JPH09318555A - Visual inspection method - Google Patents

Visual inspection method

Info

Publication number
JPH09318555A
JPH09318555A JP8136271A JP13627196A JPH09318555A JP H09318555 A JPH09318555 A JP H09318555A JP 8136271 A JP8136271 A JP 8136271A JP 13627196 A JP13627196 A JP 13627196A JP H09318555 A JPH09318555 A JP H09318555A
Authority
JP
Japan
Prior art keywords
inspection
area
small
dictionary
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8136271A
Other languages
Japanese (ja)
Other versions
JP3717088B2 (en
Inventor
Shinji Natsume
新二 夏目
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Fuji Facom Corp
Original Assignee
Fuji Electric Co Ltd
Fuji Facom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd, Fuji Facom Corp filed Critical Fuji Electric Co Ltd
Priority to JP13627196A priority Critical patent/JP3717088B2/en
Publication of JPH09318555A publication Critical patent/JPH09318555A/en
Application granted granted Critical
Publication of JP3717088B2 publication Critical patent/JP3717088B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To enhance the inspection accuracy while simplifying the setting of an inspection area. SOLUTION: The image of an object 15 being picked up by means of a camera 11 is processed by means of an inspection unit 13 in order to check the external view of the object 15. When an inspection area 21 is set, a conventional method for inspecting the area 21 using an entire dictionary therefor is not employed but a dictionary is prepared for each of a plurality of small areas 31-34, 41-44 in order to enhance the inspection accuracy.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】この発明は、検査対象を画像
処理しパターンマッチング手法を利用して検査対象の良
否検査を行なう外観検査方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a visual inspection method for image-processing an inspection object and performing a quality inspection of the inspection object using a pattern matching method.

【0002】[0002]

【従来の技術】従来、この種の良否検査としては、検査
対象画像を含む所定検査領域全体について1つの辞書を
作成し、この辞書と検査対象画像(入力画像)との間の
パターンマッチングにより行なうものが多い。すなわ
ち、辞書と入力画像との類似度rを、例えば次の(1)
式の如き関係から求めて、その値にもとづき良否を判定
するものである。 r={NΣ(B×G)−ΣB×ΣG} /√[{NΣB2 −(ΣB)2 }×{NΣG2 −(ΣG)2 }]…(1) N:辞書の点数、Σ(B×G):辞書画像と入力画像と
の相互相関値 ΣB:入力画像の輝度値の総和、ΣB2 :入力画像の自
己相関値 ΣG:辞書画像の輝度値の総和、ΣG2 :辞書画像の自
己相関値
2. Description of the Related Art Conventionally, as this kind of quality inspection, one dictionary is created for the entire predetermined inspection area including the inspection target image, and pattern matching is performed between this dictionary and the inspection target image (input image). There are many things. That is, the similarity r between the dictionary and the input image is calculated by, for example, the following (1)
The quality is determined based on the value obtained from the relation as in the formula. r = {NΣ (B × G) −ΣB × ΣG} / √ [{NΣB 2 − (ΣB) 2 } × {NΣG 2 − (ΣG) 2 }] ... (1) N: score of dictionary, Σ (B × G): Cross-correlation value between dictionary image and input image ΣB: Sum of brightness values of input image, ΣB 2 : Autocorrelation value of input image ΣG: Sum of brightness values of dictionary image, ΣG 2 : Self of dictionary image Correlation value

【0003】また、特徴のある部分(輝度値の変化があ
る部分)と、特徴のない部分(輝度値の変化がほとんど
ない部分)が混在するような検査対象の外観検査には、
手作業により特徴のある領域と特徴のない領域とに分割
して検査を行なうようにしている。例えば、図6(イ)
のような検査対象画像があるとき、図6(ハ)のように
領域1〜5を設定して検査するわけである。
Further, the appearance inspection of an inspection object in which a characteristic part (a part where the brightness value changes) and a non-characteristic part (a part where the brightness value hardly changes) are mixed,
The inspection is performed manually by dividing into a characteristic region and a non-characteristic region. For example, FIG.
When there is such an image to be inspected, the areas 1 to 5 are set and inspected as shown in FIG.

【0004】[0004]

【発明が解決しようとする課題】ところで、パターンマ
ッチングで利用される、上記(1)式のような相関演算
で得られる類似度rは、辞書とする部分(検査領域)の
面積に対する傷や汚れの部分の割合によって変化するた
め、上記のように検査領域全体を1つの辞書としてパタ
ーンマッチングによる検査をすると、傷や汚れなどの検
出精度が不十分な場合がある。このため、検査領域を図
6(ロ)の符号1〜4で示すように分けて設定すること
が考えられるが、検査領域の面積によって傷や汚れなど
の検出精度が変化するため、一定の検出精度を確保する
には、検査領域を指定するときにその面積が同程度とな
るように分割して指定することが必要となり、設定が面
倒になるという問題がある。また、多くの場合、検査領
域として指定可能な領域の数は限られているため、要求
される検査精度によっては、設定が不可能になるような
ケースも発生している。
By the way, the similarity r obtained by the correlation calculation such as the above equation (1), which is used in the pattern matching, is a scratch or a stain on the area of the portion (inspection area) to be a dictionary. Since it changes depending on the ratio of the portion, if the inspection is performed by pattern matching using the entire inspection area as one dictionary as described above, the detection accuracy of scratches or stains may be insufficient. Therefore, it is conceivable to set the inspection area separately as shown by reference numerals 1 to 4 in FIG. 6B. However, since the detection accuracy of scratches, dirt, and the like changes depending on the area of the inspection area, a constant detection is performed. In order to ensure accuracy, it is necessary to specify the inspection area by dividing it so that the areas are about the same, which causes a problem of setting. Further, in many cases, the number of areas that can be designated as the inspection area is limited, and there are cases in which the setting becomes impossible depending on the required inspection accuracy.

【0005】さらに、特徴のない部分(輝度値の変化が
ほとんどない部分)では、カメラからの入力画像の微小
な変動(入力系のノイズや量子化雑音などによる)の影
響により、類似度を正しく算出できないため、特徴のな
い部分についてはパターンマッチングによる検査を適用
することができないという問題もある。そのため、特徴
ある部分と特徴のない部分が混在する物を検査する場
合、検査領域を特徴ある部分と特徴のない部分に分けて
指定することが必要となり、設定が面倒である。加え
て、検査対象によっては検査領域として指定可能な領域
の数の制限から、設定が不可能になるケースも発生して
いる。したがって、この発明の課題は、傷や汚れに対す
る検出精度の低下や設定の不便さを解消し、設定が不可
能となるケースをなくすことにある。
Further, in a featureless portion (a portion in which there is almost no change in the brightness value), the similarity is accurately determined due to the influence of a minute fluctuation of the input image from the camera (due to input system noise or quantization noise). Since it cannot be calculated, there is also a problem that the inspection by pattern matching cannot be applied to a portion having no characteristic. Therefore, when inspecting an object in which a characteristic part and a non-characteristic part coexist, it is necessary to specify the inspection area separately for the characteristic part and the non-characteristic part, which is troublesome to set. In addition, depending on the object to be inspected, there are cases where the setting becomes impossible due to the limitation of the number of areas that can be designated as the inspection area. Therefore, an object of the present invention is to eliminate the deterioration of the detection accuracy for scratches and dirt and the inconvenience of setting, and to eliminate the case where setting is impossible.

【0006】[0006]

【課題を解決するための手段】このような課題を解決す
べく、請求項1の発明では、指定された検査領域を任意
のサイズの矩形小領域に分割し、各小領域について辞書
を作成して辞書と検査対象画像との間でパターンマッチ
ングをとることにより、傷や汚れに対する検出精度を低
下させないようにしている。このとき、矩形小領域のサ
イズを任意とすることで、傷や汚れに対する検出精度を
調整することが可能となる。請求項2の発明では、各小
領域ごとに辞書の輝度値の分散値を求め、その分散値が
設定値以下の領域では検査対象画像を輝度値の分散値に
よって検査し、分散値が設定値より大きい領域では辞書
と検査対象画像との間のパターンマッチングによる検査
を行なうようにしている。これにより、特徴ある部分と
特徴のない部分が混在する検査対象についても、簡単な
設定で高精度な検査ができるようになる。
In order to solve such a problem, in the invention of claim 1, the specified inspection area is divided into rectangular small areas of arbitrary size, and a dictionary is created for each small area. By performing pattern matching between the dictionary and the image to be inspected, the detection accuracy for scratches and stains is prevented from deteriorating. At this time, by setting the size of the rectangular small area to any size, it is possible to adjust the detection accuracy for scratches and dirt. According to the second aspect of the present invention, the variance value of the brightness value of the dictionary is obtained for each small area, and the image to be inspected is inspected by the variance value of the brightness value in the area where the variance value is less than or equal to the set value. In a larger area, inspection is performed by pattern matching between the dictionary and the image to be inspected. As a result, it becomes possible to perform highly accurate inspection with simple settings even for an inspection target in which characteristic portions and non-characteristic portions are mixed.

【0007】請求項3の発明では、各小領域の一部が互
いに重複するよう領域の分割を行なうことで、小領域の
境界部での検出精度の安定化を図るようにしている。さ
らに、請求項4の発明では、任意形状の検査領域を小領
域に分割する際、小領域内に存在する検査画像の面積が
最大となるように、小領域の分割位置を補正すること
で、小領域内に任意形状領域のごく一部分しか含まれな
いような場合の検出精度の安定化を図るようにしてい
る。
According to the third aspect of the present invention, the division of the areas is performed so that the small areas partially overlap each other, thereby stabilizing the detection accuracy at the boundary of the small areas. Further, in the invention of claim 4, when the inspection area having an arbitrary shape is divided into small areas, the division position of the small area is corrected so that the area of the inspection image existing in the small area is maximized. The detection accuracy is stabilized when only a small portion of the arbitrarily shaped area is included in the small area.

【0008】[0008]

【発明の実施の形態】図1はこの発明の実施の形態を説
明するための説明図である。同図(イ)はこの発明が実
施される画像処理システムの概要図、(ロ)は検査領域
画像例、(ハ),(ニ)は領域分割例の説明図である。
すなわち、この発明では、図1(イ)のようなシステム
により、検査対象15を撮像装置としてのカメラ11に
より撮像し、その画像信号12を画像処理検査装置13
に送り、そこで良否判定をし判定結果信号14を出力す
るものである。ここまでは、従来のものと変わりない
が、この発明ではさらに以下のような処理を行なう。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is an explanatory diagram for explaining an embodiment of the present invention. FIG. 3A is a schematic diagram of an image processing system in which the present invention is implemented, FIG. 2B is an inspection region image example, and FIGS.
That is, according to the present invention, the inspection target 15 is imaged by the camera 11 as an imaging device and the image signal 12 of the inspection target 15 is imaged by the system shown in FIG.
The quality is judged there and the judgment result signal 14 is outputted. Up to this point, the processing is the same as the conventional one, but the present invention further performs the following processing.

【0009】いま、基準とする画像を取り込んだ後、図
1(ロ)の如く検査対象とする検査領域21を指定し、
画像処理検査装置13に指示を与える。検査装置13は
指定された領域21を、例えば図1(ハ)のように予め
設定されたサイズの矩形小領域(ここでは31,32,
33,34の4領域)に分割し、各小領域31,32,
33,34ごとにパターンマッチング用の辞書を作成す
る。その後、検査対象の画像(入力画像)を取り込み、
各小領域ごとにパターンマッチングによる検査を行な
う。なお、ここでは各小領域を重複しないように分割し
たが、図1(ニ)のように各小領域の一部が重複するよ
うに、小領域の始点(例えば、左上座標)をずらしなが
ら分割することができる。そのときの各小領域を符号4
1,42,43,44で、また、重複領域を符号45で
示す。こうすることで、各小領域の境界部付近での変動
を吸収し、検出精度の安定化を図ることができる。
Now, after the reference image is captured, the inspection area 21 to be inspected is designated as shown in FIG.
An instruction is given to the image processing inspection device 13. The inspection device 13 replaces the designated area 21 with a rectangular small area (here, 31, 32, in this case) of a preset size as shown in FIG.
33, 34), and each small area 31, 32,
A dictionary for pattern matching is created for each of 33 and 34. After that, capture the image of the inspection target (input image),
Inspection by pattern matching is performed for each small area. Although the small areas are divided so as not to overlap with each other here, as shown in FIG. 1D, the start points (for example, upper left coordinates) of the small areas are shifted so that the small areas overlap. can do. Each small area at that time is coded 4
1, 42, 43 and 44, and the overlapping area is indicated by reference numeral 45. By doing so, it is possible to absorb fluctuations in the vicinity of the boundary of each small region and stabilize the detection accuracy.

【0010】図2はこの発明の別の実施の形態を示すフ
ローチャート、図3は図2を具体的に説明するための説
明図である。まず、基準とする画像を取り込んだ後(図
2ステップS1参照)、図3(イ)の如く検査対象とす
る検査領域51を指定し、画像処理検査装置13に指示
を与える。検査装置13は指定された領域51を、例え
ば図3(ロ)のように予め設定されたサイズの矩形小領
域61,62(61:分散値小、62:分散値大)など
に分割する。つづいて、ここでは分割された各小領域に
ついて輝度値の分散値を算出する。また、算出した分散
値を記憶しておき、分散値が大きい領域では図1の場合
と同じくパターンマッチング用の辞書を作成する。
FIG. 2 is a flow chart showing another embodiment of the present invention, and FIG. 3 is an explanatory diagram for specifically explaining FIG. First, after the reference image is captured (see step S1 in FIG. 2), the inspection area 51 to be inspected is designated as shown in FIG. 3A and the image processing inspection device 13 is instructed. The inspection device 13 divides the designated area 51 into rectangular small areas 61 and 62 (61: small dispersion value, 62: large dispersion value) of a preset size, for example, as shown in FIG. Subsequently, here, the variance value of the brightness values is calculated for each of the divided small areas. Further, the calculated dispersion value is stored, and in the area where the dispersion value is large, a dictionary for pattern matching is created as in the case of FIG.

【0011】その後の検査実行時には、検査対象画像
(入力画像)を取り込み、基準とする画像の分散値が設
定値よりも大きい領域ではパターンマッチングによる検
査を行ない(図2のステップS2〜S8,S12参
照)、基準とする画像の分散値が設定値以下の領域で
は、検査対象画像の該当する領域との分散値の比較によ
る検査を行なう(図2ステップS2,S3,S7〜S1
2参照)。以上では、分散値の比較による検査を行なう
ようにしているが、特徴のない部分の検査に有効な手段
であれば、例えば輝度値の最大値,最小値の比較による
検査や、一定範囲の輝度値を持つ画素の数による検査を
行なうようにしても良いものである。また、小領域6
1,62の分割に当たっては、図1(ニ)の如くその一
部が重複するように分割することができるのは言うまで
もない。
At the time of executing the subsequent inspection, the image to be inspected (input image) is taken in, and the inspection by pattern matching is performed in the region where the variance value of the reference image is larger than the set value (steps S2 to S8 and S12 in FIG. 2). In a region in which the variance value of the reference image is less than or equal to the set value, the inspection is performed by comparing the variance value with the corresponding region of the inspection target image (steps S2, S3, S7 to S1 in FIG. 2).
2). In the above, the inspection is performed by comparing the variance values. However, as long as it is an effective means for inspecting a featureless portion, for example, the inspection is performed by comparing the maximum value and the minimum value of the luminance value, or the luminance in a certain range. The inspection may be performed by the number of pixels having a value. Also, small area 6
It goes without saying that the division of 1, 62 can be performed so that a part thereof overlaps as shown in FIG.

【0012】図4はこの発明のさらに別の実施の形態を
示すフローチャート、図5は図4を具体的に説明するた
めの説明図である。これは、任意形状の検査領域の分割
方法を説明するものである。いま、図5(イ)のような
検査領域71があるとき、まず、図5(ロ)の如く検査
領域の外接矩形81を作り(図4ステップS1参照)、
これをYサイズの帯状に分割したのち(図4ステップS
2参照)、各帯ごとに以下のような処理を実行する。
FIG. 4 is a flow chart showing still another embodiment of the present invention, and FIG. 5 is an explanatory view for specifically explaining FIG. This describes a method of dividing an inspection area having an arbitrary shape. When there is an inspection area 71 as shown in FIG. 5A, first, a circumscribed rectangle 81 of the inspection area is made as shown in FIG. 5B (see step S1 in FIG. 4).
After dividing this into Y-sized strips (step S in FIG. 4).
2), the following processing is executed for each band.

【0013】すなわち、帯の左端からサーチを行なって
検査領域の左端をみつけ、そのX座標位置を最初の小領
域の左端X0とし、X0を左端とする小領域を作成する
(図4ステップS3,S4参照)。なお、小領域の大き
さは、検査対象に応じて予め設定しておくこととする。
次に、小領域の左端からサーチを行ない、小領域内の検
査領域の左端X1を見つける(図4ステップS5参
照)。見つかったX1が小領域の左端X0と同じ場合
は、小領域の右端からサーチを行ない、小領域内で検査
領域の右端X2を見つける(図4ステップS6,S7参
照)。X2を見つけた場合は小領域の右端をX2とする
よう小領域の分割位置の補正を行ない(図4ステップS
8参照)、そうでない場合は小領域の左端をX1とする
よう小領域の分割位置の補正を行なう(図4ステップS
7’参照)。
That is, a search is performed from the left end of the band to find the left end of the inspection area, and its X coordinate position is set to the left end X0 of the first small area, and a small area whose left end is X0 is created (step S3 in FIG. 4). (See S4). The size of the small area is set in advance according to the inspection target.
Next, a search is performed from the left end of the small area to find the left end X1 of the inspection area within the small area (see step S5 in FIG. 4). If the found X1 is the same as the left edge X0 of the small area, the search is performed from the right edge of the small area to find the right edge X2 of the inspection area within the small area (see steps S6 and S7 in FIG. 4). When X2 is found, the division position of the small area is corrected so that the right end of the small area is set to X2 (step S in FIG. 4).
8), if not, the division position of the small area is corrected so that the left end of the small area is set to X1 (step S in FIG. 4).
7 ').

【0014】その後、小領域の上端からサーチを行な
い、小領域内の検査領域の上端Y1を見つける(図4ス
テップS9参照)。見つかったY1が小領域の上端と同
じ場合は小領域の下端からサーチを行ない、小領域内で
検査領域の下端Y2を見つける(図4ステップS10,
S11参照)。Y2を見つけた場合は小領域の下端をY
2とするよう、小領域の分割位置の補正を行ない(図4
ステップS12参照)、そうでない場合は小領域の上端
をY1とするよう小領域の分割位置の補正を行なう(図
4ステップS11’参照)。続いて、位置補正後の小領
域の右端座標を左端とする小領域を次の領域とし、上記
と同様な位置補正を行なう。その後、帯の右端に突き当
たったら(図4ステップS13参照)、つぎの帯に移っ
て分割処理を続行する(図4ステップS14,S15,
S16参照)。
Thereafter, a search is performed from the upper end of the small area to find the upper end Y1 of the inspection area within the small area (see step S9 in FIG. 4). When the found Y1 is the same as the upper end of the small area, a search is performed from the lower end of the small area to find the lower end Y2 of the inspection area within the small area (step S10 in FIG. 4).
See S11). If Y2 is found, the bottom of the small area is set to Y
The division position of the small area is corrected so as to be 2 (see FIG.
(See step S12), otherwise, the division position of the small area is corrected so that the upper end of the small area is Y1 (see step S11 'in FIG. 4). Subsequently, the small area having the right end coordinates of the small area after position correction as the left end is set as the next area, and the same position correction as described above is performed. After that, when it hits the right end of the band (see step S13 in FIG. 4), it moves to the next band and continues the division processing (steps S14, S15 in FIG. 4).
(See S16).

【0015】[0015]

【発明の効果】請求項1の発明によれば、指定された検
査領域を任意のサイズの矩形小領域に分割し、各小領域
について辞書を作成して辞書と検査対象画像との間でパ
ターンマッチングをとることで、傷や汚れに対する検出
精度を低下させないようにすることができる。このと
き、矩形小領域のサイズを任意とすれば、傷や汚れに対
する検出精度を調整することが可能となる。請求項2の
発明では、各小領域ごとに辞書の輝度値の分散値を求
め、その分散値が設定値以下の領域では検査対象画像を
輝度値の分散値によって検査し、分散値が設定値より大
きい領域では辞書と検査対象画像との間のパターンマッ
チングによる検査を行なうようにしているため、特徴あ
る部分と特徴のない部分が混在する検査対象について
も、簡単な設定で高精度な検査が可能となる。
According to the first aspect of the present invention, the specified inspection area is divided into rectangular small areas of arbitrary size, a dictionary is created for each small area, and a pattern is created between the dictionary and the image to be inspected. By performing matching, it is possible to prevent deterioration of detection accuracy for scratches and dirt. At this time, if the size of the rectangular small area is arbitrary, the detection accuracy for scratches and dirt can be adjusted. According to the second aspect of the present invention, the variance value of the brightness value of the dictionary is obtained for each small area, and the image to be inspected is inspected by the variance value of the brightness value in the area where the variance value is less than or equal to the set value. Since inspection is performed by pattern matching between the dictionary and the image to be inspected in a larger area, high precision inspection can be performed with simple settings even for inspection objects in which characteristic parts and non-characteristic parts coexist. It will be possible.

【0016】請求項3の発明によれば、各小領域の一部
が互いに重複するよう領域の分割を行なうことで、小領
域の境界部での検出精度を安定化することができ。さら
に、請求項4の発明では、任意形状の検査領域を小領域
に分割する際、小領域内に存在する検査画像の面積が最
大となるように、小領域の分割位置を補正するようにし
ているので、小領域内に任意形状領域のごく一部分しか
含まれないような場合の検出精度を安定化することがで
きる。
According to the third aspect of the present invention, by dividing the areas so that the small areas partially overlap each other, it is possible to stabilize the detection accuracy at the boundaries of the small areas. Further, in the invention of claim 4, when the inspection area having an arbitrary shape is divided into small areas, the division position of the small areas is corrected so that the area of the inspection image existing in the small areas becomes maximum. Therefore, it is possible to stabilize the detection accuracy in the case where only a small portion of the arbitrarily shaped area is included in the small area.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明の実施の形態を説明するための説明図
である。
FIG. 1 is an explanatory diagram for explaining an embodiment of the present invention.

【図2】この発明の別の実施の形態を示すフローチャー
トである。
FIG. 2 is a flowchart showing another embodiment of the present invention.

【図3】図2を具体的に説明する説明図である。FIG. 3 is an explanatory diagram for specifically explaining FIG. 2;

【図4】この発明のさらに別の実施の形態を示すフロー
チャートである。
FIG. 4 is a flow chart showing still another embodiment of the present invention.

【図5】図4を具体的に説明する説明図である。FIG. 5 is an explanatory diagram for specifically explaining FIG. 4;

【図6】従来方法の概要説明図である。FIG. 6 is a schematic explanatory diagram of a conventional method.

【符号の説明】[Explanation of symbols]

1,2,3,4,5,21,51,71…検査領域、1
1…カメラ、12…画像信号、13…画像処理検査装
置、14…判定結果信号、15…検査対象物、31,3
2,33,34,41,42,43,44,82…小領
域、45…重複領域、61…小領域(分散値小)、62
…小領域(分散値大)、81…外接矩形。
1, 2, 3, 4, 5, 21, 51, 71 ... Inspection area, 1
1 ... Camera, 12 ... Image signal, 13 ... Image processing inspection device, 14 ... Judgment result signal, 15 ... Inspection object, 31, 3
2, 33, 34, 41, 42, 43, 44, 82 ... Small area, 45 ... Overlapping area, 61 ... Small area (small variance value), 62
... Small area (large variance value), 81 ... Circumscribing rectangle.

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 検査対象を画像処理してその良否を検査
するに当たり、 基準となる検査対象画像を含む所定検査領域を任意の大
きさの矩形小領域ごとに分割し、分割された各小領域に
ついてパターンマッチングのための辞書を作成し、各小
領域ごとに辞書と検査対象画像とのパターンマッチング
により検査を行なうことを特徴とする外観検査方法。
1. When performing image processing on an inspection target to inspect its quality, a predetermined inspection region including a reference inspection target image is divided into rectangular small regions of arbitrary size, and each divided small region is divided. A visual inspection method is characterized in that a dictionary for pattern matching is created, and the inspection is performed by pattern matching between the dictionary and the image to be inspected for each small area.
【請求項2】 前記各小領域ごとに辞書の輝度値の分散
値を求め、算出された分散値が設定値以下の領域では輝
度値の分散値をもとに検査を行ない、分散値が設定値よ
りも大きい領域では辞書と検査対象画像とのパターンマ
ッチングにより検査を行なうことを特徴とする請求項1
に記載の外観検査方法。
2. The dispersion value of the brightness value of the dictionary is obtained for each of the small areas, and in the area where the calculated dispersion value is less than or equal to the set value, inspection is performed based on the dispersion value of the brightness value, and the dispersion value is set. 2. An area larger than the value is inspected by pattern matching between a dictionary and an image to be inspected.
Appearance inspection method described in.
【請求項3】 前記各小領域を、その一部が互いに重複
するように分割することを特徴とする請求項1または2
のいずれかに記載の外観検査方法。
3. The small area is divided so that a part thereof overlaps each other.
The visual inspection method according to any one of 1.
【請求項4】 前記所定検査領域を小領域に分割するに
当たり、小領域にある検査領域の面積が最大となるよ
う、前記小領域の分割位置を補正することを特徴とする
請求項1ないし3のいずれかに記載の外観検査方法。
4. When dividing the predetermined inspection area into small areas, the division position of the small area is corrected so that the area of the inspection area in the small area is maximized. The visual inspection method according to any one of 1.
JP13627196A 1996-05-30 1996-05-30 Appearance inspection method Expired - Lifetime JP3717088B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13627196A JP3717088B2 (en) 1996-05-30 1996-05-30 Appearance inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13627196A JP3717088B2 (en) 1996-05-30 1996-05-30 Appearance inspection method

Publications (2)

Publication Number Publication Date
JPH09318555A true JPH09318555A (en) 1997-12-12
JP3717088B2 JP3717088B2 (en) 2005-11-16

Family

ID=15171299

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13627196A Expired - Lifetime JP3717088B2 (en) 1996-05-30 1996-05-30 Appearance inspection method

Country Status (1)

Country Link
JP (1) JP3717088B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001325587A (en) * 2000-05-16 2001-11-22 Dainippon Printing Co Ltd Outward appearance inspecting device
US8391585B2 (en) 2006-12-28 2013-03-05 Sharp Kabushiki Kaisha Defect detecting device, defect detecting method, image sensor device, image sensor module, defect detecting program, and computer-readable recording medium
WO2014175413A1 (en) * 2013-04-25 2014-10-30 株式会社ブリヂストン Inspection device

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001325587A (en) * 2000-05-16 2001-11-22 Dainippon Printing Co Ltd Outward appearance inspecting device
US8391585B2 (en) 2006-12-28 2013-03-05 Sharp Kabushiki Kaisha Defect detecting device, defect detecting method, image sensor device, image sensor module, defect detecting program, and computer-readable recording medium
WO2014175413A1 (en) * 2013-04-25 2014-10-30 株式会社ブリヂストン Inspection device
JP2014215163A (en) * 2013-04-25 2014-11-17 株式会社ブリヂストン Inspection apparatus
CN105339755A (en) * 2013-04-25 2016-02-17 株式会社普利司通 Inspection device
US9710904B2 (en) 2013-04-25 2017-07-18 Bridgestone Corporation Tire appearance inspection apparatus
CN105339755B (en) * 2013-04-25 2018-04-06 株式会社普利司通 Check device

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