JPH0967760A - Woven cloth inspection and apparatus therefor - Google Patents

Woven cloth inspection and apparatus therefor

Info

Publication number
JPH0967760A
JPH0967760A JP22397095A JP22397095A JPH0967760A JP H0967760 A JPH0967760 A JP H0967760A JP 22397095 A JP22397095 A JP 22397095A JP 22397095 A JP22397095 A JP 22397095A JP H0967760 A JPH0967760 A JP H0967760A
Authority
JP
Japan
Prior art keywords
detection
woven fabric
photoelectric sensor
electric signal
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22397095A
Other languages
Japanese (ja)
Inventor
Masashi Toda
昌司 戸田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyota Industries Corp
Original Assignee
Toyoda Automatic Loom Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyoda Automatic Loom Works Ltd filed Critical Toyoda Automatic Loom Works Ltd
Priority to JP22397095A priority Critical patent/JPH0967760A/en
Publication of JPH0967760A publication Critical patent/JPH0967760A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/898Irregularities in textured or patterned surfaces, e.g. textiles, wood
    • G01N21/8983Irregularities in textured or patterned surfaces, e.g. textiles, wood for testing textile webs, i.e. woven material
    • DTEXTILES; PAPER
    • D03WEAVING
    • D03JAUXILIARY WEAVING APPARATUS; WEAVERS' TOOLS; SHUTTLES
    • D03J1/00Auxiliary apparatus combined with or associated with looms
    • D03J1/007Fabric inspection on the loom and associated loom control

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Wood Science & Technology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Treatment Of Fiber Materials (AREA)
  • Filamentary Materials, Packages, And Safety Devices Therefor (AREA)
  • Auxiliary Weaving Apparatuses, Weavers' Tools, And Shuttles (AREA)
  • Looms (AREA)

Abstract

PROBLEM TO BE SOLVED: To avoid an erroneous inspection by excluding effects of the external disturbance on optical processing. SOLUTION: This method for inspecting a woven cloth W comprises arranging sensing ranges 201 and 211 of a photodetector elements 29 and 30 in the vicinity on the woven cloth W, converting a converted current signal inputted from photodetector elements 29 and 30 into a voltage signal and outputting the voltage signal to a differential computing circuit 36 with I/V converting circuits 34 and 35, outputting a differential signal of the voltage signal inputted from the I/V converting circuits 34 and 35 to a differential comparator circuit 37, judging whether or not a defect sensing signal is outputted to an output circuit 40 based on results of comparison between the inputted differential signal and the reference value preset by reference value setting circuits 38 and 39 with the comparator circuit 37, outputting the voltage signal to a comparator circuit 41 with the I/V converting circuit 35 and judging whether or not an inspection circumventing signal is outputted to the output circuit 40 based on the results of comparison between the inputted voltage signal with the reference value preset by reference value setting circuits 42 and 43.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、受光量に応じた電
気信号を出力する光電センサを用いて経糸と緯糸とによ
って製織された織布の欠点を検出する織布検反方法及び
装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a woven fabric inspection method and apparatus for detecting defects of a woven fabric woven by warps and wefts using a photoelectric sensor that outputs an electric signal according to the amount of received light. Is.

【0002】[0002]

【従来の技術】この種の織布検反装置が特開昭60−2
31850号公報に開示されている。光源から織布上に
投射された光の反射光は感光セルによって受光される。
光の経路上には光学レンズ系が設置されており、投射光
あるいは反射光の集光、平行化等の必要な光学的処理が
光学レンズ系によって行われる。感光セルは受光量に応
じた電気信号を出力し、この電気信号が評価ユニットで
評価される。
2. Description of the Related Art A cloth inspection apparatus of this type is disclosed in Japanese Patent Application Laid-Open No. Sho 60-2.
No. 31,850. The reflected light of the light projected from the light source onto the woven fabric is received by the photosensitive cell.
An optical lens system is provided on the light path, and necessary optical processing such as condensing and collimating projection light or reflected light is performed by the optical lens system. The photosensitive cell outputs an electric signal corresponding to the amount of received light, and the electric signal is evaluated by the evaluation unit.

【0003】[0003]

【発明が解決しようとする課題】受光量に応じて変換さ
れた電気信号の評価は一般的に電気信号の大きさと予め
設定された基準値との比較によって行われる。電気信号
の値が基準値以内であれば正常の評価が行われ、電気信
号の値が基準値を越えれば異常の評価が行われる。しか
しながら、織機は激しく振動しているため、光学レンズ
系によって行われる織布からの反射光に対する前記光学
的処理にばらつきが生じる。このようなばらつきは同じ
織り状態から得られる前記電気信号を変化させる。この
ような電気信号の変化は前記基準値の設定を困難にし、
誤検反が起きる。
The evaluation of the electric signal converted according to the amount of received light is generally performed by comparing the magnitude of the electric signal with a preset reference value. If the value of the electric signal is within the reference value, the normal evaluation is performed, and if the value of the electric signal exceeds the reference value, the abnormal evaluation is performed. However, since the loom vibrates violently, the optical processing performed by the optical lens system on the reflected light from the woven cloth varies. Such variations alter the electrical signal obtained from the same weave condition. Such a change in the electric signal makes it difficult to set the reference value,
False detection occurs.

【0004】本発明は、光学的処理に対する外乱の影響
を排除して誤検反を回避し得る織布検反方法及び装置を
提供することを目的とする。
It is an object of the present invention to provide a woven fabric inspection method and apparatus which can eliminate the influence of disturbance on optical processing and avoid false inspection.

【0005】[0005]

【課題を解決するための手段】そのために請求項1の発
明では、織布上の複数地点を同時に光で走査し、これら
複数の地点の1つにおける織り状態を反映する光を参照
用の電気信号に変換すると共に、この参照用電気信号と
参照基準値とを比較し、前記複数の地点の少なくとも他
における織り状態を反映する光を検反用の電気信号に変
換し、この検反用電気信号の比較対象となる検反基準値
と前記検反用電気信号とのいずれか一方を前記参照用電
気信号と参照基準値との比較の結果に基づいて補正する
ようにした。
To this end, in the invention of claim 1, a plurality of points on the woven cloth are simultaneously scanned with light, and the light reflecting the weaving condition at one of the plurality of points is used as a reference electricity. Along with converting into a signal, the reference electric signal is compared with a reference reference value, and light reflecting the weaving state at least at the other of the plurality of points is converted into an electric signal for detection, and the electric detection is performed. Either one of the detection reference value and the detection electric signal to be compared with the signal is corrected based on the result of the comparison between the reference electric signal and the reference reference value.

【0006】請求項2の発明では、織布上の複数地点を
同時に光で走査し、これら複数の地点の1つにおける織
り状態を反映する光を参照用の電気信号に変換すると共
に、この参照用電気信号と参照基準値とを比較し、前記
複数の地点の少なくとも他における織り状態を反映する
光を検反用の電気信号に変換し前記参照用電気信号と参
照基準値との比較の結果に基づいて前記検反用電気信号
の採否を判定するようにした。
According to the second aspect of the present invention, a plurality of points on the woven cloth are simultaneously scanned with light, the light reflecting the weaving condition at one of the plurality of points is converted into an electric signal for reference, and this reference is performed. The electric signal for reference and the reference reference value are compared, and the result of the comparison between the reference electric signal and the reference reference value by converting the light reflecting the weaving condition in at least another of the plurality of points into the electric signal for detection Based on the above, whether or not to adopt the electrical signal for inspection is determined.

【0007】請求項3の発明では、前記複数地点を接近
させた。請求項4の発明では、前記複数の地点の織り状
態を反映する光を変換した電気信号の2つの差を演算
し、この演算によって得られた差と検反基準値とを比較
するようにした。
In the invention of claim 3, the plurality of points are brought close to each other. In the invention of claim 4, the difference between the two electric signals obtained by converting the light, which reflects the weaving condition at the plurality of points, is calculated, and the difference obtained by this calculation is compared with the inspection reference value. .

【0008】請求項5の発明では、織布の織り状態を反
映する光を受光する第1の光電センサと、前記光電セン
サの検出地点とは別の地点に検出領域を持つ第2の光電
センサと、第1の光電センサ及び第2の光電センサの一
方から得られる参照用電気信号と参照基準値とを比較す
る第1の比較手段と、第1の光電センサ及び第2の光電
センサの少なくとも他方から得られる検反用電気信号と
検反基準値とを比較する第2の比較手段と、第2の比較
手段における比較結果を前記第1の比較手段の比較結果
に基づいて補正する補正手段とを備えた織布検反装置を
構成した。
According to a fifth aspect of the present invention, the first photoelectric sensor that receives light reflecting the woven state of the woven fabric and the second photoelectric sensor that has a detection area at a point different from the detection point of the photoelectric sensor And first comparing means for comparing a reference electric signal obtained from one of the first photoelectric sensor and the second photoelectric sensor with a reference reference value, and at least the first photoelectric sensor and the second photoelectric sensor. Second comparison means for comparing the electric signal for detection obtained from the other with the detection reference value, and correction means for correcting the comparison result in the second comparison means based on the comparison result of the first comparison means. And a woven fabric inspection device including

【0009】請求項6の発明では、織布の織り状態を反
映する光を受光する第1の光電センサと、前記光電セン
サの検出地点とは別の地点に検出領域を持つ第2の光電
センサと、第1の光電センサ及び第2の光電センサの一
方から得られる参照用電気信号と参照基準値を比較する
第1の比較手段と、第1の光電センサ及び第2の光電セ
ンサの少なくとも他方から得られる検反用電気信号と検
反基準値を比較する第2の比較手段と、第2の比較手段
における比較結果の採否を前記第1の比較手段の比較結
果に基づいて判定する採否判定手段とを備えた織布検反
装置を構成した。
According to a sixth aspect of the present invention, the first photoelectric sensor that receives light reflecting the woven state of the woven fabric and the second photoelectric sensor that has a detection area at a point different from the detection point of the photoelectric sensor And a first comparing means for comparing a reference electric signal obtained from one of the first photoelectric sensor and the second photoelectric sensor with a reference reference value, and at least the other of the first photoelectric sensor and the second photoelectric sensor. Second comparison means for comparing the electric signal for detection obtained from the second detection means with the reference value for detection, and whether the comparison result in the second comparison means is judged based on the comparison result of the first comparison means. And a means for woven fabric inspection.

【0010】請求項7の発明では、前記第1の光電セン
サ及び第2の光電センサから得られる電気信号の差を演
算する差演算手段と、前記差演算手段の演算結果に基づ
いて欠点検出信号を出力するか否かを判定する欠点判定
手段とを備えた第1の比較手段を構成した。
According to a seventh aspect of the present invention, a difference calculation means for calculating a difference between electric signals obtained from the first photoelectric sensor and the second photoelectric sensor, and a defect detection signal based on a calculation result of the difference calculation means. The first comparing means is provided with a defect determining means for determining whether or not to output.

【0011】請求項1及び請求項5の発明によれば、織
布上の複数地点の1つにおける織り状態を反映する光が
参照用電気信号に変換される。又、前記複数の地点の少
なくとも他における織り状態を反映する光が検反用電気
信号に変換される。参照用電気信号は参照基準値と比較
される。検反用電気信号と検反基準値とのいずれか一方
が参照用電気信号と参照基準値とのずれに応じて補正さ
れる。このような補正の上で行われる検反用電気信号と
検反基準値との比較は織り状態を精度良く反映する。
According to the first and fifth aspects of the invention, the light reflecting the weaving condition at one of the plural points on the woven fabric is converted into the reference electric signal. Further, the light reflecting the weaving condition at least at the other points is converted into the electric signal for inspection. The reference electrical signal is compared with a reference reference value. Either one of the detection electric signal and the detection reference value is corrected according to the deviation between the reference electric signal and the reference reference value. The comparison between the electric signal for inspection and the reference value for inspection performed on the basis of such correction accurately reflects the weaving state.

【0012】請求項2及び請求項6の発明によれば、検
反用電気信号の採否が参照用電気信号と参照基準値との
ずれの程度に応じて判定される。このような採否の上で
行われる検反用電気信号と検反基準値との比較は織り状
態を精度良く反映する。
According to the second and sixth aspects of the invention, the acceptance / rejection of the detection electrical signal is determined according to the degree of deviation between the reference electrical signal and the reference reference value. The comparison between the electrical signal for inspection and the inspection reference value, which is performed based on such acceptance or rejection, accurately reflects the weaving state.

【0013】請求項3の発明によれば、接近した複数地
点に対する受光レベルが同一となり、参照用の光の受光
レベルが適正であれば、検反用の光の受光レベルも適正
である。
According to the third aspect of the present invention, if the light receiving levels for a plurality of approaching points are the same and the light receiving level of the reference light is appropriate, the light receiving level of the light for inspection is also appropriate.

【0014】請求項4乃至請求項7の発明では、経糸と
緯糸とのうちの一方の糸の方向に複数の光電センサが配
設される。これらの光電センサのうちの少なくとも1つ
の電気信号と他の光電センサの電気信号との差が演算さ
れ、この演算された差が例えば予め設定された基準値と
比較される。前記差の演算は照明光、風綿といった外乱
の影響による電気信号の変化を排除する。演算された差
が基準値を越える場合には欠点判定手段が欠点検出信号
を出力する。前記複数地点を緯糸の糸方向に配設した場
合には前記欠点検出信号の出力は経糸の欠点を検出した
ことによるものとなる。複数地点を経糸の糸方向に配設
した場合には前記欠点検出信号の出力は緯糸の欠点を検
出したことによるものとなる。
In the inventions of claims 4 to 7, a plurality of photoelectric sensors are arranged in the direction of one of the warp and the weft. The difference between the electric signal of at least one of these photoelectric sensors and the electric signal of the other photoelectric sensor is calculated, and the calculated difference is compared with, for example, a preset reference value. The calculation of the difference eliminates the change in the electric signal due to the influence of disturbance such as illumination light and cotton dust. If the calculated difference exceeds the reference value, the defect determining means outputs a defect detection signal. When the plurality of points are arranged in the weft yarn direction, the defect detection signal is output because the defect of the warp yarn is detected. When a plurality of points are arranged in the warp yarn direction, the defect detection signal is output because the defect of the weft yarn is detected.

【0015】[0015]

【発明の実施の形態】以下、織機上の織布検反装置に本
発明を具体化した第1実施例を図1〜図6に基づいて説
明する。
BEST MODE FOR CARRYING OUT THE INVENTION A first embodiment in which the present invention is embodied in a woven fabric inspection device on a loom will be described below with reference to FIGS.

【0016】図1に示すように織布Wの上方にはレール
11が織布Wの織幅方向に配設されている。レール11
にはセンサヘッド12がガイド体13を介して吊下支持
されている。ガイド体13はレール11に沿って移動で
きる。図2及び図3に示すようにセンサヘッド12には
無端状ベルト14が結合されており、無端状ベルト14
はモータ15の駆動プーリ151とガイドプーリ16と
に架けわたされている。無端状ベルト14はモータ15
の往復駆動によって往復周回し、センサヘッド12がレ
ール11に沿って往復動する。センサヘッド12は3つ
の反射鏡17,18,19及び一対の棒状の凸レンズ2
0,21を備えている。
As shown in FIG. 1, a rail 11 is arranged above the woven cloth W in the weft width direction of the woven cloth W. Rail 11
A sensor head 12 is suspended from and supported by a guide body 13. The guide body 13 can move along the rail 11. As shown in FIGS. 2 and 3, an endless belt 14 is coupled to the sensor head 12, and the endless belt 14 is
Is hung between the drive pulley 151 and the guide pulley 16 of the motor 15. The endless belt 14 is a motor 15
The sensor head 12 reciprocates along the rails 11 by the reciprocal driving of the sensor head 12. The sensor head 12 includes three reflecting mirrors 17, 18, 19 and a pair of rod-shaped convex lenses 2
It is equipped with 0 and 21.

【0017】図2に示すようにガイドプーリ16の近傍
には投光器22が設置されている。投光器22は、容器
23と、容器23の底部に取り付けられた投光素子24
と、容器22の開口側に取り付けられたスリット板25
と、投光素子24とスリット板25との間に介在された
棒状の凸レンズ26とからなる。スリット板25にはス
リット251が形成されている。投光素子24は凸レン
ズ26の焦点上に位置しており、投光素子24から凸レ
ンズ26に投射された光は凸レンズ26を通って平行光
となる。図1の鎖線矢印は光の行路を表す。凸レンズ2
6の光軸はスリット251の中央を通っている。凸レン
ズ26を通って平行になった光の一部はスリット251
を通過する。スリット板25は光の平行度を高めるため
に凸レンズ26の周縁部を通過した光の通過を阻止す
る。
As shown in FIG. 2, a light projector 22 is installed near the guide pulley 16. The projector 22 includes a container 23 and a projector element 24 attached to the bottom of the container 23.
And the slit plate 25 attached to the opening side of the container 22
And a rod-shaped convex lens 26 interposed between the light projecting element 24 and the slit plate 25. A slit 251 is formed in the slit plate 25. The light projecting element 24 is located on the focal point of the convex lens 26, and the light projected from the light projecting element 24 onto the convex lens 26 passes through the convex lens 26 and becomes parallel light. The chain line arrow in FIG. 1 represents the path of light. Convex lens 2
The optical axis of 6 passes through the center of the slit 251. Part of the light that has become parallel through the convex lens 26 is a slit 251.
Pass through. The slit plate 25 blocks the passage of light passing through the peripheral portion of the convex lens 26 in order to increase the parallelism of light.

【0018】スリット251を通過した平行光の行路は
反射鏡17と交差する。反射鏡17は織布Wの面に対し
て45°に傾いており、反射鏡17に当たった平行光は
織布W上に向けて反射される。凸レンズ20,21は反
射鏡17からの反射光の行路の左右両側に対称に配置さ
れている。凸レンズ20,21の焦点は織布W上に設定
されており、凸レンズ20,21は織布Wからの反射光
を平行光にする。反射鏡18は凸レンズ20を出た平行
光の行路上に配置されており、反射鏡19は凸レンズ2
1を出た平行光の行路上に配置されている。
The path of the parallel light passing through the slit 251 intersects with the reflecting mirror 17. The reflecting mirror 17 is inclined at 45 ° with respect to the surface of the woven cloth W, and the parallel light striking the reflecting mirror 17 is reflected toward the woven cloth W. The convex lenses 20 and 21 are symmetrically arranged on both left and right sides of the path of the reflected light from the reflecting mirror 17. The focal points of the convex lenses 20 and 21 are set on the woven cloth W, and the convex lenses 20 and 21 make the reflected light from the woven cloth W parallel light. The reflecting mirror 18 is arranged on the path of the parallel light emitted from the convex lens 20, and the reflecting mirror 19 is arranged on the convex lens 2
It is arranged on the path of the parallel light exiting from 1.

【0019】図3に示すようにモータ15の近傍には受
光器27が設置されている。受光器27は、容器28
と、容器28の底部に取り付けられた一対の受光素子2
9,30と、容器28の開口側に取り付けられた一対の
棒状の集光レンズ31,32と、受光素子29,30と
集光レンズ31,32との間に介在された抽出スリット
板33とからなる。抽出スリット板33には一対のスリ
ット331,332が形成されている。スリット331
は受光素子29に対置しており、スリット332は受光
素子30に対置している。集光レンズ31の焦点はスリ
ット331の中央にあり、集光レンズ32の焦点はスリ
ット332の中央にある。凸レンズ20の光軸と集光レ
ンズ31の光軸とは反射鏡18の反射面上で交差し、凸
レンズ21の光軸と集光レンズ32の光軸とは反射鏡1
9の反射面上で交差する。
As shown in FIG. 3, a light receiver 27 is installed near the motor 15. The light receiver 27 is a container 28.
And the pair of light receiving elements 2 attached to the bottom of the container 28.
9, 30, a pair of rod-shaped condenser lenses 31 and 32 attached to the opening side of the container 28, and an extraction slit plate 33 interposed between the light receiving elements 29 and 30 and the condenser lenses 31 and 32. Consists of. The extraction slit plate 33 is formed with a pair of slits 331 and 332. Slit 331
Is opposed to the light receiving element 29, and the slit 332 is opposed to the light receiving element 30. The focus of the condenser lens 31 is at the center of the slit 331, and the focus of the condenser lens 32 is at the center of the slit 332. The optical axis of the convex lens 20 and the optical axis of the condenser lens 31 intersect on the reflecting surface of the reflecting mirror 18, and the optical axis of the convex lens 21 and the optical axis of the condenser lens 32 intersect.
Intersect on 9 reflective surfaces.

【0020】反射鏡18から反射された平行光は集光レ
ンズ31に向かい、反射鏡19から反射された平行光は
集光レンズ32に向かう。集光レンズ31は反射鏡18
からの反射光をスリット331上に集光し、集光レンズ
32は反射鏡19からの反射光をスリット332上に集
光する。スリット331,332を通過した光は受光素
子29,30によって受光される。スリット331,3
32は外乱光を排除する機能を持つ。
The parallel light reflected from the reflecting mirror 18 goes to the condenser lens 31, and the parallel light reflected from the reflecting mirror 19 goes to the condenser lens 32. The condenser lens 31 is the reflecting mirror 18.
The reflected light from is condensed on the slit 331, and the condenser lens 32 collects the reflected light from the reflecting mirror 19 on the slit 332. The light passing through the slits 331 and 332 is received by the light receiving elements 29 and 30. Slits 331,3
32 has a function of eliminating ambient light.

【0021】図4に示す201は凸レンズ20による織
布W上の検知範囲を表し、211は凸レンズ21による
織布W上の検知範囲を表す。凸レンズ20は検知範囲2
01から反射した散乱光の一部を平行光に集束し、凸レ
ンズ21は検知範囲211から反射した散乱光の一部を
平行光に集束する。織布Wの経糸Tは筬(図示略)の筬
羽間に数本単位で通されており、検知範囲201,21
1の緯糸Yの糸方向の幅は筬羽のピッチ程度に設定され
ている。検知範囲201,211の経糸Tの糸方向の幅
は緯糸Yの糸方向の幅よりも数倍の大きさにしてある。
図5の右向きの矢印QR で囲まれた領域はセンサヘッド
12の右方向への移動による織布W上における検知範囲
201,211の掃過範囲を表す。左向きの矢印QL
囲まれた領域はセンサヘッド12の左方向への移動によ
る織布W上における検知範囲201,211の掃過範囲
を表す。織布Wは矢印Rの方向に移動する。
Reference numeral 201 shown in FIG. 4 indicates a detection range on the woven cloth W by the convex lens 20, and 211 indicates a detection range on the woven cloth W by the convex lens 21. The convex lens 20 has a detection range 2
A part of the scattered light reflected from 01 is focused into parallel light, and the convex lens 21 focuses a part of the scattered light reflected from the detection range 211 into parallel light. The warp threads T of the woven cloth W are passed between the reeds of a reed (not shown) in units of several lines, and the detection ranges 201 and 21
The width of the first weft yarn Y in the yarn direction is set to about the pitch of the reed wing. The width in the yarn direction of the warp yarns T of the detection ranges 201 and 211 is several times larger than the width of the weft yarn Y in the yarn direction.
The area surrounded by the arrow Q R pointing to the right in FIG. 5 represents the sweep range of the detection ranges 201 and 211 on the woven fabric W due to the movement of the sensor head 12 in the right direction. Area surrounded by the arrow Q L of left represents the sweep range of the detection area 201 and 211 on the fabric W by leftward movement of the sensor head 12. The woven fabric W moves in the direction of arrow R.

【0022】受光素子29,30は受け取った光を電流
に変換する。この変換電流信号は受光量に応じた電気信
号となる。受光素子29は変換電流信号を電流−電圧変
換回路34(以下、I/V変換回路34と表す)に出力
し、受光素子30は変換電流信号を電流−電圧変換回路
35(以下、I/V変換回路35と表す)に出力する。
I/V変換回路34,35は変換電流信号を電圧信号S
1,S2に変換して差演算回路36に出力する。差演算
回路36は両I/V変換回路34,35から入力する電
圧信号S1,S2の値の差を演算する。この演算では電
圧信号S1の値から電圧信号S2の値が減算される。差
演算回路36は演算して得られた差信号ΔSを比較回路
37に出力する。
The light receiving elements 29 and 30 convert the received light into an electric current. This converted current signal becomes an electric signal according to the amount of received light. The light receiving element 29 outputs the converted current signal to the current-voltage conversion circuit 34 (hereinafter referred to as the I / V conversion circuit 34), and the light receiving element 30 outputs the converted current signal to the current-voltage conversion circuit 35 (hereinafter referred to as the I / V conversion circuit 34). It is output to the conversion circuit 35).
The I / V conversion circuits 34 and 35 convert the converted current signal into the voltage signal S.
It is converted to 1, S2 and output to the difference calculation circuit 36. The difference calculation circuit 36 calculates the difference between the values of the voltage signals S1 and S2 input from the I / V conversion circuits 34 and 35. In this calculation, the value of the voltage signal S2 is subtracted from the value of the voltage signal S1. The difference calculation circuit 36 outputs the difference signal ΔS obtained by the calculation to the comparison circuit 37.

【0023】比較回路37は入力した差信号ΔSと基準
値設定回路38,39によって予め設定された基準値V
1,V2とを比較する。基準値設定回路38によって設
定された基準値V1は正、基準値設定回路39によって
設定された基準値V2は負である。差信号ΔSの値が基
準範囲〔V1,V2〕から外れた場合には比較回路37
は出力回路40に欠点検出信号ST を出力する。差信号
ΔSの値が基準範囲〔V1,V2〕内にある場合には比
較回路37は出力回路40に欠点検出信号STを出力し
ない。
The comparison circuit 37 receives the input difference signal ΔS and the reference value V preset by the reference value setting circuits 38 and 39.
1 and V2 are compared. The reference value V1 set by the reference value setting circuit 38 is positive, and the reference value V2 set by the reference value setting circuit 39 is negative. When the value of the difference signal ΔS is out of the reference range [V1, V2], the comparison circuit 37
Outputs the defect detection signal S T to the output circuit 40. When the value of the difference signal ΔS is within the reference range [V1, V2], the comparison circuit 37 does not output the defect detection signal S T to the output circuit 40.

【0024】図6(a)の曲線EはI/V変換回路34
から出力される電圧信号S1を表し、図6(b)の曲線
FはI/V変換回路35から出力される電圧信号S2を
表す。図6(c)の曲線Gは曲線Eの値から曲線Fの値
を引いて得られた差信号ΔSを表す。図6(d)の方形
波H1,H2は比較回路37から出力された欠点検出信
号ST を表す。図6(a)〜図6(d)の横軸はいずれ
も時間を表す。図6(a)〜図6(c)の縦軸はいずれ
も電圧を表す。
The curve E in FIG. 6A is the I / V conversion circuit 34.
6B represents the voltage signal S1 output from the I / V conversion circuit 35, and the curve F in FIG. 6B represents the voltage signal S2 output from the I / V conversion circuit 35. The curve G in FIG. 6C represents the difference signal ΔS obtained by subtracting the value of the curve F from the value of the curve E. Square waves H1 and H2 in FIG. 6D represent the defect detection signal S T output from the comparison circuit 37. The horizontal axis of each of FIGS. 6A to 6D represents time. The vertical axis in each of FIGS. 6A to 6C represents voltage.

【0025】曲線Eの突出部E1は受光素子29によっ
て検出された経糸に関する異常を表す。曲線Fの突出部
F1は受光素子30によって検出された経糸に関する異
常を表す。突出部E1,F1の時間差は緯糸Yの方向に
移動する凸レンズ20,21の検知範囲201,211
を緯糸Yの方向に並べたことによって生じる。曲線Gの
突出部G1は、突出部E1とこの突出部E1の時間領域
に対応する曲線Fの略平坦な部分との差である。曲線G
の突出部G2は、突出部F1とこの突出部F1の時間領
域に対応する曲線Eの略平坦な部分との差である。方形
波H1の時間幅t1は基準値V1を正の側へ越える突出
部G1の時間幅に対応し、方形波H2の時間幅t2は基
準値V2を負の側へ越える突出部G2の時間幅に対応す
る。
The protruding portion E1 of the curve E represents an abnormality relating to the warp detected by the light receiving element 29. The protruding portion F1 of the curve F represents an abnormality relating to the warp detected by the light receiving element 30. The time difference between the protrusions E1 and F1 is the detection ranges 201 and 211 of the convex lenses 20 and 21 that move in the direction of the weft Y.
Are arranged in the weft Y direction. The protrusion G1 of the curve G is the difference between the protrusion E1 and the substantially flat portion of the curve F corresponding to the time region of the protrusion E1. Curve G
The protruding portion G2 is the difference between the protruding portion F1 and the substantially flat portion of the curve E corresponding to the time region of the protruding portion F1. The time width t1 of the square wave H1 corresponds to the time width of the protrusion G1 that exceeds the reference value V1 to the positive side, and the time width t2 of the square wave H2 corresponds to the time width of the protrusion G2 that exceeds the reference value V2 to the negative side. Corresponding to.

【0026】経糸Tは隣合う筬羽間に一定本数単位で通
されているが、例えばある筬羽間では経糸の通し本数が
規定に足りず、隣の筬羽間で経糸の通し本数が規定より
も多いといった状況が生じることがある。このような状
況が続くと所謂経筋が織布上に生じ、不良織布ができて
しまう。凸レンズ20,21の検知範囲201,211
の緯糸Yの糸方向の範囲は筬羽のピッチ程度に設定して
ある。従って、受光素子29,30における受光量は織
布W上の経筋部分と正常部分とでは異なり、曲線E,F
の突出部E1,F1で示すような電圧信号S1,S2の
変動が得られる。
The warp thread T is passed between adjacent reeds in a fixed number of units. For example, between certain reeds, the number of warp threads is not sufficient, and the number of warp threads between adjacent reeds is specified. There may be situations where there are more than. If such a situation continues, so-called warp lines will occur on the woven fabric, resulting in a defective woven fabric. Detection ranges 201 and 211 of the convex lenses 20 and 21
The range of the weft Y in the yarn direction is set to about the pitch of the reed wing. Therefore, the amount of light received by the light receiving elements 29, 30 differs between the warp portion and the normal portion on the woven fabric W, and the curves E, F
The fluctuations of the voltage signals S1 and S2 are obtained as shown by the protrusions E1 and F1.

【0027】方形波H1,H2によって表される欠点検
出信号ST の出力は、受光素子29,30から得られる
電圧信号S1,S2の差信号ΔSと基準値V1,V2と
の比較結果に基づいて判定される。検反装置以外の照明
光の存在、あるいは風綿の存在といった外乱が電圧信号
S1,S2を変化させる。即ち、電圧信号S1,S2に
は外乱による変化分が入り込んでいる。このような電圧
信号S1,S2の変化は織布の織り状態を正しく反映せ
ず、これら電圧信号S1,S2と基準値との比較結果に
基づいて織布上の欠点有無を判定した場合には誤検反が
起きる。しかし、電圧信号S1,S2の差をとった差信
号ΔSでは各電圧信号に入り込んでいた前記外乱による
変化分がほぼ相殺される。従って、差信号ΔSは経糸T
に関する異常の有無を高精度で反映しており、差信号Δ
Sと基準値V1,V2との比較は経糸に関する異常の有
無の検出という検反の精度を高める。
The output of the defect detection signal S T represented by the square waves H1 and H2 is based on the result of comparison between the difference signal ΔS between the voltage signals S1 and S2 obtained from the light receiving elements 29 and 30 and the reference values V1 and V2. Will be judged. Disturbances such as the presence of illumination light other than the inspection device or the presence of cotton wool change the voltage signals S1 and S2. That is, the voltage signals S1 and S2 contain changes due to disturbance. Such a change in the voltage signals S1 and S2 does not correctly reflect the woven state of the woven cloth, and when it is determined whether or not there is a defect on the woven cloth based on the result of comparison between these voltage signals S1 and S2 and the reference value. False detection occurs. However, in the difference signal ΔS, which is the difference between the voltage signals S1 and S2, the change due to the disturbance that has entered each voltage signal is almost canceled. Therefore, the difference signal ΔS is
Accurately reflects the presence or absence of anomalies related to
The comparison between S and the reference values V1 and V2 enhances the accuracy of the detection, which is the detection of the presence or absence of an abnormality regarding the warp.

【0028】I/V変換回路35は電圧信号S2を比較
回路41にも出力する。比較回路41は入力した電圧信
号S2と基準値設定回路42,43によって予め設定さ
れた基準値V3,V4とを比較する。基準値V3は基準
値設定回路42によって設定され、基準値V4は基準値
設定回路43によって設定される。参照用電気信号とな
る電圧信号S2の値が参照基準値となる基準範囲〔V
3,V4〕から外れた場合には比較回路41は出力回路
40に検反無効化信号Nを出力する。電圧信号S2の値
が基準範囲〔V3,V4〕内にある場合には比較回路4
1は出力回路40に検反無効化信号Nを出力しない。
The I / V conversion circuit 35 also outputs the voltage signal S2 to the comparison circuit 41. The comparison circuit 41 compares the input voltage signal S2 with the reference values V3 and V4 preset by the reference value setting circuits 42 and 43. The reference value V3 is set by the reference value setting circuit 42, and the reference value V4 is set by the reference value setting circuit 43. A reference range [V in which the value of the voltage signal S2 serving as a reference electric signal serves as a reference reference value
3, V4], the comparison circuit 41 outputs the detection invalidation signal N to the output circuit 40. When the value of the voltage signal S2 is within the reference range [V3, V4], the comparison circuit 4
1 does not output the detection / invalidation signal N to the output circuit 40.

【0029】検反無効化信号Nが出力しないときに欠点
検出信号ST が出力した場合には、出力回路40は製織
停止信号、異常表示信号等の出力を行なう。しかし、検
反無効化信号Nが出力した場合には、出力回路40は欠
点検出信号ST の出力にもかかわらず製織停止信号、異
常表示信号等の出力を行なわない。
When the defect detection signal S T is output when the detection / invalidation signal N is not output, the output circuit 40 outputs a weaving stop signal, an abnormality display signal and the like. However, when the test invalidation signal N is output, the output circuit 40 does not output the weaving stop signal, the abnormality display signal, etc., despite the output of the defect detection signal S T.

【0030】受光素子29は、織布Wの織り状態を反映
する光を受光する光電センサであり、受光素子30は前
記光電センサの検出地点に接近した地点に検出領域を持
つ光電センサである。比較回路37は受光素子29から
得られる電気信号と検反基準値となる基準範囲〔V1,
V2〕とを比較する第2の比較手段となる。比較回路4
1は受光素子30から得られる電気信号と参照基準値と
なる基準範囲〔V3,V4〕とを比較する第1の比較手
段となる。出力回路40は第2の比較手段における比較
結果の採否を第1の比較手段の比較結果に基づいて判定
する採否判定手段となる。
The light receiving element 29 is a photoelectric sensor that receives light reflecting the woven state of the woven cloth W, and the light receiving element 30 is a photoelectric sensor that has a detection area at a point close to the detection point of the photoelectric sensor. The comparison circuit 37 uses an electric signal obtained from the light receiving element 29 and a reference range [V1,
V2] as a second comparing means. Comparison circuit 4
Reference numeral 1 is a first comparing means for comparing an electric signal obtained from the light receiving element 30 with a reference range [V3, V4] which is a reference reference value. The output circuit 40 serves as an acceptance / rejection determining means for determining acceptance / rejection of the comparison result of the second comparing means based on the comparison result of the first comparing means.

【0031】織機は激しく振動しているため、凸レンズ
20,21の焦点が常に正確に織布W上に位置するとは
限らない。凸レンズ20,21の焦点が織布Wからずれ
た場合には受光素子29,30における受光レベルが望
ましい受光レベルからずれる。基準範囲〔V3,V4〕
は許容できる受光レベルに対応して設定されており、受
光素子30から得られる電圧信号S2が基準範囲〔V
3,V4〕内にあれば、受光レベルは適正な範囲内にあ
る。織布W上における凸レンズ20,21の各焦点は接
近しているため、受光素子30における受光レベルが適
正であれば、他方の受光素子29における受光レベルも
適正である。織布W上における凸レンズ20,21の各
焦点は接近しているが、一方の凸レンズの焦点からの散
乱光が他方の凸レンズに対応する受光素子における受光
レベルに影響を与えることはない。受光素子30におけ
る受光レベルが適正であれば検反無効化信号Nは出力さ
れず、受光素子30における受光レベルが適正でなけれ
ば検反無効化信号Nが出力される。
Since the loom is vibrating violently, the focal points of the convex lenses 20 and 21 are not always located exactly on the woven cloth W. When the focal points of the convex lenses 20 and 21 deviate from the woven cloth W, the light receiving levels of the light receiving elements 29 and 30 deviate from the desired light receiving levels. Reference range [V3, V4]
Is set corresponding to an allowable light receiving level, and the voltage signal S2 obtained from the light receiving element 30 is set in the reference range [V
3, V4], the light receiving level is within a proper range. Since the focal points of the convex lenses 20 and 21 on the woven cloth W are close to each other, if the light receiving level of the light receiving element 30 is proper, the light receiving level of the other light receiving element 29 is also proper. Although the focal points of the convex lenses 20 and 21 on the woven cloth W are close to each other, the scattered light from the focal point of one convex lens does not affect the light receiving level of the light receiving element corresponding to the other convex lens. If the light receiving level of the light receiving element 30 is proper, the detection invalidation signal N is not output, and if the light receiving level of the light receiving element 30 is not proper, the detection invalidation signal N is output.

【0032】この実施の形態では、織布W上の接近した
2地点(図4において検知範囲201,211として示
される)を同時に光で走査し、検知範囲201,211
からの反射光が検反用の光、参照用の光として拾われ
る。検知範囲211からの反射光は検反光及び参照光と
して用いられ、検知範囲201からの反射光は検反光と
して用いられる。これら2地点の1つにおける織り状態
を反映する光が参照用電気信号(即ち、電圧信号S2)
に変換される。この参照電気信号と参照基準値となる基
準範囲〔V3,V4〕が比較され、前記2地点における
織り状態を反映する光を変換した電気信号の差ΔSの採
否が前記参照用電気信号と参照基準値との比較の結果に
基づいて判定される。このような採否の上で行われる検
反用電気信号(この実施の形態では差信号ΔS)と検反
基準値との比較は織り状態を精度良く反映する。
In this embodiment, two close points (shown as detection ranges 201 and 211 in FIG. 4) on the woven cloth W are simultaneously scanned with light to detect the detection ranges 201 and 211.
The reflected light from is picked up as light for inspection and light for reference. The reflected light from the detection range 211 is used as the detection light and the reference light, and the reflected light from the detection range 201 is used as the detection light. The light that reflects the weaving condition at one of these two points is the reference electrical signal (ie, voltage signal S2).
Is converted to This reference electric signal is compared with a reference range [V3, V4] serving as a reference reference value, and whether the difference ΔS between the electric signals obtained by converting the light reflecting the weave state at the two points is adopted or not is determined by the reference electric signal and the reference reference. It is determined based on the result of comparison with the value. The comparison between the electric signal for inspection (the difference signal ΔS in this embodiment) and the reference value for inspection performed on the basis of such adoption or rejection accurately reflects the weaving state.

【0033】次に、図7の第2の実施の形態を説明す
る。第1の実施の形態と同じ構成部には同じ符号が付し
てある。この実施の形態ではI/V変換回路34から出
力される電圧信号S1が差演算回路36以外に比較回路
44にも送られる。比較回路44は入力した電圧信号S
1と基準値設定回路42,43によって予め設定された
基準値V3,V4とを比較する。電圧信号S1の値が基
準範囲〔V3,V4〕から外れた場合には比較回路44
は出力回路45に検反無効化信号N2を出力する。電圧
信号S1の値が基準範囲〔V3,V4〕内にある場合に
は比較回路44は出力回路45に検反無効化信号N2を
出力しない。電圧信号S2の値が基準範囲〔V3,V
4〕から外れた場合には比較回路41は出力回路45に
検反無効化信号N1を出力する。電圧信号S2の値が基
準範囲〔V3,V4〕内にある場合には比較回路41は
出力回路45に検反無効化信号N1を出力しない。
Next, a second embodiment shown in FIG. 7 will be described. The same components as those in the first embodiment are denoted by the same reference numerals. In this embodiment, the voltage signal S1 output from the I / V conversion circuit 34 is sent to the comparison circuit 44 as well as the difference calculation circuit 36. The comparison circuit 44 receives the input voltage signal S
1 and the reference values V3 and V4 preset by the reference value setting circuits 42 and 43 are compared. When the value of the voltage signal S1 is out of the reference range [V3, V4], the comparison circuit 44
Outputs the detection / invalidation signal N2 to the output circuit 45. When the value of the voltage signal S1 is within the reference range [V3, V4], the comparison circuit 44 does not output the detection invalidation signal N2 to the output circuit 45. The value of the voltage signal S2 is in the reference range [V3, V
4], the comparison circuit 41 outputs the detection invalidation signal N1 to the output circuit 45. When the value of the voltage signal S2 is within the reference range [V3, V4], the comparison circuit 41 does not output the detection / invalidation signal N1 to the output circuit 45.

【0034】検反無効化信号N1,N2が同時に入力し
たときにのみ、出力回路45は欠点検出信号ST の出力
に対して製織停止信号、異常表示信号等の出力を行な
う。このようにすれば検知範囲201,211のいずれ
か一方が織布上の欠点を反映する光を参照用の光として
取り出した場合にも受光レベルの不適正状態という判定
は行われない。従って、織布上の欠点が検知範囲201
に入ったときに何らかの原因によってこの欠点の検出を
行えなかった場合にも、織布上の欠点が検知範囲211
に入ったときにこの欠点の検出に成功する可能性が残
り、織布上の欠点検出の早期発見の確実性が第1の実施
の形態の場合よりも高くなる。
The output circuit 45 outputs a weaving stop signal, an abnormality display signal and the like in response to the output of the defect detection signal S T only when the detection invalidation signals N1 and N2 are simultaneously input. In this way, even if one of the detection ranges 201 and 211 extracts the light reflecting the defect on the woven fabric as the light for reference, it is not determined that the light receiving level is inappropriate. Therefore, the defect on the woven cloth is the detection range 201.
Even if the defect cannot be detected for some reason when entering, the defect on the woven fabric is detected in the detection range 211.
The possibility of successful detection of this defect remains on entering, and the certainty of early detection of defect detection on the woven fabric is higher than in the case of the first embodiment.

【0035】次に、図8の第3の実施の形態を説明す
る。第1の実施の形態と同じ構成部には同じ符号が付し
てある。この実施の形態では補正回路46が基準値設定
回路47によって予め設定された基準値V5と電圧信号
S2とに基づいて差演算回路36から出力された差信号
ΔSを補正する。基準値V5は受光素子30における適
正な受光レベルに対応して設定されている。基準値V5
は図6(a)に示してある。補正回路46は例えば差信
号ΔSをΔS・V5/S2のように補正して比較回路3
7に出力する。補正された差信号ΔS・V5/S2が基
準範囲〔V1,V2〕から外れた場合には比較回路37
は出力回路40に欠点検出信号ST を出力する。
Next, a third embodiment shown in FIG. 8 will be described. The same components as those in the first embodiment are denoted by the same reference numerals. In this embodiment, the correction circuit 46 corrects the difference signal ΔS output from the difference calculation circuit 36 based on the reference value V5 preset by the reference value setting circuit 47 and the voltage signal S2. The reference value V5 is set corresponding to an appropriate light receiving level in the light receiving element 30. Reference value V5
Is shown in FIG. 6 (a). The correction circuit 46 corrects the difference signal ΔS as ΔS · V5 / S2, for example, and compares it with the comparison circuit 3
Output to 7. When the corrected difference signal ΔS · V5 / S2 is out of the reference range [V1, V2], the comparison circuit 37
Outputs the defect detection signal S T to the output circuit 40.

【0036】受光レベルが適正レベルよりも大きすぎる
場合には、本来基準範囲〔V1,V2〕内であるべき差
信号ΔSが基準範囲〔V1,V2〕から外れてしまうお
それがある。逆に、受光レベルが適正レベルよりも小さ
すぎる場合には、本来基準範囲〔V1,V2〕から外れ
るべき差信号ΔSが基準範囲〔V1,V2〕内に収まっ
てしまうおそれがある。補正回路46による前記したよ
うな補正の上で行われる検反用電気信号と検反基準値と
の比較は織り状態を精度良く反映し、誤検反が防止され
る。
If the received light level is higher than the appropriate level, the difference signal ΔS, which should originally be within the reference range [V1, V2], may deviate from the reference range [V1, V2]. On the contrary, when the light receiving level is too lower than the appropriate level, the difference signal ΔS, which should originally be out of the reference range [V1, V2], may fall within the reference range [V1, V2]. The comparison between the detection electric signal and the detection reference value, which is performed by the correction circuit 46 after the above-described correction, accurately reflects the weaving state and prevents false detection.

【0037】なお、この実施の形態では差信号ΔSを補
正したが、基準範囲〔V1,V2〕の方を補正するよう
にした実施の形態も可能である。次に、図9の第4の実
施の形態を説明する。第1の実施の形態と同じ構成部に
は同じ符号が付してある。この実施の形態では、センサ
ヘッド12上に一対の反射鏡48,49及び一対の凸レ
ンズ50,51が取り付けられている。凸レンズ50,
51の焦点は織布W上に設定されている。反射鏡48,
49は投光器22と受光器27とを結ぶ線上にある。反
射鏡48,49は互いに逆向きに凸レンズ26の光軸及
び集光レンズ31,32の光軸に対してある角度で傾い
ている。スリット板25には一対のスリット252,2
53が形成されている。スリット252,253を通過
した平行光は反射鏡48によって織布Wに向けて反射さ
れる。織布Wから反射した光の一部は凸レンズ50,5
1によって平行光にされる。これらの平行光は反射鏡4
9によって集光レンズ31,32に向けて反射される。
Although the difference signal ΔS is corrected in this embodiment, an embodiment in which the reference range [V1, V2] is corrected is also possible. Next, a fourth embodiment of FIG. 9 will be described. The same components as those in the first embodiment are denoted by the same reference numerals. In this embodiment, a pair of reflecting mirrors 48, 49 and a pair of convex lenses 50, 51 are mounted on the sensor head 12. Convex lens 50,
The focus of 51 is set on the woven fabric W. Reflector 48,
49 is on a line connecting the light projector 22 and the light receiver 27. The reflecting mirrors 48 and 49 are tilted in opposite directions with respect to the optical axis of the convex lens 26 and the optical axes of the condenser lenses 31 and 32 at a certain angle. The slit plate 25 has a pair of slits 252, 2
53 are formed. The parallel light that has passed through the slits 252 and 253 is reflected by the reflecting mirror 48 toward the woven fabric W. Part of the light reflected from the woven cloth W is a convex lens 50, 5
It is collimated by 1. These parallel rays are reflected by the mirror 4.
It is reflected toward the condenser lenses 31 and 32 by 9.

【0038】凸レンズ50,51の織布W上の焦点はあ
る程度離れているが、各焦点上の検知範囲に対する受光
レベルに大きな違いはない。従って、この実施の形態に
おいても第1の実施の形態とそれほど変わらない効果が
得られる。
Although the focal points of the convex lenses 50 and 51 on the woven cloth W are apart to some extent, there is no great difference in the light receiving level with respect to the detection range on each focal point. Therefore, also in this embodiment, the same effect as in the first embodiment can be obtained.

【0039】さらに本発明は、検知範囲を経糸の糸方向
に並べた実施の形態も可能である。。検知範囲を経糸の
糸方向に配設した場合には欠点検出信号の出力は緯糸の
欠点を検出したことによるものとなる。
Further, in the present invention, an embodiment in which the detection ranges are arranged in the yarn direction of the warp yarn is possible. . When the detection range is arranged in the warp yarn direction, the defect detection signal is output because the defect of the weft yarn is detected.

【0040】図10に示すように前記各実施の形態にお
ける差演算回路を用いない第5の実施の形態も可能であ
る。この実施の形態では比較回路52が基準値設定回路
53によって予め設定された基準値と電圧信号S1とを
直接比較し、この比較結果に基づいて欠点検出信号ST
を出力するか否かを判定する。
As shown in FIG. 10, a fifth embodiment in which the difference calculation circuit in each of the above embodiments is not used is also possible. In this embodiment, the comparison circuit 52 directly compares the reference value preset by the reference value setting circuit 53 with the voltage signal S1, and based on the comparison result, the defect detection signal S T
Is output.

【0041】以下に、実施の形態の効果を記載する。 (1)複数の地点の織り状態を反映する光を変換した電
気信号の2つの差を演算し、この演算によって得られた
差と検反基準値とを比較する実施の形態では、風綿、検
反装置以外の照明光等の外乱の影響を排除でき、誤検反
の回避に寄与する。 (2)検知範囲で示す複数地点を接近せさた実施の形態
では、各地点に対する受光レベルが同一となり、検反光
の受光レベルが適正か否かの判断を正確に行える。 (3)複数地点から拾われた光をいずれも参照光とする
実施の形態では、織布上の欠点の早期発見が保障され
る。
The effects of the embodiment will be described below. (1) In the embodiment in which the difference between the electric signals obtained by converting the light that reflects the weaving condition at a plurality of points is calculated and the difference obtained by this calculation is compared with the inspection reference value, The influence of disturbances such as illumination light other than the inspection device can be eliminated, which contributes to avoiding false inspection. (2) In the embodiment in which a plurality of points indicated by the detection range are brought close to each other, the light receiving level for each point is the same, and it is possible to accurately determine whether the light receiving level of the inspection light is appropriate. (3) In the embodiment in which light picked up from a plurality of points is used as the reference light, early detection of defects on the woven fabric is guaranteed.

【0042】[0042]

【発明の効果】以上詳述したように、織布上の複数地点
の1つにおける織り状態を反映する光を変換した参照用
電気信号と参照基準値との比較の結果に基づいて、前記
複数地点の少なくとも他における織り状態を反映する光
を変換した検反用電気信号の比較対象となる検反基準値
と検反用電気信号とのいずれか一方を補正する発明で
は、光学的処理に対する外乱の影響を排除して誤検反を
回避し得る。
As described above in detail, based on the result of the comparison between the reference electric signal for converting the light reflecting the weaving condition at one of the plural points on the woven cloth and the reference reference value, In the invention that corrects either one of the detection reference value and the detection electric signal that is the comparison target of the detection electric signal obtained by converting the light that reflects the weaving state at least at another point, the disturbance to the optical processing is The influence of can be eliminated and false inspection can be avoided.

【0043】織布上の複数地点の1つにおける織り状態
を反映する光を変換した参照用電気信号と参照基準値と
の比較の結果に基づいて、前記複数地点の少なくとも他
における織り状態を反映する光を変換した検反用電気信
号の採否を判定する発明では、光学的処理に対する外乱
の影響を排除して誤検反を回避し得る。
Based on the result of the comparison of the reference electric signal for converting the light, which reflects the weaving condition at one of the plural points on the woven cloth, and the reference reference value, the weaving condition at at least the other points of the plural points is reflected. In the invention for determining whether to adopt the inspection electric signal obtained by converting the light, the influence of disturbance on the optical processing can be eliminated to avoid erroneous detection.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1の実施の形態を示す一部省略正面
図。
FIG. 1 is a partially omitted front view showing a first embodiment of the present invention.

【図2】図1のA−A線断面図。FIG. 2 is a sectional view taken along line AA of FIG.

【図3】図1のB−B線断面図。FIG. 3 is a sectional view taken along line BB of FIG. 1;

【図4】織布上の検知範囲と制御回路との組合わせ図。FIG. 4 is a combination diagram of a detection range on a woven fabric and a control circuit.

【図5】検知範囲の走査領域を示す平面図。FIG. 5 is a plan view showing a scanning area of a detection range.

【図6】(a)〜(d)は制御回路における信号処理を
説明するグラフ。
6A to 6D are graphs illustrating signal processing in a control circuit.

【図7】第2の実施の形態を示す織布上の検知範囲と制
御回路との組合わせ図。
FIG. 7 is a combination diagram of the detection range on the woven fabric and the control circuit according to the second embodiment.

【図8】第3の実施の形態を示す織布上の検知範囲と制
御回路との組合わせ図。
FIG. 8 is a combination diagram of a detection range on a woven fabric and a control circuit according to the third embodiment.

【図9】第4の実施の形態を示す一部省略正面図。FIG. 9 is a partially omitted front view showing a fourth embodiment.

【図10】第5の実施の形態を示す一部省略正面図。FIG. 10 is a partially omitted front view showing a fifth embodiment.

【符号の説明】[Explanation of symbols]

201,211…複数地点のいずれかとなる検知範囲、
29,30…光電センサとなる受光素子、36…差演算
回路、37…第2の比較手段となる比較回路、38,3
9…検反基準値を設定するための基準値設定回路、4
0,45…採否判定手段となる出力回路、41…第1の
比較手段となる比較回路、42,43…参照基準値を設
定するための基準値設定回路、46…補正手段となる補
正回路、W…織布。
2011, 211 ... A detection range that is one of a plurality of points,
29, 30 ... Light receiving element serving as photoelectric sensor, 36 ... Difference arithmetic circuit, 37 ... Comparison circuit serving as second comparing means, 38, 3
9 ... Reference value setting circuit for setting inspection reference value, 4
0, 45 ... Output circuit serving as acceptance / rejection judging means, 41 ... Comparison circuit serving as first comparing means, 42, 43 ... Reference value setting circuit for setting reference reference value, 46 ... Correction circuit serving as correcting means, W ... Woven cloth.

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 G01N 21/89 G01N 21/89 C ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 6 Identification code Internal reference number FI technical display location G01N 21/89 G01N 21/89 C

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】織布の織り状態を反映する光の受光量に応
じた電気信号を出力する光電センサを用いて織布の欠点
を検出する織布検反方法において、 織布上の複数地点を同時に光で走査し、これら複数の地
点の1つにおける織り状態を反映する光を参照用の電気
信号に変換すると共に、この参照用電気信号と参照基準
値とを比較し、前記複数の地点の少なくとも他における
織り状態を反映する光を検反用の電気信号に変換し、こ
の検反用電気信号の比較対象となる検反基準値と前記検
反用電気信号のいずれか一方を前記参照用電気信号と参
照基準値との比較の結果に基づいて補正する織布検反方
法。
1. A woven fabric inspection method for detecting a defect of a woven fabric by using a photoelectric sensor that outputs an electric signal according to an amount of received light that reflects a woven state of the woven fabric, and a plurality of points on the woven fabric. Are simultaneously scanned with light to convert the light reflecting the weaving condition at one of the plurality of points into a reference electric signal, and compare the reference electric signal with a reference reference value to determine the plurality of points. The light reflecting the weaving state in at least the other is converted into an electric signal for detection, and reference is made to either one of the reference electric value for detection and the electric signal for detection to be compared with the electric signal for detection. Woven fabric inspection method that corrects based on the result of comparison between the electrical signal for use and the reference value.
【請求項2】織布の織り状態を反映する光の受光量に応
じた電気信号を出力する光電センサを用いて織布の欠点
を検出する織布検反方法において、 織布上の複数地点を同時に光で走査し、これら複数の地
点の1つにおける織り状態を反映する光を参照用の電気
信号に変換すると共に、この参照用電気信号と参照基準
値とを比較し、前記複数の地点の少なくとも他における
織り状態を反映する光を検反用の電気信号に変換し、前
記参照用電気信号と参照基準値との比較の結果に基づい
て前記検反用電気信号の採否を判定する織布検反方法。
2. A woven fabric inspection method for detecting a defect of a woven fabric by using a photoelectric sensor that outputs an electric signal according to an amount of received light reflecting a woven state of the woven fabric, and at a plurality of points on the woven fabric. Are simultaneously scanned with light to convert the light reflecting the weaving condition at one of the plurality of points into a reference electric signal, and compare the reference electric signal with a reference reference value to determine the plurality of points. Of light that reflects the weaving state in at least another of the weaving conditions is converted into an electric signal for detection, and whether or not the electric signal for detection is adopted is determined based on the result of the comparison between the reference electric signal and the reference reference value. Cloth inspection method.
【請求項3】前記複数地点を接近させた請求項1及び請
求項2のいずれか1項に記載の織布検反方法。
3. The woven fabric inspection method according to claim 1, wherein the plurality of points are brought close to each other.
【請求項4】前記複数の地点の織り状態を反映する光を
変換した電気信号の2つの差を演算し、この演算によっ
て得られた差と検反基準値とを比較する請求項1乃至請
求項3のいずれか1項に記載の織布検反方法。
4. The method according to claim 1, wherein two differences between light-converted electric signals that reflect the weaving condition of the plurality of points are calculated, and the difference obtained by this calculation is compared with the inspection reference value. Item 5. The woven fabric inspection method according to any one of Item 3.
【請求項5】織布の織り状態を反映する光の受光量に応
じた電気信号を出力する光電センサを用いて織布の欠点
を検出する織布検反装置において、 織布の織り状態を反映する光を受光する第1の光電セン
サと、 前記光電センサの検出地点とは別の地点に検出領域を持
つ第2の光電センサと、 第1の光電センサ及び第2の光電センサの一方から得ら
れる参照用電気信号と参照基準値とを比較する第1の比
較手段と、 第1の光電センサ及び第2の光電センサの少なくとも他
方から得られる検反用電気信号と検反基準値とを比較す
る第2の比較手段と、 前記第2の比較手段における比較結果を前記第1の比較
手段の比較結果に基づいて補正する補正手段とを備えた
織布検反装置。
5. A woven fabric inspection device for detecting a defect of a woven fabric by using a photoelectric sensor which outputs an electric signal according to an amount of received light which reflects a woven state of the woven fabric. From a first photoelectric sensor that receives reflected light, a second photoelectric sensor that has a detection region at a point different from the detection point of the photoelectric sensor, and one of the first photoelectric sensor and the second photoelectric sensor A first comparing means for comparing the obtained reference electric signal with the reference reference value; and a detection electric signal and a detection reference value obtained from at least the other of the first photoelectric sensor and the second photoelectric sensor. A woven fabric inspection device comprising: a second comparing means for comparing; and a correcting means for correcting the comparison result of the second comparing means based on the comparison result of the first comparing means.
【請求項6】織布の織り状態を反映する光の受光量に応
じた電気信号を出力する光電センサを用いて織布の欠点
を検出する織布検反装置において、 織布の織り状態を反映する光を受光する第1の光電セン
サと、 前記光電センサの検出地点とは別の地点に検出領域を持
つ第2の光電センサと、 第1の光電センサ及び第2の光電センサの一方から得ら
れる参照用電気信号と参照基準値とを比較する第1の比
較手段と、 第1の光電センサ及び第2の光電センサの少なくとも他
方から得られる検反用電気信号と検反基準値とを比較す
る第2の比較手段と、 第1の比較手段における比較結果の採否を前記第2の比
較手段の比較結果に基づいて判定する採否判定手段とを
備えた織布検反装置。
6. A woven fabric inspection device for detecting a defect of a woven fabric by using a photoelectric sensor which outputs an electric signal according to an amount of received light which reflects the woven state of the woven fabric. From a first photoelectric sensor that receives reflected light, a second photoelectric sensor that has a detection region at a point different from the detection point of the photoelectric sensor, and one of the first photoelectric sensor and the second photoelectric sensor A first comparing means for comparing the obtained reference electric signal with the reference reference value; and a detection electric signal and a detection reference value obtained from at least the other of the first photoelectric sensor and the second photoelectric sensor. A woven fabric inspection device comprising: a second comparing means for making a comparison; and an acceptance / rejection determining means for determining acceptance / rejection of a comparison result by the first comparing means based on the comparison result of the second comparing means.
【請求項7】前記第1の光電センサ及び第2の光電セン
サから得られる電気信号の差を演算する差演算手段と、 前記差演算手段の演算結果に基づいて欠点検出信号を出
力するか否かを判定する欠点判定手段とを備えた第1の
比較手段を構成した請求項5及び請求項6のいずれか1
項に記載の織布検反装置。
7. A difference calculation means for calculating a difference between electric signals obtained from the first photoelectric sensor and the second photoelectric sensor, and whether or not to output a defect detection signal based on a calculation result of the difference calculation means. 7. A first comparing means comprising a defect determining means for determining whether or not it is any one of claims 5 and 6.
The woven fabric inspection device according to the item.
JP22397095A 1995-08-31 1995-08-31 Woven cloth inspection and apparatus therefor Pending JPH0967760A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22397095A JPH0967760A (en) 1995-08-31 1995-08-31 Woven cloth inspection and apparatus therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22397095A JPH0967760A (en) 1995-08-31 1995-08-31 Woven cloth inspection and apparatus therefor

Publications (1)

Publication Number Publication Date
JPH0967760A true JPH0967760A (en) 1997-03-11

Family

ID=16806541

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22397095A Pending JPH0967760A (en) 1995-08-31 1995-08-31 Woven cloth inspection and apparatus therefor

Country Status (1)

Country Link
JP (1) JPH0967760A (en)

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