変更して測定する測定
領域の数として「2」を予め記憶しておく領域数記憶部
と、スレショルド電圧の測定領域を示す数をカウントす
る第一カウンタと、スレショルド電圧を微細に変更した
変更回数をカウントする第二カウンタと、前記第一カウ
ンタの値が増加したとき前記第二カウンタの値を消去す
るカウンタ消去部と、前記第一カウンタの値が「1」の
場合に測定するスレショルド電圧を前記測定回数記憶部
の記憶する変更回数分記憶する第一スレショルド電圧表
と、前記第二カウンタの値が「2」の場合に測定するス
レショルド電圧を前記測定回数記憶部の記憶する変更回
数分記憶する第二スレショルド電圧表と、誤り率の測定
動作ごとに前記第一カウンタの値および前記第二カウン
タの値を入力しこれら2つの値に対応して定まるスレシ
ョルド電圧の値を前記第一スレショルド電圧表および前
記第二スレショルド電圧表のいずれか一方から読み出す
スレショルド電圧読出部と、前記スレショルド電圧読出
部が読み出した値をスレショルド電圧の変更値として前
記受信側誤り率測定器に指示するスレショルド電圧変更
部と、前記スレショルド電圧変更部が指示終了後前記受
信側誤り率測定器に誤り率測定を指示する誤り率測定指
示部と、前記誤り率測定指示部が指示終了後前記受信側
誤り率測定器から測定した誤り率を受信する誤り率測定
結果受信部と、前記第一カウンタの値が「1」の場合に
スレショルド電圧対誤り率を記憶する第一データ保存部
と、前記第一カウンタの値が「2」の場合にスレショル
ド電圧対誤り率を記憶する第二データ保存部と、前記ス
レショルド電圧変更部が指示した値と前記誤り率測定結
果受信部の受信結果を前記第一カウンタの値が「1」の
とき前記第一データ保存部に書き込みを行い同様に前記
第一カウンタの値が「2」のとき前記第二データ保存部
にデータを書き込むデータ書込部と、前記データ書込部
の書き込み後前記第二カウンタの値と前記測定回数記憶
部の値とを比較し前記第二カウンタの値が前記測定回数
記憶部の示す値に満たないとき前記第二カウンタに制御
を戻す第一比較部と、前記第一比較部の比較結果が一致
のとき前記第一カウンタの値と前記領域数記憶部の値と
を比較し前記第一カウンタの値と前記領域数記憶部の示
す値とが一致しないとき前記第一カウンタに制御を戻す
第二比較部と、前記第二比較部の比較結果が一致だった
場合前記第一データ保存部のデータを直線近似する第一
近似部と、前記第一近似部が近似終了後前記第二データ
保存部のデータを直線近似する第二近似部と、前記第一
近似部および前記第二近似部が算出した近似式の各係数
から平均スペースレベルと平均マークレベルとスペース
雑音標準偏差とマーク雑音標準偏差とを算出する変数算
出部と、前記変数算出部の計算結果を用いてQ値を算出
するQ値算出部とを含むことを特徴とする受信特性評価
装置。2. A transmission side error rate measuring device for inputting a measurement signal to the device under test, an output signal of the device under test inputting a measurement signal of the transmission side error rate measuring device, and a transmission side error rate measuring device A receiving-side error rate measuring device for inputting a synchronization signal from the receiving side; a measuring frequency storage unit for storing in advance a changing frequency of a threshold voltage serving as a reference of the error rate measurement of the receiving-side error rate measuring device; The number-of-regions storage unit that previously stores “2” as the number of measurement regions to be finely changed and measured, the first counter that counts the number indicating the measurement region of the threshold voltage, and the threshold voltage is finely changed A second counter for counting the number of changes, a counter erasing unit for erasing the value of the second counter when the value of the first counter increases, and a thread for measuring when the value of the first counter is "1". A first threshold voltage table that stores the threshold voltage for the number of changes stored in the number-of-measures storage unit, and a change that stores the threshold voltage measured when the value of the second counter is “2” in the number-of-measures storage unit A second threshold voltage table to be stored for the number of times, and a value of the first counter and a value of the second counter for each error rate measurement operation, and a threshold voltage value determined corresponding to these two values are input to the second threshold voltage table. A threshold voltage reading unit for reading from one of the threshold voltage table and the second threshold voltage table, and a threshold for instructing the reception side error rate measuring device the value read by the threshold voltage reading unit as a changed value of the threshold voltage. A voltage changing unit and the threshold voltage changing unit instructs the receiving side error rate measuring device to measure an error rate after the instruction is completed. An error rate measurement instructing unit, an error rate measurement result receiving unit that receives the error rate measured from the receiving side error rate measuring device after the error rate measurement instructing unit completes the instruction, and a value of the first counter is “1”. A first data storage unit for storing a threshold voltage versus an error rate when the value of the first counter is "2"; a second data storage unit for storing a threshold voltage versus the error rate when the value of the first counter is "2"; When the value of the first counter is "1", the value instructed by the changing unit and the reception result of the error rate measurement result receiving unit are written to the first data storage unit, and the value of the first counter is similarly set to "1". 2 ", a data writing unit for writing data to the second data storage unit, and comparing the value of the second counter with the value of the measurement count storage unit after writing by the data writing unit. Is the number of measurements A first comparison unit that returns control to the second counter when the value is less than the value indicated by the storage unit, and a value of the first counter and a value of the region number storage unit when the comparison result of the first comparison unit matches. When the value of the first counter does not match the value indicated by the number-of-regions storage unit, the second comparison unit that returns control to the first counter and the comparison result of the second comparison unit match. A first approximation unit that linearly approximates the data of the first data storage unit, a second approximation unit that linearly approximates the data of the second data storage unit after the first approximation is completed, and the first approximation unit And a variable calculation unit that calculates an average space level, an average mark level, a space noise standard deviation, and a mark noise standard deviation from each coefficient of the approximation formula calculated by the second approximation unit, and a calculation result of the variable calculation unit. And a Q value calculation unit for calculating the Q value A receiving characteristic evaluation device characterized by including:
徴とする請求項1記載の受信特性評価方法。3. The method according to claim 1, wherein the device under test is an optical submarine repeater.
徴とする請求項2記載の受信特性評価装置。4. The receiving characteristic evaluation device according to claim 2, wherein the device under test is an optical submarine repeater.
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JP8158246A JP2976887B2 (en) | 1996-06-19 | 1996-06-19 | Method and apparatus for evaluating reception characteristics |
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JP8158246A JP2976887B2 (en) | 1996-06-19 | 1996-06-19 | Method and apparatus for evaluating reception characteristics |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2352597A (en) * | 1999-06-14 | 2001-01-31 | Toshiba Kk | Digital signal quality monitoring method using a scanned discrimination level |
WO2005036549A1 (en) * | 2003-10-10 | 2005-04-21 | Samsung Electronics Co., Ltd. | Method and apparatus for measuring signal quality using eye pattern |
-
1996
- 1996-06-19 JP JP8158246A patent/JP2976887B2/en not_active Expired - Lifetime
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2352597A (en) * | 1999-06-14 | 2001-01-31 | Toshiba Kk | Digital signal quality monitoring method using a scanned discrimination level |
GB2352597B (en) * | 1999-06-14 | 2002-09-11 | Toshiba Kk | Digital signal quality monitoring method and communications apparatus using this method |
US6718138B1 (en) | 1999-06-14 | 2004-04-06 | Kabushiki Kaisha Toshiba | Digital-signal quality monitoring method and communications apparatus using this method |
WO2005036549A1 (en) * | 2003-10-10 | 2005-04-21 | Samsung Electronics Co., Ltd. | Method and apparatus for measuring signal quality using eye pattern |
US7324903B2 (en) | 2003-10-10 | 2008-01-29 | Samsung Electronics Co., Ltd. | Method and apparatus for measuring signal quality using eye pattern |
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